EP1566766 - Image evaluation method and microscope [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 21.08.2009 Database last updated on 24.08.2024 | Most recent event Tooltip | 21.08.2009 | No opposition filed within time limit | published on 23.09.2009 [2009/39] | Applicant(s) | For all designated states Hitachi, Ltd. 6-6 Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 / JP | [N/P] |
Former [2008/42] | For all designated states Hitachi Ltd. 6-6 Marunouchi 1-chome, Chiyoda-ku Tokyo 100-8280 / JP | ||
Former [2005/34] | For all designated states Hitachi Ltd. 6-6 Marunouchi 1-chome, Chiyoda-ku Tokyo 100-8280 / JP | Inventor(s) | 01 /
Ishitani, Tohru Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | 02 /
Sato, Mitsugu Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | 03 /
Todokoro, Hideo Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | 04 /
Otaka, Tadashi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | 05 /
Iizumi, Takashi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | 06 /
Takane, Atsushi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | [2008/19] |
Former [2005/34] | 01 /
Ishitani, Tohru Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | ||
02 /
Sato, Mitsugu Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | |||
03 /
Todokoro, Hideo Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | |||
04 /
Otaka, Tadashi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | |||
05 /
IIzumi, Takashi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | |||
06 /
Takane, Atsushi Hitachi Ltd. Int.Prop.Group 6-1 Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | Representative(s) | Strehl Schübel-Hopf & Partner Maximilianstrasse 54 80538 München / DE | [2005/34] | Application number, filing date | 05010530.3 | 16.08.2002 | [2005/34] | Priority number, date | JP20010253752 | 24.08.2001 Original published format: JP 2001253752 | JP20020062817 | 08.03.2002 Original published format: JP 2002062817 | [2005/34] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP1566766 | Date: | 24.08.2005 | Language: | EN | [2005/34] | Type: | B1 Patent specification | No.: | EP1566766 | Date: | 15.10.2008 | Language: | EN | [2008/42] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 06.07.2005 | Classification | IPC: | G06T7/00, H01J37/00, H01J37/26, H01J37/28, H01J37/22 | [2005/34] | CPC: |
H01J37/28 (EP,US);
H01J37/222 (EP,US);
H01J37/263 (EP,US);
H01J2237/2823 (EP,US)
| Designated contracting states | DE, FR, GB [2005/34] | Title | German: | Bildauswertungsverfahren und Mikroskop | [2005/34] | English: | Image evaluation method and microscope | [2005/34] | French: | Procédé d'évaluation d'images et microscope | [2005/34] | Examination procedure | 22.02.2006 | Examination requested [2006/16] | 22.03.2006 | Despatch of a communication from the examining division (Time limit: M06) | 29.09.2006 | Reply to a communication from the examining division | 27.11.2006 | Despatch of a communication from the examining division (Time limit: M06) | 06.06.2007 | Reply to a communication from the examining division | 22.04.2008 | Communication of intention to grant the patent | 27.08.2008 | Fee for grant paid | 27.08.2008 | Fee for publishing/printing paid | Parent application(s) Tooltip | EP02018519.5 / EP1288862 | Opposition(s) | 16.07.2009 | No opposition filed within time limit [2009/39] | Fees paid | Renewal fee | 08.06.2005 | Renewal fee patent year 03 | 22.08.2005 | Renewal fee patent year 04 | 22.08.2006 | Renewal fee patent year 05 | 14.08.2007 | Renewal fee patent year 06 | 21.08.2008 | Renewal fee patent year 07 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [AD]JPH11224640 ; | [XA]EP0877409 (HITACHI LTD [JP]) [X] 1 * figures 1,13,20 * * column 4, line 58 - column 5, line 27 * * column 9, line 52 - column 11, line 4 * * column 8, line 58 - column 9, line 5 * [A] 2-7; | [X]EP1081742 (APPLIED MATERIALS INC [US]) [X] 1,2,4-6 * paragraph [0003] - paragraph [0004] * * paragraph [0006] - paragraph [0007] * * paragraph [0012] - paragraph [0016] * * paragraph [0023] - paragraph [0040] *; | [X] - FANGET G L ET AL, "SURVEY OF SCANNING ELECTRON MICROSCOPES USING QUANTITATIVE RESOLUTION EVALUATION", PROCEEDINGS OF THE SPIE, SPIE, BELLINGHAM, VA, US, (19970310), vol. 3050, ISSN 0277-786X, pages 80 - 92, XP002054303 [X] 1,2,4-6 * the whole document * DOI: http://dx.doi.org/10.1117/12.275930 | [AD] - PATENT ABSTRACTS OF JAPAN, (19991130), vol. 1999, no. 13, & JP11224640 A 19990817 (HITACHI LTD) [AD] 1-7 * abstract * |