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Extract from the Register of European Patents

EP About this file: EP1564594

EP1564594 - Projection lens sytem for microlithography [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  16.12.2005
Database last updated on 22.08.2024
Most recent event   Tooltip16.12.2005Withdrawal of applicationpublished on 01.02.2006  [2006/05]
Applicant(s)For all designated states
Carl Zeiss SMT AG
Carl-Zeiss-Strasse 22
73447 Oberkochen / DE
[2005/33]
Inventor(s)01 / Zaczek, Christoph
Lauterner Strasse 37
73540 Heubach / DE
02 / Shafer, David
56 Drake Lane
Fairfield Connecticut 06430 / US
03 / Ulrich, Wilhelm
Lederackerring 44
73434 Aalen / DE
 [2005/33]
Representative(s)Patentanwälte Ruff, Wilhelm, Beier, Dauster & Partner mbB
Kronenstrasse 30
70174 Stuttgart / DE
[N/P]
Former [2005/33]Patentanwälte Ruff, Wilhelm, Beier, Dauster & Partner
Kronenstrasse 30
70174 Stuttgart / DE
Application number, filing date05003231.716.02.2005
[2005/33]
Priority number, dateUS20040544492P17.02.2004         Original published format: US 544492 P
[2005/33]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP1564594
Date:17.08.2005
Language:DE
[2005/33]
Search report(s)(Supplementary) European search report - dispatched on:EP03.06.2005
ClassificationIPC:G03F7/20
[2005/33]
CPC:
G02B17/0892 (EP,US); G02B17/045 (EP,US); G02B27/283 (EP,US);
G03F7/70225 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2005/33]
Extension statesALNot yet paid
BANot yet paid
HRNot yet paid
LVNot yet paid
MKNot yet paid
YUNot yet paid
TitleGerman:Projektionsobjektiv für die Mikrolithographie[2005/33]
English:Projection lens sytem for microlithography[2005/33]
French:Objectif de projection pour la microlithographie[2005/33]
Examination procedure09.12.2005Application withdrawn by applicant  [2006/05]
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Documents cited:Search[X]EP0341385  (IBM [US]) [X] 1-14 * page 4, line 34 - page 5, line 16; figure 1 *;
 [X]US2002167734  (SCHUSTER KARL-HEINZ [DE]) [X] 1-14 * paragraphs [0026] , [0027] *;
 [X]EP1260845  (ZEISS CARL SEMICONDUCTOR MFG [DE]) [X] 1-14 * paragraph [0050]; figure 1 *;
 [X]US6556278  (TANAKA MASASHI [JP], et al) [X] 1-14* paragraph [0260]; figure 33 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.