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EP About this file: EP1566766

EP1566766 - Image evaluation method and microscope [Right-click to bookmark this link]
Status	No opposition filed within time limit Status updated on 21.08.2009 Database last updated on 24.08.2024
Most recent event Tooltip	21.08.2009	No opposition filed within time limit	published on 23.09.2009 [2009/39]
Applicant(s)	For all designated states Hitachi, Ltd. 6-6 Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 / JP
	[N/P]
Former [2008/42]	For all designated states Hitachi Ltd. 6-6 Marunouchi 1-chome, Chiyoda-ku Tokyo 100-8280 / JP
Former [2005/34]	For all designated states Hitachi Ltd. 6-6 Marunouchi 1-chome, Chiyoda-ku Tokyo 100-8280 / JP
Inventor(s)	01 / Ishitani, Tohru Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	02 / Sato, Mitsugu Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	03 / Todokoro, Hideo Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	04 / Otaka, Tadashi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	05 / Iizumi, Takashi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	06 / Takane, Atsushi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	[2008/19]
Former [2005/34]	01 / Ishitani, Tohru Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	02 / Sato, Mitsugu Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	03 / Todokoro, Hideo Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	04 / Otaka, Tadashi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	05 / IIzumi, Takashi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	06 / Takane, Atsushi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
Representative(s)	Strehl Schübel-Hopf & Partner Maximilianstrasse 54 80538 München / DE
	[2005/34]
Application number, filing date	05010530.3	16.08.2002
	[2005/34]
Priority number, date	JP20010253752	24.08.2001 Original published format: JP 2001253752
	JP20020062817	08.03.2002 Original published format: JP 2002062817
	[2005/34]
Filing language	EN
Procedural language	EN
Publication	Type:	A1 Application with search report
	No.:	EP1566766
	Date:	24.08.2005
	Language:	EN
	[2005/34]
	Type:	B1 Patent specification
	No.:	EP1566766
	Date:	15.10.2008
	Language:	EN
	[2008/42]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	06.07.2005
Classification	IPC:	G06T7/00, H01J37/00, H01J37/26, H01J37/28, H01J37/22	[2005/34]
	CPC:	H01J37/28 (EP,US); H01J37/222 (EP,US); H01J37/263 (EP,US); H01J2237/2823 (EP,US)
Designated contracting states	DE, FR, GB [2005/34]
Title	German:	Bildauswertungsverfahren und Mikroskop	[2005/34]
	English:	Image evaluation method and microscope	[2005/34]
	French:	Procédé d'évaluation d'images et microscope	[2005/34]
Examination procedure	22.02.2006	Examination requested [2006/16]
	22.03.2006	Despatch of a communication from the examining division (Time limit: M06)
	29.09.2006	Reply to a communication from the examining division
	27.11.2006	Despatch of a communication from the examining division (Time limit: M06)
	06.06.2007	Reply to a communication from the examining division
	22.04.2008	Communication of intention to grant the patent
	27.08.2008	Fee for grant paid
	27.08.2008	Fee for publishing/printing paid
Parent application(s) Tooltip	EP02018519.5 / EP1288862
Opposition(s)	16.07.2009	No opposition filed within time limit [2009/39]
Fees paid	Renewal fee
	08.06.2005	Renewal fee patent year 03
	22.08.2005	Renewal fee patent year 04
	22.08.2006	Renewal fee patent year 05
	14.08.2007	Renewal fee patent year 06
	21.08.2008	Renewal fee patent year 07
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[AD]JPH11224640 ;
		[XA]EP0877409 (HITACHI LTD [JP]) [X] 1 * figures 1,13,20 * * column 4, line 58 - column 5, line 27 * * column 9, line 52 - column 11, line 4 * * column 8, line 58 - column 9, line 5 * [A] 2-7;
		[X]EP1081742 (APPLIED MATERIALS INC [US]) [X] 1,2,4-6 * paragraph [0003] - paragraph [0004] * * paragraph [0006] - paragraph [0007] * * paragraph [0012] - paragraph [0016] * * paragraph [0023] - paragraph [0040] *;
		[X] - FANGET G L ET AL, "SURVEY OF SCANNING ELECTRON MICROSCOPES USING QUANTITATIVE RESOLUTION EVALUATION", PROCEEDINGS OF THE SPIE, SPIE, BELLINGHAM, VA, US, (19970310), vol. 3050, ISSN 0277-786X, pages 80 - 92, XP002054303 [X] 1,2,4-6 * the whole document * DOI: http://dx.doi.org/10.1117/12.275930
		[AD] - PATENT ABSTRACTS OF JAPAN, (19991130), vol. 1999, no. 13, & JP11224640 A 19990817 (HITACHI LTD) [AD] 1-7 * abstract *

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