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Extract from the Register of European Patents

EP About this file: EP1653239

EP1653239 - TEST APPARATUS WITH WAVEFORM FORMATTER [Right-click to bookmark this link]
Former [2006/18]TEST DEVICE
[2007/16]
StatusNo opposition filed within time limit
Status updated on  19.09.2008
Database last updated on 30.07.2024
Most recent event   Tooltip04.09.2009Lapse of the patent in a contracting state
New state(s): IT
published on 07.10.2009  [2009/41]
Applicant(s)For all designated states
ADVANTEST CORPORATION
1-32-1, Asahi-cho Nerima-ku
Tokyo 179-0071 / JP
[2006/18]
Inventor(s)01 / NEGISHI, Toshiyuki, c/o ADVANTEST CORPORATION
1-32-1, Asahi-cho, Nerima-ku
Tokyo 1790071 / JP
 [2006/18]
Representative(s)Pfenning, Meinig & Partner mbB
Patent- und Rechtsanwälte
Theresienhöhe 11a
80339 München / DE
[N/P]
Former [2006/18]Pfenning, Meinig & Partner GbR
Patent- und Rechtsanwälte Theresienhöhe 13
80339 München / DE
Application number, filing date04732732.513.05.2004
[2006/18]
WO2004JP06460
Priority number, dateJP2003013755315.05.2003         Original published format: JP 2003137553
[2006/18]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2004102217
Date:25.11.2004
Language:EN
[2004/48]
Type: A1 Application with search report 
No.:EP1653239
Date:03.05.2006
Language:EN
The application published by WIPO in one of the EPO official languages on 25.11.2004 takes the place of the publication of the European patent application.
[2006/18]
Type: B1 Patent specification 
No.:EP1653239
Date:14.11.2007
Language:EN
[2007/46]
Search report(s)International search report - published on:JP25.11.2004
(Supplementary) European search report - dispatched on:EP20.06.2006
ClassificationIPC:G01R31/319
[2006/29]
CPC:
G01R31/31928 (EP,US); G01R31/28 (KR); G06F11/26 (KR)
Former IPC [2006/18]G01R31/28
Designated contracting statesDE,   GB,   IT [2006/34]
Former [2006/18]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
Extension statesALNot yet paid
HRNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
TitleGerman:TESTVORRICHTUNG MIT EINER EINRICHTUNG ZUR WELLENFORM-FORMATIERUNG[2007/26]
English:TEST APPARATUS WITH WAVEFORM FORMATTER[2007/21]
French:APPAREIL DE TEST AVEC DISPOSITIF FORMATEUR DES FORMES D'ONDES[2007/21]
Former [2006/18]PRÜFEINRICHTUNG
Former [2006/18]TEST DEVICE
Former [2006/18]DISPOSITIF DE TEST
Entry into regional phase10.10.2005Translation filed 
10.10.2005National basic fee paid 
10.10.2005Search fee paid 
10.10.2005Designation fee(s) paid 
10.10.2005Examination fee paid 
Examination procedure10.10.2005Examination requested  [2006/32]
19.09.2006Despatch of a communication from the examining division (Time limit: M05)
30.01.2007Reply to a communication from the examining division
30.05.2007Communication of intention to grant the patent
19.09.2007Fee for grant paid
19.09.2007Fee for publishing/printing paid
Opposition(s)15.08.2008No opposition filed within time limit [2008/43]
Fees paidRenewal fee
30.05.2006Renewal fee patent year 03
31.05.2007Renewal fee patent year 04
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipGB13.05.2008
IT13.05.2008
[2009/41]
Former [2009/29]GB13.05.2008
Documents cited:Search[A]JP2001091598  ;
 [A]JPS60194375  ;
 [A]US5703515  (TOYAMA AKIRA [JP], et al) [A] 1-4* column A; figures 1-9; claims 1-19 *
 [A]  - PATENT ABSTRACTS OF JAPAN, (20010803), vol. 2000, no. 21, & JP2001091598 A 20010406 (ADVANTEST CORP) [A] 1-4 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19860225), vol. 010, no. 048, Database accession no. (P - 431), & JP60194375 A 19851002 (TAKEDA RIKEN KOGYO KK) [A] 1-4 * abstract *
International search[A]JPH11316260  (ADVANTEST CORP);
 [A]JPH0720582U  ;
 [A]JPS60194375  (ADVANTEST CORP)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.