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EP1622082
European procedure
Extract from the Register of European Patents
EP About this file: EP1622082
| EP1622082 - Method of measuring occluded features for high precision machine vision metrology [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 05.04.2013 Database last updated on 26.03.2026 | Most recent event Tooltip | 05.04.2013 | No opposition filed within time limit | published on 08.05.2013 [2013/19] | Applicant(s) | For all designated states Mitutoyo Corporation 20-1, Sakado 1-chome Takatsu-ku Kawasaki-shi, Kanagawa 213-0012 / JP | [N/P] |
| Former [2012/22] | For all designated states Mitutoyo Corporation 20-1, Sakado 1-chome, Takatsu-ku Kawasaki-shi Kanagawa-ken 213-0012 / JP | ||
| Former [2006/05] | For all designated states MITUTOYO CORPORATION 20-1, Sakado 1-chome, Takatsu-ku Kawasaki-shi Kanagawa-ken 213-0012 / JP | Inventor(s) | 01 /
Tessadro, Ana 4348 NE 57th Street Seattle, WA 98105 / US | [2006/05] | Representative(s) | Lang, Johannes, et al Bardehle Pagenberg Partnerschaft mbB Patentanwälte, Rechtsanwälte Prinzregentenplatz 7 81675 München / DE | [N/P] |
| Former [2012/22] | Lang, Johannes, et al Bardehle Pagenberg Prinzregentenplatz 7 81675 München / DE | ||
| Former [2011/13] | Lang, Johannes, et al Bardehle Pagenberg Galileiplatz 1 81679 München / DE | ||
| Former [2008/33] | Altenburg, Udo Patent- und Rechtsanwälte Bardehle . Pagenberg . Dost . Altenburg . Geissler Galileiplatz 1 81679 München / DE | ||
| Former [2006/05] | Altenburg, Udo Patent- und Rechtsanwälte Bardehle . Pagenberg . Dost . Altenburg . Geissler Postfach 86 06 20 81633 München / DE | Application number, filing date | 05016124.9 | 25.07.2005 | [2006/05] | Priority number, date | US20040903714 | 30.07.2004 Original published format: US 903714 | [2006/05] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1622082 | Date: | 01.02.2006 | Language: | EN | [2006/05] | Type: | A3 Search report | No.: | EP1622082 | Date: | 19.09.2007 | [2007/38] | Type: | B1 Patent specification | No.: | EP1622082 | Date: | 30.05.2012 | Language: | EN | [2012/22] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 22.08.2007 | Classification | IPC: | G06T7/00 | [2006/05] | CPC: |
G06T7/0004 (EP,US);
G06T7/12 (EP,US);
G06T7/155 (EP,US);
G06V10/421 (EP,US);
G06V10/44 (EP,US);
G06T2207/10016 (EP,US);
| Designated contracting states | DE, FR, GB, IT [2008/22] |
| Former [2006/05] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR | Title | German: | Verfahren zum Vermessen verdeckter Merkmale für hochpräzise Machine-Vision-Messtechnik | [2006/05] | English: | Method of measuring occluded features for high precision machine vision metrology | [2006/05] | French: | Procédé de mesurer des marques cachées pour la métrologie de vision automatique à haute précision | [2006/05] | Examination procedure | 19.02.2008 | Examination requested [2008/14] | 20.03.2008 | Despatch of a communication from the examining division (Time limit: M06) | 20.03.2008 | Loss of particular rights, legal effect: designated state(s) | 23.04.2008 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR | 15.09.2008 | Reply to a communication from the examining division | 04.05.2009 | Despatch of a communication from the examining division (Time limit: M04) | 08.09.2009 | Reply to a communication from the examining division | 02.08.2010 | Despatch of a communication from the examining division (Time limit: M04) | 13.12.2010 | Reply to a communication from the examining division | 16.12.2011 | Communication of intention to grant the patent | 05.04.2012 | Fee for grant paid | 05.04.2012 | Fee for publishing/printing paid | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 20.03.2008 | Opposition(s) | 01.03.2013 | No opposition filed within time limit [2013/19] | Fees paid | Renewal fee | 13.07.2007 | Renewal fee patent year 03 | 14.07.2008 | Renewal fee patent year 04 | 10.07.2009 | Renewal fee patent year 05 | 14.07.2010 | Renewal fee patent year 06 | 12.07.2011 | Renewal fee patent year 07 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XAY] US5974165 (GIGER MARYELLEN L et al.) [A] 7,8,16,17 [Y] 6,9-13 | [X] US2003095710 (TESSADRO ANA M et al.) | [XAY] NAKAMAE K, MIDOH Y, MIURA K, FUJIOKA H: "Boundary extraction in the SEM cross-section of LSI", PROCEEDINGS OF THE SPIE, vol. 4572, 2001, pages 451 - 458, XP002446458 DOI: http://dx.doi.org/10.1117/12.444214 | [X] CHEN WEI, ACTON SCOTT T: "Morphological pyramids for multiscale edge detection", PROCEEDINGS OF THE IEEE SOUTHWEST SYMPOSIUM ON IMAGE ANALYSIS AND INTERPRETATION, 1998, pages 137 - 141, XP002446459 | [X] MITUTOYO: "Quick Vision Apex - CNC Vision Measuring System", BULLETIN, vol. 1757, July 2004 (2004-07-01), XP002446460, Retrieved from the Internet | by applicant | "QVPAK 3D CNC VISION MEASURING MACHINE USERS GUIDE", January 2003 | "QVPAK 3D CNC VISION MEASURING MACHINE OPERATION GUIDE", September 1996 |