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Extract from the Register of European Patents

EP About this file: EP1614145

EP1614145 - SILICON SUBSTRATE COMPRISING POSITIVE ETCHING PROFILES WITH A DEFINED SLOPE ANGLE, AND PRODUCTION METHOD [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  22.03.2013
Database last updated on 06.07.2024
Most recent event   Tooltip22.03.2013Application deemed to be withdrawnpublished on 24.04.2013  [2013/17]
Applicant(s)For all designated states
Technische Universität Dresden
Dezernat 5, SG 5.1, Mommsenstrasse 11
01069 Dresden / DE
[2006/02]
Inventor(s)01 / RICHTER, Karola
Gamigstrasse 7
01239 Dresden / DE
02 / FISCHER, Daniel
Hüblerstrasse 17
01209 Dresden / DE
 [2007/03]
Former [2006/02]01 / RICHTER, Karola
Gamigstrasse 7
01239 Dresden / DE
02 / FISCHER, Daniel
Deubener Strasse 19
01159 Dresden / DE
Representative(s)Hempel, Hartmut
Patentanwaltskanzlei
Jagdweg 10
01159 Dresden / DE
[N/P]
Former [2006/02]Hempel, Hartmut
Patentanwaltskanzlei, Jagdweg 10
01159 Dresden / DE
Application number, filing date04727512.815.04.2004
[2006/02]
WO2004DE00804
Priority number, dateDE200311856815.04.2003         Original published format: DE 10318568
[2006/02]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report
No.:WO2004093162
Date:28.10.2004
Language:DE
[2004/44]
Type: A2 Application without search report 
No.:EP1614145
Date:11.01.2006
Language:DE
The application published by WIPO in one of the EPO official languages on 28.10.2004 takes the place of the publication of the European patent application.
[2006/02]
Search report(s)International search report - published on:EP24.02.2005
ClassificationIPC:H01L21/00
[2006/02]
CPC:
H01L21/30655 (EP,US); B81C1/00103 (EP,US); B81C1/00571 (EP,US);
H01L21/3065 (EP,US); B81B2203/033 (EP,US); B81B2203/0384 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2006/02]
Extension statesALNot yet paid
HRNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
TitleGerman:SILIZIUMSUBSTRAT MIT POSITIVEN TZPROFILEN MIT DEFINIERTEM B SCHUNGSWINKEL UND VERFAHREN ZUR HERSTELLUNG[2006/02]
English:SILICON SUBSTRATE COMPRISING POSITIVE ETCHING PROFILES WITH A DEFINED SLOPE ANGLE, AND PRODUCTION METHOD[2006/02]
French:SUBSTRAT DE SILICIUM A PROFILS D'ATTAQUE POSITIFS, AYANT UN ANGLE D'INCLINAISON DETERMINE, ET SON PROCEDE DE PRODUCTION[2006/02]
Entry into regional phase08.11.2005National basic fee paid 
08.11.2005Designation fee(s) paid 
08.11.2005Examination fee paid 
Examination procedure10.11.2005Amendment by applicant (claims and/or description)
10.11.2005Examination requested  [2006/02]
16.12.2010Despatch of a communication from the examining division (Time limit: M04)
12.04.2011Reply to a communication from the examining division
01.11.2012Application deemed to be withdrawn, date of legal effect  [2013/17]
07.12.2012Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time  [2013/17]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  16.12.2010
Fees paidRenewal fee
26.07.2006Renewal fee patent year 03
04.04.2007Renewal fee patent year 04
16.04.2008Renewal fee patent year 05
19.03.2009Renewal fee patent year 06
29.04.2010Renewal fee patent year 07
01.03.2011Renewal fee patent year 08
Penalty fee
Additional fee for renewal fee
30.04.200603   M06   Fee paid on   26.07.2006
30.04.201209   M06   Not yet paid
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Cited inInternational search[DA]DE4241045  (BOSCH GMBH ROBERT [DE]) [DA] 1-4 * column 1, line 1 - line 50 * * column 3, line 32 - line 46 * * column 4, line 44 - column 5, line 30 ** column 5, line 39 - line 57 *;
 [A]EP0822582  (SURFACE TECH SYS LTD [GB]) [A] 1-8 * page 2, line 3 - line 9 * * page 2, line 23 - line 26 * * page 4, line 3 - line 42 * * page 5, line 51 - page 6, line 16 * * page 6, line 35 - line 42 * * page 7, line 48 - line 51; figures 14,18,19a,19b; claims 1,10-12 *;
 [YA]DE19736370  (BOSCH GMBH ROBERT [DE]) [Y] 4,6-8 * column 1, line 5 - line 45 * * column 2, line 5 - column 3, line 1 * * column 3, line 30 - line 38 * * column 4, line 14 - column 5, line 50 * [A] 1-4;
 [XA]US6180466  (IBOK EFFIONG E [US]) [X] 1 * column 3, line 5 - line 24 * * column 4, line 27 - line 39 * * column 5, line 66 - column 6, line 40; figures 1E,1F * [A] 2;
 [XA]US6198150  (GELZINIS PETER VICTOR [US]) [X] 1 * column 2, line 19 - line 35 * * column 3, line 13 - column 4, line 12; figures 2A-2C * * column 4, line 25 - line 35 * * column 4, line 52 - line 65 * [A] 2-4;
 [XY]  - VOLLAND B ET AL, "Dry etching with gas chopping without rippled sidewalls", JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B: MICROELECTRONICS PROCESSING AND PHENOMENA, AMERICAN VACUUM SOCIETY, NEW YORK, NY, US, (199911), vol. 17, no. 6, ISSN 0734-211X, pages 2768 - 2771, XP012007814 [X] 1-3 * page 2768, column L * * page 2769, column L, paragraph II * * page 2769, column R, paragraph IV; figure 1 * [Y] 4,6-8

DOI:   http://dx.doi.org/10.1116/1.591061
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