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Extract from the Register of European Patents

EP About this file: EP1592975

EP1592975 - METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUITS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  30.01.2009
Database last updated on 27.07.2024
Most recent event   Tooltip23.09.2011Lapse of the patent in a contracting state
New state(s): TR		published on 26.10.2011  [2011/43]
Applicant(s)For all designated states
ADVANTEST CORPORATION
1-32-1, Asahi-cho Nerima-ku
Tokyo 179-0071 / JP
[2008/13]
Former [2005/45]For all designated states
ADVANTEST CORPORATION
1-32-1, Asahi-cho Nerima-ku
Tokyo 179-0071 / JP
Inventor(s)01 / PRAMANICK, Ankan, c/o Advantest Corporation
1-32-1, Asahi-cho, Nerima-ku
Tokyo 1790071 / JP
02 / ELSTON, Mark, c/o Advantest Corporation
1-32-1, Asahi-cho, Nerima-ku
Tokyo 1790071 / JP
03 / CHEN, Leon, c/o Advantest Corporation
1-32-1, Asahi-cho, Nerima-ku
Tokyo 1790071 / JP
04 / SAUER, Robert, c/o Advantest Corporation
1-32-1, Asahi-cho, Nerima-ku
Tokyo 1790071 / JP
 [2005/45]
Representative(s)Bergmann, Jürgen
Pfenning, Meinig & Partner GbR
Patent- und Rechtsanwälte
Joachimstaler Strasse 10-12
10719 Berlin / DE
[N/P]
Former [2005/45]Bergmann, Jürgen
Pfenning, Meinig & Partner GbR Joachimstaler Strasse 10-12
10719 Berlin / DE
Application number, filing date04711445.916.02.2004
[2005/45]
WO2004JP01648
Priority number, dateUS20030447839P14.02.2003         Original published format: US 447839 P
US20030449622P24.02.2003         Original published format: US 449622 P
[2007/29]
Former [2005/45]US20030447839P14.02.2003
US20030449622P24.02.2003
US2003040381731.03.2003
US2003040400231.03.2003
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2004072669
Date:26.08.2004
Language:EN
[2004/35]
Type: A1 Application with search report 
No.:EP1592975
Date:09.11.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 26.08.2004 takes the place of the publication of the European patent application.
[2005/45]
Type: B1 Patent specification 
No.:EP1592975
Date:26.03.2008
Language:EN
[2008/13]
Search report(s)International search report - published on:EP26.08.2004
ClassificationIPC:G01R31/319
[2005/45]
CPC:
G01R31/31907 (EP); G01R31/26 (KR); G01R31/318307 (EP);
G01R31/318342 (EP); H01L22/00 (KR)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   RO,   SE,   SI,   SK,   TR [2005/45]
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
TitleGerman:VERFAHREN UND VORRICHTUNG ZUM PRÜFEN INTEGRIERTER SCHALTUNGEN[2007/19]
English:METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUITS[2005/45]
French:PROCEDE ET APPAREIL PERMETTANT DE SOUMETTRE DES CIRCUITS INTEGRES A UN ESSAI[2005/45]
Former [2005/45]VERFAHREN UND VORRICHTUNG ZUM PR FEN INTEGRIERTER SCHALTUNGEN
Entry into regional phase01.03.2005National basic fee paid 
20.07.2005Designation fee(s) paid 
20.07.2005Examination fee paid 
Examination procedure20.07.2005Examination requested  [2005/45]
29.11.2005Despatch of a communication from the examining division (Time limit: M06)
07.06.2006Reply to a communication from the examining division
04.09.2006Despatch of a communication from the examining division (Time limit: M04)
08.09.2006Loss of particular rights, legal effect: Priority
09.01.2007Reply to a communication from the examining division
01.03.2007Despatch of communication of loss of particular rights: Priority 0003, 0004
30.05.2007Communication of intention to grant the patent
27.09.2007Fee for grant paid
27.09.2007Fee for publishing/printing paid
Opposition(s)30.12.2008No opposition filed within time limit [2009/10]
Fees paidRenewal fee
06.02.2006Renewal fee patent year 03
05.02.2007Renewal fee patent year 04
13.02.2008Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT26.03.2008
BE26.03.2008
CY26.03.2008
CZ26.03.2008
DK26.03.2008
EE26.03.2008
FI26.03.2008
IT26.03.2008
NL26.03.2008
RO26.03.2008
SI26.03.2008
SK26.03.2008
TR26.03.2008
BG26.06.2008
SE26.06.2008
GR27.06.2008
ES07.07.2008
PT01.09.2008
HU27.09.2008
[2011/43]
Former [2011/32]AT26.03.2008
BE26.03.2008
CY26.03.2008
CZ26.03.2008
DK26.03.2008
EE26.03.2008
FI26.03.2008
IT26.03.2008
NL26.03.2008
RO26.03.2008
SI26.03.2008
SK26.03.2008
BG26.06.2008
SE26.06.2008
GR27.06.2008
ES07.07.2008
PT01.09.2008
HU27.09.2008
Former [2010/50]AT26.03.2008
BE26.03.2008
CY26.03.2008
CZ26.03.2008
DK26.03.2008
EE26.03.2008
FI26.03.2008
IT26.03.2008
NL26.03.2008
RO26.03.2008
SI26.03.2008
SK26.03.2008
BG26.06.2008
SE26.06.2008
GR27.06.2008
ES07.07.2008
PT01.09.2008
Former [2009/41]AT26.03.2008
BE26.03.2008
CY26.03.2008
CZ26.03.2008
DK26.03.2008
EE26.03.2008
FI26.03.2008
IT26.03.2008
NL26.03.2008
RO26.03.2008
SI26.03.2008
SK26.03.2008
BG26.06.2008
SE26.06.2008
ES07.07.2008
PT01.09.2008
Former [2009/23]AT26.03.2008
BE26.03.2008
CZ26.03.2008
DK26.03.2008
EE26.03.2008
FI26.03.2008
NL26.03.2008
RO26.03.2008
SI26.03.2008
SK26.03.2008
BG26.06.2008
SE26.06.2008
ES07.07.2008
PT01.09.2008
Former [2009/22]AT26.03.2008
BE26.03.2008
CZ26.03.2008
DK26.03.2008
EE26.03.2008
FI26.03.2008
NL26.03.2008
RO26.03.2008
SI26.03.2008
SK26.03.2008
SE26.06.2008
ES07.07.2008
PT01.09.2008
Former [2009/09]AT26.03.2008
BE26.03.2008
CZ26.03.2008
DK26.03.2008
FI26.03.2008
NL26.03.2008
RO26.03.2008
SI26.03.2008
SK26.03.2008
SE26.06.2008
ES07.07.2008
PT01.09.2008
Former [2008/52]AT26.03.2008
BE26.03.2008
CZ26.03.2008
FI26.03.2008
NL26.03.2008
RO26.03.2008
SI26.03.2008
SK26.03.2008
SE26.06.2008
ES07.07.2008
PT01.09.2008
Former [2008/49]AT26.03.2008
BE26.03.2008
CZ26.03.2008
FI26.03.2008
RO26.03.2008
SI26.03.2008
SK26.03.2008
SE26.06.2008
ES07.07.2008
PT01.09.2008
Former [2008/46]AT26.03.2008
BE26.03.2008
FI26.03.2008
SI26.03.2008
SE26.06.2008
ES07.07.2008
Former [2008/44]AT26.03.2008
BE26.03.2008
FI26.03.2008
SI26.03.2008
Former [2008/43]AT26.03.2008
BE26.03.2008
FI26.03.2008
Former [2008/39]AT26.03.2008
FI26.03.2008
Cited inInternational search[XA]EP0388107  (HITACHI LTD [JP]) [X] 1 * column A; figures 2-12 * * column 5, lines 12-17 * * column 9, lines 2-13 *[A] 2-24;
 [XY]US6028439  (ARKIN BRIAN J [US], et al) [X] 1-8,15-19,21-23 * column A; figures 1-9; claims 1-13 * * column 2, line 66 - column 3, line 42 * * column 3, line 66 - column 4, line 8 * * column 4, lines 50-53 * * column 7, line 62 - column 8, line 13 * [Y] 9-14,20,24;
 [XY]US2002073375  (HOLLANDER YOAV [IL]) [X] 1 * column A; figures 1-8; claims 1-8 * * page 3, paragraphs 40-51 * * page 4, paragraph 64 * * page 7, paragraphs 134-139 * [Y] 9-14,20,24
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.