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Extract from the Register of European Patents

EP About this file: EP1557841

EP1557841 - Multilevel Resistive Memory device and its writing erasing method [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  30.10.2009
Database last updated on 25.09.2024
Most recent event   Tooltip30.10.2009No opposition filed within time limitpublished on 02.12.2009  [2009/49]
Applicant(s)For all designated states
Sony Corporation
6-7-35 Kitashinagawa
Shinagawa-ku
Tokyo 141-0001 / JP
[N/P]
Former [2008/52]For all designated states
Sony Corporation
6-7-35 Kitashinagawa Shinagawa-ku
Tokyo 141-0001 / JP
Former [2005/30]For all designated states
Sony Corporation
6-7-35 Kitashinagawa, Shinagawa-ku
Tokyo 141-0001 / JP
Inventor(s)01 / Tsushima, Tomohito, Sony Corporation
Intellectual Property Dept. 6-7-35 Kitashinagawa
Shinagawa-ku Tokyo 141-0001 / JP
02 / Aratani, Katsuhisa, Sony Corporation
Intellectual Property Dept. 6-7-35 Kitashinagawa
Shinagawa-ku Tokyo 141-0001 / JP
03 / Kouchiyama, Akira, Sony Corporation
Intellectual Property Dept. 6-7-35 Kitashinagawa
Shinagawa-ku Tokyo 141-0001 / JP
 [2005/30]
Representative(s)Robinson, Nigel Alexander Julian, et al
D Young & Co LLP
120 Holborn
London EC1N 2DY / GB
[N/P]
Former [2007/42]Robinson, Nigel Alexander Julian, et al
D Young & Co 120 Holborn
London EC1N 2DY / GB
Former [2005/30]Pilch, Adam John Michael, et al
D Young & Co 120 Holborn
London EC1N 2DY / GB
Application number, filing date05250263.019.01.2005
[2005/30]
Priority number, dateJP2004001228820.01.2004         Original published format: JP 2004012288
JP2004012454320.04.2004         Original published format: JP 2004124543
[2005/30]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1557841
Date:27.07.2005
Language:EN
[2005/30]
Type: A3 Search report 
No.:EP1557841
Date:25.10.2006
[2006/43]
Type: B1 Patent specification 
No.:EP1557841
Date:24.12.2008
Language:EN
[2008/52]
Search report(s)(Supplementary) European search report - dispatched on:EP21.09.2006
ClassificationIPC:G11C11/56, G11C16/02
[2005/30]
CPC:
G11C11/5685 (EP,US); E03F5/06 (KR); E03F5/0401 (KR);
G11C11/5614 (EP,US); G11C13/0007 (EP,US); G11C13/0011 (EP,US);
G11C13/0069 (EP,US); G11C13/0097 (EP,US); E03F2005/066 (KR);
G11C2013/0071 (EP,US); G11C2213/32 (EP,US); G11C2213/34 (EP,US);
G11C2213/79 (EP,US) (-)
Designated contracting statesDE,   FR,   GB [2007/27]
Former [2005/30]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Resistiver Multibitspeicher und Schreib-Lösch-Verfahren zu dessen Anwendung[2005/30]
English:Multilevel Resistive Memory device and its writing erasing method[2005/30]
French:Mémoire multiniveau resistive et méthode d'écriture-effacement associée[2005/30]
Examination procedure04.04.2007Examination requested  [2007/21]
15.11.2007Despatch of a communication from the examining division (Time limit: M04)
19.02.2008Reply to a communication from the examining division
25.07.2008Communication of intention to grant the patent
07.11.2008Fee for grant paid
07.11.2008Fee for publishing/printing paid
Opposition(s)25.09.2009No opposition filed within time limit [2009/49]
Fees paidRenewal fee
12.01.2007Renewal fee patent year 03
14.01.2008Renewal fee patent year 04
31.03.2008Renewal fee patent year 05
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Documents cited:Search[XY]WO02091385  (COATUE CORP [US]) [X] 1,6-8 * figures 4,6 * * pages 11,14 * [Y] 1,6-8;
 [XY]US2003035314  (KOZICKI MICHAEL N [US]) [X] 1,6-8 * paragraphs [0051] - [0062]; figure 7 * [Y] 1,6-8;
 [PX]EP1426972  (SHARP KK [JP]) [PX] 1,6 * paragraphs [0020] , [0025] , [0035] , [0036] , [0043] , [0044]; figures 3,7,8,12b; claims 2-4 *;
 [PA]EP1486985  (SHARP KK [JP]) [PA] 1-5 * figures 8-12 ** paragraphs [0028] - [0034] *;
 [Y]  - BECK A ET AL, "Reproducible switching effect in thin oxide films for memory applications", APPLIED PHYSICS LETTERS, AIP, AMERICAN INSTITUTE OF PHYSICS, MELVILLE, NY, US, (20000703), vol. 77, no. 1, ISSN 0003-6951, pages 139 - 141, XP012025998 [Y] 6-8 * figure 3 *

DOI:   http://dx.doi.org/10.1063/1.126902
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.