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Extract from the Register of European Patents

EP About this file: EP1660874

EP1660874 - IN-SITU X-RAY DIFFRACTION SYSTEM USING SOURCES AND DETECTORS AT FIXED ANGULAR POSITIONS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  13.03.2015
Database last updated on 05.10.2024
Most recent event   Tooltip15.07.2016Lapse of the patent in a contracting state
New state(s): TR
published on 17.08.2016  [2016/33]
Applicant(s)For all designated states
X-RAY OPTICAL SYSTEMS, INC.
15 Tech Valley Drive East Greenbush
New York 12061 / US
[2006/22]
Inventor(s)01 / GIBSON, David M.
526 New Salem Road
Voorheesville, New York 12188 / US
02 / GIBSON, Walter M.
290 Cass Hill Road
Voorheesville, New York 12186 / US
03 / HUANG, Huapeng
6 Sable Terrace
Latham, New York 12110 / US
 [2006/22]
Representative(s)Andrae Westendorp Patentanwälte Partnerschaft
Uhlandstrasse 2
80336 München / DE
[N/P]
Former [2014/24]Andrae Westendorp
Uhlandstrasse 2
80336 München / DE
Former [2014/19]Friese, Martin
Andrae Westendorp
Patentanwälte Partnerschaft
Balanstrasse 55
81541 München / DE
Former [2006/22]Friese, Martin
Andrae Flach Haug Balanstrasse 55
81541 München / DE
Application number, filing date04809532.704.08.2004
[2006/22]
WO2004US25112
Priority number, dateUS20030492400P04.08.2003         Original published format: US 492400 P
[2006/22]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2005031329
Date:07.04.2005
Language:EN
[2005/14]
Type: A1 Application with search report 
No.:EP1660874
Date:31.05.2006
Language:EN
The application published by WIPO in one of the EPO official languages on 07.04.2005 takes the place of the publication of the European patent application.
[2006/22]
Type: B1 Patent specification 
No.:EP1660874
Date:07.05.2014
Language:EN
[2014/19]
Search report(s)International search report - published on:EP07.04.2005
ClassificationIPC:G01N23/20, G01N23/207
[2006/22]
CPC:
G01N23/207 (EP,US); G01N23/20 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2006/22]
TitleGerman:IN-SITU-RÖNTGENDIFFRAKTIONSSYSTEM MIT QUELLEN UND DETEKTOREN IN POSITIONEN MIT FESTEM WINKEL[2006/22]
English:IN-SITU X-RAY DIFFRACTION SYSTEM USING SOURCES AND DETECTORS AT FIXED ANGULAR POSITIONS[2006/22]
French:SYSTEME DE DIFFRACTION DES RAYONS X IN-SITU UTILISANT DES SOURCES ET DES DETECTEURS DANS DES POSITIONS ANGULAIRES FIXES[2006/22]
Entry into regional phase02.03.2006National basic fee paid 
02.03.2006Designation fee(s) paid 
02.03.2006Examination fee paid 
Examination procedure02.03.2006Amendment by applicant (claims and/or description)
02.03.2006Examination requested  [2006/22]
14.08.2009Despatch of a communication from the examining division (Time limit: M08)
20.04.2010Reply to a communication from the examining division
18.03.2013Despatch of a communication from the examining division (Time limit: M06)
30.09.2013Reply to a communication from the examining division
10.12.2013Communication of intention to grant the patent
28.03.2014Fee for grant paid
28.03.2014Fee for publishing/printing paid
28.03.2014Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  14.08.2009
Opposition(s)10.02.2015No opposition filed within time limit [2015/16]
Fees paidRenewal fee
30.08.2006Renewal fee patent year 03
31.08.2007Renewal fee patent year 04
29.08.2008Renewal fee patent year 05
26.08.2009Renewal fee patent year 06
26.08.2010Renewal fee patent year 07
30.08.2011Renewal fee patent year 08
31.08.2012Renewal fee patent year 09
29.08.2013Renewal fee patent year 10
Opt-out from the exclusive  Tooltip
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Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU04.08.2004
AT07.05.2014
BE07.05.2014
BG07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
IT07.05.2014
MC07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SI07.05.2014
SK07.05.2014
TR07.05.2014
IE04.08.2014
LU04.08.2014
GR08.08.2014
CH31.08.2014
LI31.08.2014
PT08.09.2014
[2016/33]
Former [2016/32]HU04.08.2004
AT07.05.2014
BE07.05.2014
BG07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
IT07.05.2014
MC07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SI07.05.2014
SK07.05.2014
IE04.08.2014
LU04.08.2014
GR08.08.2014
CH31.08.2014
LI31.08.2014
PT08.09.2014
Former [2016/25]AT07.05.2014
BE07.05.2014
BG07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
IT07.05.2014
MC07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SI07.05.2014
SK07.05.2014
IE04.08.2014
LU04.08.2014
GR08.08.2014
CH31.08.2014
LI31.08.2014
PT08.09.2014
Former [2015/37]AT07.05.2014
BE07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
IT07.05.2014
MC07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SI07.05.2014
SK07.05.2014
IE04.08.2014
LU04.08.2014
GR08.08.2014
CH31.08.2014
LI31.08.2014
PT08.09.2014
Former [2015/36]AT07.05.2014
BE07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
IT07.05.2014
MC07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SI07.05.2014
SK07.05.2014
LU04.08.2014
GR08.08.2014
CH31.08.2014
LI31.08.2014
PT08.09.2014
Former [2015/30]AT07.05.2014
BE07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
IT07.05.2014
MC07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SK07.05.2014
LU04.08.2014
GR08.08.2014
CH31.08.2014
LI31.08.2014
PT08.09.2014
Former [2015/22]AT07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
IT07.05.2014
MC07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SK07.05.2014
LU04.08.2014
GR08.08.2014
BE31.08.2014
CH31.08.2014
LI31.08.2014
PT08.09.2014
Former [2015/20]AT07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
MC07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SK07.05.2014
LU04.08.2014
GR08.08.2014
BE31.08.2014
CH31.08.2014
LI31.08.2014
PT08.09.2014
Former [2015/19]AT07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
MC07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SK07.05.2014
LU04.08.2014
GR08.08.2014
BE31.08.2014
PT08.09.2014
Former [2015/18]AT07.05.2014
BE07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
MC07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SK07.05.2014
GR08.08.2014
PT08.09.2014
Former [2015/11]AT07.05.2014
BE07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
PL07.05.2014
RO07.05.2014
SE07.05.2014
SK07.05.2014
GR08.08.2014
PT08.09.2014
Former [2015/10]AT07.05.2014
BE07.05.2014
CY07.05.2014
CZ07.05.2014
DK07.05.2014
EE07.05.2014
ES07.05.2014
FI07.05.2014
PL07.05.2014
SE07.05.2014
SK07.05.2014
GR08.08.2014
PT08.09.2014
Former [2015/08]AT07.05.2014
BE07.05.2014
CY07.05.2014
DK07.05.2014
ES07.05.2014
FI07.05.2014
PL07.05.2014
SE07.05.2014
GR08.08.2014
PT08.09.2014
Former [2015/02]AT07.05.2014
CY07.05.2014
ES07.05.2014
FI07.05.2014
PL07.05.2014
SE07.05.2014
GR08.08.2014
PT08.09.2014
Former [2014/51]AT07.05.2014
CY07.05.2014
ES07.05.2014
FI07.05.2014
PL07.05.2014
SE07.05.2014
GR08.08.2014
Former [2014/50]CY07.05.2014
ES07.05.2014
FI07.05.2014
PL07.05.2014
SE07.05.2014
GR08.08.2014
Former [2014/49]CY07.05.2014
FI07.05.2014
Former [2014/47]CY07.05.2014
Cited inInternational search[XY]US6301330  (KURTZ DAVID S [US], et al) [X] 1,2,4-8,12,13,15-17 * abstract * * column 9, line 27 - line 31 * * column 10, line 8 - line 11 * * column 10, line 57 - line 67 * * column 5, paragraph 1; figure 5 * [Y] 2,3,14,18,19;
 [XY]US2002003859  (KOGAN VLADIMIR [NL]) [X] 1,4-8,12 * paragraph [0021]; figure 3 * [Y] 2,3,14,15;
 [XY]US5148458  (RUUD CLAYTON) [X] 1,4-8,12 * column 1, line 11 - line 23 * * column 7, line 64 - column 8, line 15; figure 5 * [Y] 15,18;
 [X]US5784432  (KURTZ DAVID S [US]) [X] 1,4-8,12 * abstract * * column 10, line 1 - line 10 * * column 11, line 6 - line 9; figure 1 *;
 [YA]US4649556  (RINIK CHRISTINE [US], et al) [Y] 2,3,19 * column 8, line 45 - line 48 * [A] 16,17;
 [E]WO2005010512  (X RAY OPTICAL SYS INC [US], et al) [E] 1,2,4-13,15,18-22 * the whole document *
by applicantUS5148458
 US4649556
 US6301330
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.