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Extract from the Register of European Patents

EP About this file: EP1650528

EP1650528 - Apparatus and method of heterodyne interferometry for imaging [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  19.07.2013
Database last updated on 31.08.2024
Most recent event   Tooltip19.07.2013Application deemed to be withdrawnpublished on 21.08.2013  [2013/34]
Applicant(s)For all designated states
Kabushiki Kaisha TOPCON
75-1, Hasunuma-cho
Itabashi-ku
Tokyo 174-8580 / JP
[N/P]
Former [2006/17]For all designated states
Kabushiki Kaisha TOPCON
75-1, Hasunuma-cho, Itabashi-ku
Tokyo 174-8580 / JP
Inventor(s)01 / Chan, Kinpui
27-12 Shironishi-machi 5-chome
Yamagata-shi, Yamagata 990-0832 / JP
02 / Akiba, Masahiro
2666-2 Nagasaki, Nakayama-machi
Higashimurayama-gun, Yamagata 990-0401 / JP
03 / Fukuma, Yasufumi
c/o Kabushiki Kaisha TOPCON
75-1 Hasunuma-cho
Itabashi-ku, Tokyo 174-8580 / JP
04 / Otsuka, Hiroyuki
c/o Kabushiki Kaisha TOPCON
75-1 Hasunuma-cho
Itabashi-ku, Tokyo 174-8580 / JP
05 / Tsukada, Hisashi
c/o Kabushiki Kaisha TOPCON
75-1 Hasunuma-cho
Itabashi-ku, Tokyo 174-8580 / JP
06 / Yumikake, Kazuhiko
c/o Kabushiki Kaisha TOPCON
75-1 Hasunuma-cho
Itabashi-ku, Tokyo 174-8580 / JP
 [2012/46]
Former [2006/17]01 / Chan, Kinpui
27-12 Shironishi-machi 5-chome
Yamagata-shi, Yamagata 990-0832 / JP
02 / Akiba, Masahiro
2666-2 Nagasaki, Nakayama-machi
Higashimurayama-gun, Yamagata 990-0401 / JP
03 / Fukuma, Yasufumi
c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho
Itabashi-ku, Tokyo 174-8580 / JP
04 / Otsuka, Hiroyuki
c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho
Itabashi-ku, Tokyo 174-8580 / JP
05 / Tsukada, Hisashi
c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho
Itabashi-ku, Tokyo 174-8580 / JP
06 / Yumikaze, Kazuhiko
c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho
Itabashi-ku, Tokyo 174-8580 / JP
Representative(s)Vossius & Partner Patentanwälte Rechtsanwälte mbB
Siebertstrasse 3
81675 München / DE
[N/P]
Former [2008/35]Vossius & Partner
Siebertstrasse 3
81675 München / DE
Former [2006/17]Vossius & Partner
Siebertstrasse 4
81675 München / DE
Application number, filing date05022289.212.10.2005
[2006/17]
Priority number, dateJP2004029903613.10.2004         Original published format: JP 2004299036
[2006/17]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1650528
Date:26.04.2006
Language:EN
[2006/17]
Type: A3 Search report 
No.:EP1650528
Date:25.01.2012
Language:EN
[2012/04]
Search report(s)(Supplementary) European search report - dispatched on:EP29.12.2011
ClassificationIPC:G01B11/24, G01B9/02
[2006/17]
CPC:
G01B9/02007 (EP,US); G01B11/2441 (EP,US); G01B9/02003 (EP,US);
G01B9/02014 (EP,US); G01B9/02027 (EP,US); G01B9/02044 (EP,US);
G01B9/02069 (EP,US); G01B9/02091 (EP,US); G01B2290/45 (EP,US);
G01B2290/65 (EP,US); G01B2290/70 (EP,US) (-)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2006/17]
TitleGerman:Vorrichtung und Verfahren für Bilderzeugung mitels Heterodyninterferometrie[2006/17]
English:Apparatus and method of heterodyne interferometry for imaging[2006/17]
French:Procédé et dispositif d'imagerie en utilisant un interféromètre hétérodyne[2012/44]
Former [2006/17]Procédé et dispositif d'imagerie utilisant un interféromètre hétérodyne
Examination procedure20.07.2012Amendment by applicant (claims and/or description)
20.07.2012Examination requested  [2012/36]
18.10.2012Communication of intention to grant the patent
01.03.2013Application deemed to be withdrawn, date of legal effect  [2013/34]
05.04.2013Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time  [2013/34]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  18.10.2012
Fees paidRenewal fee
30.10.2007Renewal fee patent year 03
31.10.2008Renewal fee patent year 04
26.10.2009Renewal fee patent year 05
22.10.2010Renewal fee patent year 06
24.10.2011Renewal fee patent year 07
Penalty fee
Additional fee for renewal fee
31.10.201208   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]JP2001066245  (JAPAN SCIENCE & TECH CORP) [X] 1,2,15 * abstract * * paragraph [0001] - paragraph [0089] *;
 [XD]JP2001330558  (JAPAN SCIENCE & TECH CORP) [XD] 1,2,15 * the whole document *;
 [X]US2002003607  (TOIDA MASAHIRO [JP]) [X] 1,2,15 * abstract * * paragraph [0026] - paragraph [0052] * * figure 1 *;
 [XA]JP2003035660  (JAPAN SCIENCE & TECH CORP) [X] 1,2,9-12,15,18 * abstract * * paragraph [0001] - paragraph [0083] * * figures 1,4,5 * [A] 3-8,13,14,16,17,19;
 [X]  - HUANG D ET AL, "OPTICAL COHERENCE TOMOGRAPHY", SCIENCE, AMERICAN ASSOCIATION FOR THE ADVANCEMENT OF SCIENCE, WASHINGTON, DC; US, (19911122), vol. 254, no. 254, doi:10.1126/SCIENCE.1957169, ISSN 0036-8075, pages 1178 - 1181, XP000604667 [X] 1,2,15 * the whole document *

DOI:   http://dx.doi.org/10.1126/science.1957169
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.