EP1650528 - Apparatus and method of heterodyne interferometry for imaging [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 19.07.2013 Database last updated on 31.08.2024 | Most recent event Tooltip | 19.07.2013 | Application deemed to be withdrawn | published on 21.08.2013 [2013/34] | Applicant(s) | For all designated states Kabushiki Kaisha TOPCON 75-1, Hasunuma-cho Itabashi-ku Tokyo 174-8580 / JP | [N/P] |
Former [2006/17] | For all designated states Kabushiki Kaisha TOPCON 75-1, Hasunuma-cho, Itabashi-ku Tokyo 174-8580 / JP | Inventor(s) | 01 /
Chan, Kinpui 27-12 Shironishi-machi 5-chome Yamagata-shi, Yamagata 990-0832 / JP | 02 /
Akiba, Masahiro 2666-2 Nagasaki, Nakayama-machi Higashimurayama-gun, Yamagata 990-0401 / JP | 03 /
Fukuma, Yasufumi c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho Itabashi-ku, Tokyo 174-8580 / JP | 04 /
Otsuka, Hiroyuki c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho Itabashi-ku, Tokyo 174-8580 / JP | 05 /
Tsukada, Hisashi c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho Itabashi-ku, Tokyo 174-8580 / JP | 06 /
Yumikake, Kazuhiko c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho Itabashi-ku, Tokyo 174-8580 / JP | [2012/46] |
Former [2006/17] | 01 /
Chan, Kinpui 27-12 Shironishi-machi 5-chome Yamagata-shi, Yamagata 990-0832 / JP | ||
02 /
Akiba, Masahiro 2666-2 Nagasaki, Nakayama-machi Higashimurayama-gun, Yamagata 990-0401 / JP | |||
03 /
Fukuma, Yasufumi c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho Itabashi-ku, Tokyo 174-8580 / JP | |||
04 /
Otsuka, Hiroyuki c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho Itabashi-ku, Tokyo 174-8580 / JP | |||
05 /
Tsukada, Hisashi c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho Itabashi-ku, Tokyo 174-8580 / JP | |||
06 /
Yumikaze, Kazuhiko c/o Kabushiki Kaisha TOPCON 75-1 Hasunuma-cho Itabashi-ku, Tokyo 174-8580 / JP | Representative(s) | Vossius & Partner Patentanwälte Rechtsanwälte mbB Siebertstrasse 3 81675 München / DE | [N/P] |
Former [2008/35] | Vossius & Partner Siebertstrasse 3 81675 München / DE | ||
Former [2006/17] | Vossius & Partner Siebertstrasse 4 81675 München / DE | Application number, filing date | 05022289.2 | 12.10.2005 | [2006/17] | Priority number, date | JP20040299036 | 13.10.2004 Original published format: JP 2004299036 | [2006/17] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1650528 | Date: | 26.04.2006 | Language: | EN | [2006/17] | Type: | A3 Search report | No.: | EP1650528 | Date: | 25.01.2012 | Language: | EN | [2012/04] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 29.12.2011 | Classification | IPC: | G01B11/24, G01B9/02 | [2006/17] | CPC: |
G01B9/02007 (EP,US);
G01B11/2441 (EP,US);
G01B9/02003 (EP,US);
G01B9/02014 (EP,US);
G01B9/02027 (EP,US);
G01B9/02044 (EP,US);
G01B9/02069 (EP,US);
G01B9/02091 (EP,US);
G01B2290/45 (EP,US);
| Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR [2006/17] | Title | German: | Vorrichtung und Verfahren für Bilderzeugung mitels Heterodyninterferometrie | [2006/17] | English: | Apparatus and method of heterodyne interferometry for imaging | [2006/17] | French: | Procédé et dispositif d'imagerie en utilisant un interféromètre hétérodyne | [2012/44] |
Former [2006/17] | Procédé et dispositif d'imagerie utilisant un interféromètre hétérodyne | Examination procedure | 20.07.2012 | Amendment by applicant (claims and/or description) | 20.07.2012 | Examination requested [2012/36] | 18.10.2012 | Communication of intention to grant the patent | 01.03.2013 | Application deemed to be withdrawn, date of legal effect [2013/34] | 05.04.2013 | Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time [2013/34] | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 18.10.2012 | Fees paid | Renewal fee | 30.10.2007 | Renewal fee patent year 03 | 31.10.2008 | Renewal fee patent year 04 | 26.10.2009 | Renewal fee patent year 05 | 22.10.2010 | Renewal fee patent year 06 | 24.10.2011 | Renewal fee patent year 07 | Penalty fee | Additional fee for renewal fee | 31.10.2012 | 08   M06   Not yet paid |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]JP2001066245 (JAPAN SCIENCE & TECH CORP) [X] 1,2,15 * abstract * * paragraph [0001] - paragraph [0089] *; | [XD]JP2001330558 (JAPAN SCIENCE & TECH CORP) [XD] 1,2,15 * the whole document *; | [X]US2002003607 (TOIDA MASAHIRO [JP]) [X] 1,2,15 * abstract * * paragraph [0026] - paragraph [0052] * * figure 1 *; | [XA]JP2003035660 (JAPAN SCIENCE & TECH CORP) [X] 1,2,9-12,15,18 * abstract * * paragraph [0001] - paragraph [0083] * * figures 1,4,5 * [A] 3-8,13,14,16,17,19; | [X] - HUANG D ET AL, "OPTICAL COHERENCE TOMOGRAPHY", SCIENCE, AMERICAN ASSOCIATION FOR THE ADVANCEMENT OF SCIENCE, WASHINGTON, DC; US, (19911122), vol. 254, no. 254, doi:10.1126/SCIENCE.1957169, ISSN 0036-8075, pages 1178 - 1181, XP000604667 [X] 1,2,15 * the whole document * DOI: http://dx.doi.org/10.1126/science.1957169 |