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EP1607749
European procedure
Extract from the Register of European Patents
EP About this file: EP1607749
| EP1607749 - Test probe assembly for IC chips [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 20.03.2009 Database last updated on 21.03.2026 | Most recent event Tooltip | 20.03.2009 | No opposition filed within time limit | published on 22.04.2009 [2009/17] | Applicant(s) | For all designated states Aries Electronics, Inc Box 130, 62-A Trenton Avenue Frenchtown New Jersey 08825 / US | [2008/20] |
| Former [2005/51] | For all designated states Aries Electronics, Inc Box 130, 62-A Trenton Avenue Frenchtown New Jersey 08825 / US | Inventor(s) | 01 /
Sinclair, William Y. 26 Laurelton Trail Flemington, New Jersey 08822 / US | [2005/51] | Representative(s) | Müller-Boré & Partner Patentanwälte PartG mbB Friedenheimer Brücke 21 80639 München / DE | [N/P] |
| Former [2005/51] | Müller-Boré & Partner Patentanwälte Grafinger Strasse 2 81671 München / DE | Application number, filing date | 05013012.9 | 16.06.2005 | [2005/51] | Priority number, date | US20040870108 | 17.06.2004 Original published format: US 870108 | [2005/51] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1607749 | Date: | 21.12.2005 | Language: | EN | [2005/51] | Type: | A3 Search report | No.: | EP1607749 | Date: | 31.05.2006 | [2006/22] | Type: | B1 Patent specification | No.: | EP1607749 | Date: | 14.05.2008 | Language: | EN | [2008/20] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 19.04.2006 | Classification | IPC: | G01R1/067, G01R1/073 | [2006/22] | CPC: |
G01R1/0466 (EP,US);
G01R1/0483 (EP,US);
G01R1/06722 (EP,US);
G01R1/07371 (EP,US)
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| Former IPC [2005/51] | G01R1/067 | Designated contracting states | DE, FR, GB, IT [2007/07] |
| Former [2007/06] | AT, BE, BG, CH, LI | ||
| Former [2005/51] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR | Title | German: | Anordnung einer Testprobe für ein IC-Plättchen | [2005/51] | English: | Test probe assembly for IC chips | [2005/51] | French: | Assemblage de sonde pour plaques IC | [2005/51] | Examination procedure | 16.11.2006 | Examination requested [2006/52] | 01.12.2006 | Loss of particular rights, legal effect: designated state(s) | 30.03.2007 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, LT, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR | 22.11.2007 | Communication of intention to grant the patent | 27.03.2008 | Fee for grant paid | 27.03.2008 | Fee for publishing/printing paid | Opposition(s) | 17.02.2009 | No opposition filed within time limit [2009/17] | Fees paid | Renewal fee | 26.06.2007 | Renewal fee patent year 03 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 11.01.2007 | AT M01 Not yet paid | 11.01.2007 | BE M01 Not yet paid | 11.01.2007 | BG M01 Not yet paid | 11.01.2007 | CH M01 Not yet paid | 11.01.2007 | CY M01 Not yet paid | 11.01.2007 | CZ M01 Not yet paid | 11.01.2007 | DK M01 Not yet paid | 11.01.2007 | EE M01 Not yet paid | 11.01.2007 | ES M01 Not yet paid | 11.01.2007 | FI M01 Not yet paid | 11.01.2007 | GR M01 Not yet paid | 11.01.2007 | HU M01 Not yet paid | 11.01.2007 | IE M01 Not yet paid | 11.01.2007 | IS M01 Not yet paid | 11.01.2007 | LT M01 Not yet paid | 11.01.2007 | LU M01 Not yet paid | 11.01.2007 | MC M01 Not yet paid | 11.01.2007 | NL M01 Not yet paid | 11.01.2007 | PL M01 Not yet paid | 11.01.2007 | PT M01 Not yet paid | 11.01.2007 | RO M01 Not yet paid | 11.01.2007 | SE M01 Not yet paid | 11.01.2007 | SI M01 Not yet paid | 11.01.2007 | SK M01 Not yet paid | 11.01.2007 | TR M01 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A] CH676510 (FEINMETALL GMBH et al.) [A] 1 * figures 3,4; claim 1 * | [A] DE3340431 (FEINMETALL GMBH et al.) [A] 1 * the whole document * | [A] CH627282 (FEINMETALL GMBH et al.) [A] 1 * the whole document * |