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Extract from the Register of European Patents

EP About this file: EP1642113

EP1642113 - A METHOD FOR PARTICLE SIZE AND CONCENTRATION MEASUREMENT [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  13.02.2015
Database last updated on 17.07.2024
Most recent event   Tooltip15.07.2016Lapse of the patent in a contracting state
New state(s): TR		published on 17.08.2016  [2016/33]
Applicant(s)For all designated states
P.M.L. - Particles Monitoring Technologies Ltd.
20 Yochanan Hasandlar Street
P.O.B. 25300
3125102 Haifa / IL
[2014/09]
Former [2014/08]For all designated states
P.M.L. - Particles Monitoring Technologies Ltd.
20 Yochanan Hasandlar Street
P.O.B. 25300
3296220 Haifa / IL
Former [2014/04]For all designated states
P.M.L. - Particles Monitoring Technologies Ltd.
20 Yochanan Hasandlar Street
P.O.B. 25300
Haifa 31250 / IL
Former [2006/14]For all designated states
P.M.L. - Particles Monitoring Technologies Ltd.
Kinarot Technological Incubator
15132 Emek HaYarden / IL
Inventor(s)01 / SHAMIR, Joseph
27/A Hasiday Umot HaOlam Street
32985 Haifa / IL
02 / KARASIKOV, Nir
49 Hague Street
34980 Haifa / IL
 [2006/14]
Representative(s)Howard, Paul Nicholas, et al
Carpmaels & Ransford LLP
One Southampton Row
London WC1B 5HA / GB
[2014/12]
Former [2006/14]James, Anthony Christopher W.P., et al
Carpmaels & Ransford 43-45 Bloomsbury Square
London WC1A 2RA / GB
Application number, filing date04744956.608.07.2004
[2006/14]
WO2004IL00616
Priority number, dateIL2003015685609.07.2003         Original published format: IL 15685603
[2006/14]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2005005965
Date:20.01.2005
Language:EN
[2005/03]
Type: A1 Application with search report 
No.:EP1642113
Date:05.04.2006
Language:EN
The application published by WIPO in one of the EPO official languages on 20.01.2005 takes the place of the publication of the European patent application.
[2006/14]
Type: B1 Patent specification 
No.:EP1642113
Date:09.04.2014
Language:EN
[2014/15]
Search report(s)International search report - published on:EP20.01.2005
ClassificationIPC:G01N15/14, // G01N21/88, G01N21/94, G01B11/30
[2013/11]
CPC:
G01N15/1459 (EP,US); G01N2015/145 (EP,US); G01N2015/1493 (EP,US)
Former IPC [2006/14]G01N15/14
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2006/14]
TitleGerman:VERFAHREN ZUR MESSUNG DER PARTIKELGRÖSSE UND -KONZENTRATION[2006/14]
English:A METHOD FOR PARTICLE SIZE AND CONCENTRATION MEASUREMENT[2006/14]
French:PROCEDE DE MESURE DE LA GRANULOMETRIE ET DE LA CONCENTRATION[2006/14]
Entry into regional phase18.01.2006National basic fee paid 
18.01.2006Designation fee(s) paid 
18.01.2006Examination fee paid 
Examination procedure01.05.2005Request for preliminary examination filed
International Preliminary Examining Authority: EP
18.01.2006Amendment by applicant (claims and/or description)
18.01.2006Examination requested  [2006/14]
22.01.2009Despatch of a communication from the examining division (Time limit: M06)
28.07.2009Reply to a communication from the examining division
16.02.2012Despatch of a communication from the examining division (Time limit: M02)
24.04.2012Reply to a communication from the examining division
24.09.2013Communication of intention to grant the patent
19.12.2013Fee for grant paid
19.12.2013Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  22.01.2009
Opposition(s)12.01.2015No opposition filed within time limit [2015/12]
Fees paidRenewal fee
18.01.2006Renewal fee patent year 03
30.07.2007Renewal fee patent year 04
24.07.2008Renewal fee patent year 05
10.07.2009Renewal fee patent year 06
14.07.2010Renewal fee patent year 07
12.07.2011Renewal fee patent year 08
13.07.2012Renewal fee patent year 09
10.07.2013Renewal fee patent year 10
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU08.07.2004
AT09.04.2014
BE09.04.2014
CY09.04.2014
CZ09.04.2014
DK09.04.2014
EE09.04.2014
ES09.04.2014
FI09.04.2014
IT09.04.2014
MC09.04.2014
NL09.04.2014
PL09.04.2014
RO09.04.2014
SE09.04.2014
SI09.04.2014
SK09.04.2014
TR09.04.2014
IE08.07.2014
LU08.07.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
[2016/33]
Former [2016/32]HU08.07.2004
AT09.04.2014
BE09.04.2014
CY09.04.2014
CZ09.04.2014
DK09.04.2014
EE09.04.2014
ES09.04.2014
FI09.04.2014
IT09.04.2014
MC09.04.2014
NL09.04.2014
PL09.04.2014
RO09.04.2014
SE09.04.2014
SI09.04.2014
SK09.04.2014
IE08.07.2014
LU08.07.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2016/31]AT09.04.2014
BE09.04.2014
CY09.04.2014
CZ09.04.2014
DK09.04.2014
EE09.04.2014
ES09.04.2014
FI09.04.2014
IT09.04.2014
MC09.04.2014
NL09.04.2014
PL09.04.2014
RO09.04.2014
SE09.04.2014
SI09.04.2014
SK09.04.2014
IE08.07.2014
LU08.07.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2016/21]AT09.04.2014
BE09.04.2014
CZ09.04.2014
DK09.04.2014
EE09.04.2014
ES09.04.2014
FI09.04.2014
IT09.04.2014
MC09.04.2014
NL09.04.2014
PL09.04.2014
RO09.04.2014
SE09.04.2014
SI09.04.2014
SK09.04.2014
IE08.07.2014
LU08.07.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2015/37]AT09.04.2014
BE09.04.2014
CZ09.04.2014
DK09.04.2014
EE09.04.2014
ES09.04.2014
FI09.04.2014
IT09.04.2014
NL09.04.2014
PL09.04.2014
RO09.04.2014
SE09.04.2014
SI09.04.2014
SK09.04.2014
IE08.07.2014
LU08.07.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2015/36]AT09.04.2014
BE09.04.2014
CZ09.04.2014
DK09.04.2014
EE09.04.2014
ES09.04.2014
FI09.04.2014
IT09.04.2014
NL09.04.2014
PL09.04.2014
RO09.04.2014
SE09.04.2014
SI09.04.2014
SK09.04.2014
LU08.07.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2015/18]AT09.04.2014
BE09.04.2014
CZ09.04.2014
DK09.04.2014
EE09.04.2014
ES09.04.2014
FI09.04.2014
IT09.04.2014
NL09.04.2014
PL09.04.2014
RO09.04.2014
SE09.04.2014
SK09.04.2014
LU08.07.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2015/13]AT09.04.2014
BE09.04.2014
CZ09.04.2014
DK09.04.2014
EE09.04.2014
ES09.04.2014
FI09.04.2014
NL09.04.2014
PL09.04.2014
RO09.04.2014
SE09.04.2014
SK09.04.2014
LU08.07.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2015/11]AT09.04.2014
BE09.04.2014
CZ09.04.2014
DK09.04.2014
EE09.04.2014
ES09.04.2014
FI09.04.2014
NL09.04.2014
PL09.04.2014
RO09.04.2014
SE09.04.2014
SK09.04.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2015/10]AT09.04.2014
BE09.04.2014
CZ09.04.2014
DK09.04.2014
EE09.04.2014
ES09.04.2014
FI09.04.2014
NL09.04.2014
PL09.04.2014
SE09.04.2014
SK09.04.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2015/08]AT09.04.2014
BE09.04.2014
DK09.04.2014
ES09.04.2014
FI09.04.2014
NL09.04.2014
PL09.04.2014
SE09.04.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2015/02]AT09.04.2014
ES09.04.2014
FI09.04.2014
NL09.04.2014
PL09.04.2014
SE09.04.2014
BG09.07.2014
GR10.07.2014
PT11.08.2014
Former [2014/51]AT09.04.2014
ES09.04.2014
FI09.04.2014
NL09.04.2014
PL09.04.2014
SE09.04.2014
BG09.07.2014
GR10.07.2014
Former [2014/50]ES09.04.2014
FI09.04.2014
NL09.04.2014
PL09.04.2014
SE09.04.2014
BG09.07.2014
GR10.07.2014
Former [2014/49]FI09.04.2014
BG09.07.2014
Former [2014/48]BG09.07.2014
Cited inInternational search[A]WO9850779  (HOLCOMB MATTHEW J [US]);
 [XYI]  - JONES A R, "Light scattering for particle characterization", PROGRESS IN ENERGY AND COMBUSTION SCIENCE, ELSEVIER SCIENCE PUBLISHERS, AMSTERDAM, NL, (199902), vol. 25, no. 1, ISSN 0360-1285, pages 1 - 53, XP004151620 [X] 1-3,5,29,31,32 * page 3, column 1, paragraphs 1,2 * * page 3, column 2, paragraph 5 * * page 10, column 2, paragraph 4 - page 11, column 1, paragraph 3 * * page 32, column 2, paragraphs 4,5 * * page 35, column 2, paragraphs 2,3 * * page 36, column 2, paragraph 2 - page 37, column 1, paragraph 2 * * figures 7,23-25 * [Y] 4,8-14,16,17,30,33-35 [I] 6,15,18-22,24,26,36,37

DOI:   http://dx.doi.org/10.1016/S0360-1285(98)00017-3
 [Y]  - PIESTUN RAFAEL, "Multidimensional Synthesis of Light Fields", (20011017), page 28, URL: http://ece-www.colorado.edu/~piestun/28-32.PIESTUN.PDF, (20041026), XP002302678 [Y] 4,34,35 * page 28, column 3, line 1 - page 29, column 1, paragraph 2 * * page 30, column 2, paragraph 2 - page 30, column 3, paragraph 2 *
 [Y]  - MATIZEN Y E ET AL, "FORMATION OF NON-GAUSSIAN LIGHT BEAMS WITH THE AID OF A SPATIALLY INHOMOGENEOUS AMPLITUDE FILTER", SOVIET JOURNAL OF QUANTUM ELECTRONICS, AMERICAN INSTITUTE OF PHYSICS. WOODBURY, NY, US, (19870113), vol. 17, no. 7, pages 886 - 887, XP000709131 [Y] 8-11 * abstract * * page 887, column 1, paragraph 4 - column 2, paragraph 2 *

DOI:   http://dx.doi.org/10.1070/QE1987v017n07ABEH009475
 [DY]  - FRIEDMANN MICHAEL ET AL, "Surface Analysis Using Multiple Coherent Beams", ELECTRICAL AND ELECTRONICS ENGINEERS IN ISRAEL, (19961105), pages 537 - 540, XP002302679 [DY] 12-14,17,33 * page 537, column 1, paragraph 1 - page 537, column 2, paragraph 1 * * page 538, column 2, paragraph IV - page 538, column 1, paragraph IV * * page 539, column 2, paragraph 2 * * page 540, column 1, paragraph 2 * * figure 4 *

DOI:   http://dx.doi.org/10.1109/EEIS.1996.567034
    [ ] - URL: http://ieeexplore.ieee.org/iel3/4282/12326/00567034.pdf?tp=&arnumber=567034&isnumber=12326&arSt=537&ared=540&arAuthor=Friedmann%2C+M.%3B+Piestun%2C+R.%3B+Paquet%2C+E.%3B+Shamir%2C+J.%3B
 [DY]  - FRIEDMANN MICHAEL ET AL, "Resolution enhancement by extrapolation of the optically measured spectrum of surface profiles", APPLIED OPTICS, (19960610), vol. 36, no. 8, XP002302680 [DY] 16 * page 1747, column 1, paragraph 1 * * page 1748, column 1, line 21 - page 1749, column 1, line 9 *

DOI:   http://dx.doi.org/10.1364/AO.36.001747
 [DY]  - PIESTUN RAFAEL ET AL, "Pattern generation with an extended focal depth", APPLIED OPTICS, (19980810), vol. 37, no. 23, pages 5394 - 5398, XP002302681 [DY] 30 * paragraph [0004] *

DOI:   http://dx.doi.org/10.1364/AO.37.005394
 [DA]  - SPEKTOR BORIS ET AL, "Dark beams with a constant notch", OPTICS LETTERS, vol. 21, no. 7, (19951212), pages 456 - 458, URL: http://ol.osa.org/abstract.cfm?id=44758, (20041025), XP002302682 [DA] 4 * page 456, column 1, paragraph 2 - page 456, column 1, paragraph 3 * * figures 1-3 *

DOI:   http://dx.doi.org/10.1364/OL.21.000456
ExaminationEP1083424
    - RAFAEL PIESTUN ET AL, "Synthesis of Three-Dimensional Light Fields and Applications", PROCEEDINGS OF THE IEEE, IEEE. NEW YORK, US, (20020201), vol. 90, no. 2, ISSN 0018-9219, XP011044618
by applicant   - R. PIESTUN; J. SHAMIR, "Synthesis of three-dimensional light-fields and applications", PROC. IEEE, (2002), vol. 90, no. 2, pages 220 - 244, XP011044618
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.