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Extract from the Register of European Patents

EP About this file: EP1777815

EP1777815 - Flap resonator, method of manufacturing a flap resonator, and integrated circuit including the flap resonator [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  26.09.2008
Database last updated on 13.11.2024
Most recent event   Tooltip26.09.2008Application deemed to be withdrawnpublished on 29.10.2008  [2008/44]
Applicant(s)For all designated states
Seiko Epson Corporation
4-1, Nishi-Shinjuku 2-chome
Shinjuku-ku
Tokyo 163-0811 / JP
[N/P]
Former [2007/17]For all designated states
SEIKO EPSON CORPORATION
4-1, Nishi-shinjuku 2-chome Shinjuku-ku
Tokyo 163-0811 / JP
Inventor(s)01 / Tanaka, Kazuaki, Epson Europe Electronics GmbH
Barcelona, R&D Lab., Edif. Testa - c/Alcade Barnils, 64-68 Modulo C, 2a planta
08190 Sant Cugat del Vallés (Barcelona) / ES
 [2007/17]
Representative(s)Carpintero Lopez, Francisco, et al
Herrero & Asociados, S.L.
Agustín de Foxá, 4-10
28036 Madrid / ES
[N/P]
Former [2007/17]Carpintero Lopez, Francisco, et al
Herrero & Asociados, S.L. Alcalá 35
28014 Madrid / ES
Application number, filing date05022647.118.10.2005
[2007/17]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1777815
Date:25.04.2007
Language:EN
[2007/17]
Search report(s)(Supplementary) European search report - dispatched on:EP24.04.2006
ClassificationIPC:H03H9/24, H03H9/02, H03H3/007
[2007/17]
CPC:
H03H9/2457 (EP,US); H03H3/0072 (EP,US); H03H9/02259 (EP,US);
H03H2009/02511 (EP,US)
Designated contracting statesGB [2008/01]
Former [2007/17]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Einseitig eingespannter Balkenresonator, Verfahren zur Herstellung eines Resonators und Integrierte Schaltung mit einem Resonator[2007/17]
English:Flap resonator, method of manufacturing a flap resonator, and integrated circuit including the flap resonator[2007/17]
French:Résonateur à poutre encastrée-libre, procédé de fabrication d'un tel résonateur et circuit integré comportant un tel résonateur[2007/17]
Examination procedure18.09.2006Examination requested  [2007/17]
26.10.2007Loss of particular rights, legal effect: designated state(s)
04.12.2007Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR
13.12.2007Despatch of a communication from the examining division (Time limit: M04)
24.04.2008Application deemed to be withdrawn, date of legal effect  [2008/44]
30.05.2008Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2008/44]
Fees paidRenewal fee
16.10.2007Renewal fee patent year 03
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Documents cited:Search[A]US2003085779  (MA QING [US], et al) [A] 1-27 * page 2, paragraph 25 - paragraph 30; figures 4-7 *;
 [DA]US2005046518  (ZURCHER PETER [US], et al) [DA] 1-27 * page 2, paragraph 23 - paragraph 28; figures 1-3 *;
 [A]EP1585219  (SEIKO EPSON CORP [JP]) [A] 1-27 * page 6, line 6 - page 7, line 4; figures 1-8,9a-9d *;
 [A]  - YASUMURA K Y ET AL, "Quality Factors in Micron- and Submicron-Thick Cantilevers", JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, IEEE SERVICE CENTER, PISCATAWAY, NJ, US, (200003), vol. 9, no. 1, ISSN 1057-7157, pages 117 - 125, XP002368261 [A] 1-27 * abstract * * page 118 - page 121; figures 1-9 *

DOI:   http://dx.doi.org/10.1109/84.825786
 [A]  - YANG J ET AL, "Mechanical behavior of ultrathin microcantilever", SENSORS AND ACTUATORS A, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, (200005), vol. 82, no. 1-3, ISSN 0924-4247, pages 102 - 107, XP004198246 [A] 1-27 * the whole document *

DOI:   http://dx.doi.org/10.1016/S0924-4247(99)00319-2
 [DA]  - S. POURKAMALI ET AL, "High-Q Single Crystal Silicon HARPSS Capacitive Beam Resonators with Self-Aligned Sub-100nm Transduction Gaps", JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, USA, (200308), vol. 12, no. 4, pages 487 - 496, XP002373771 [DA] 1-27 * the whole document *

DOI:   http://dx.doi.org/10.1109/JMEMS.2003.811726
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.