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Extract from the Register of European Patents

EP About this file: EP1684081

EP1684081 - Method and device for characterizing the linear properties of an electrical component [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  20.04.2018
Database last updated on 07.10.2024
FormerThe patent has been granted
Status updated on  12.05.2017
FormerGrant of patent is intended
Status updated on  28.02.2017
Most recent event   Tooltip26.06.2020Lapse of the patent in a contracting state
New state(s): CY		published on 29.07.2020  [2020/31]
Applicant(s)For all designated states
ABB Research Ltd
Affolternstrasse 52
8050 Zürich / CH
[2017/24]
Former [2006/30]For all designated states
ABB Research Ltd
Affolternastrasse 52
8050 Zürich / CH
Inventor(s)01 / Niayesh, Kaveh
Sonnrainweg 1
5430 Wettingen / CH
02 / Berth, Matthias
Waffenplatzstrasse 80
8002 Zürich / CH
03 / Dahlquist, Andreas
Hofwiesenstrasse 262
8050 Zürich / CH
04 / Tiberg, Martin
Kronengasse 2
5400 Baden / CH
05 / Heitz, Christoph
Schulweg 2
8353 Elgg/ZH / CH
 [2006/30]
Representative(s)ABB Patent Attorneys
C/o ABB Schweiz AG
Intellectual Property CH-IP
Brown Boveri Strasse 6
5400 Baden / CH
[N/P]
Former [2017/24]ABB Patent Attorneys
c/o ABB Schweiz AG
Intellectual Property CH-IP
Brown Boveri Strasse 6
5400 Baden / CH
Former [2006/30]ABB Patent Attorneys
c/o ABB Schweiz AG, Intellectual Property (CH-LC/IP), Brown Boveri Strasse 6
5400 Baden / CH
Application number, filing date05405031.521.01.2005
[2006/30]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1684081
Date:26.07.2006
Language:EN
[2006/30]
Type: B1 Patent specification 
No.:EP1684081
Date:14.06.2017
Language:EN
[2017/24]
Search report(s)(Supplementary) European search report - dispatched on:EP14.07.2005
ClassificationIPC:G01R27/28
[2006/30]
CPC:
G01R27/28 (EP,US); Y02E60/00 (EP)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2017/24]
Former [2006/30]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Verfahren und Vorrichtung zur Charakterisierung der linearen Eigenschaften einer elektrischen Komponente[2006/30]
English:Method and device for characterizing the linear properties of an electrical component[2006/30]
French:Procédé et dispositif pour caractériser les propriétés linéaires d'un composant électrique[2006/30]
Examination procedure11.12.2006Examination requested  [2007/04]
22.11.2007Despatch of a communication from the examining division (Time limit: M04)
13.03.2008Reply to a communication from the examining division
01.03.2017Communication of intention to grant the patent
04.05.2017Fee for grant paid
04.05.2017Fee for publishing/printing paid
04.05.2017Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  22.11.2007
Opposition(s)15.03.2018No opposition filed within time limit [2018/21]
Fees paidRenewal fee
11.01.2007Renewal fee patent year 03
14.01.2008Renewal fee patent year 04
14.01.2009Renewal fee patent year 05
22.01.2010Renewal fee patent year 06
24.01.2011Renewal fee patent year 07
25.01.2012Renewal fee patent year 08
28.01.2013Renewal fee patent year 09
30.01.2014Renewal fee patent year 10
23.01.2015Renewal fee patent year 11
27.01.2016Renewal fee patent year 12
20.01.2017Renewal fee patent year 13
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU21.01.2005
AT14.06.2017
CY14.06.2017
CZ14.06.2017
DK14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
MC14.06.2017
NL14.06.2017
PL14.06.2017
PT14.06.2017
RO14.06.2017
SE14.06.2017
SI14.06.2017
SK14.06.2017
TR14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
IE21.01.2018
LU21.01.2018
BE31.01.2018
CH31.01.2018
LI31.01.2018
[2020/31]
Former [2020/27]HU21.01.2005
AT14.06.2017
CZ14.06.2017
DK14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
MC14.06.2017
NL14.06.2017
PL14.06.2017
PT14.06.2017
RO14.06.2017
SE14.06.2017
SI14.06.2017
SK14.06.2017
TR14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
IE21.01.2018
LU21.01.2018
BE31.01.2018
CH31.01.2018
LI31.01.2018
Former [2020/15]AT14.06.2017
CZ14.06.2017
DK14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
MC14.06.2017
NL14.06.2017
PL14.06.2017
RO14.06.2017
SE14.06.2017
SI14.06.2017
SK14.06.2017
TR14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
IE21.01.2018
LU21.01.2018
BE31.01.2018
CH31.01.2018
LI31.01.2018
Former [2019/30]AT14.06.2017
CZ14.06.2017
DK14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
MC14.06.2017
NL14.06.2017
PL14.06.2017
RO14.06.2017
SE14.06.2017
SI14.06.2017
SK14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
IE21.01.2018
LU21.01.2018
BE31.01.2018
CH31.01.2018
LI31.01.2018
Former [2019/09]AT14.06.2017
CZ14.06.2017
DK14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
NL14.06.2017
PL14.06.2017
RO14.06.2017
SE14.06.2017
SI14.06.2017
SK14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
IE21.01.2018
LU21.01.2018
BE31.01.2018
CH31.01.2018
LI31.01.2018
Former [2018/51]AT14.06.2017
CZ14.06.2017
DK14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
NL14.06.2017
PL14.06.2017
RO14.06.2017
SE14.06.2017
SI14.06.2017
SK14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
LU21.01.2018
BE31.01.2018
CH31.01.2018
LI31.01.2018
Former [2018/50]AT14.06.2017
CZ14.06.2017
DK14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
NL14.06.2017
PL14.06.2017
RO14.06.2017
SE14.06.2017
SI14.06.2017
SK14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
LU21.01.2018
BE31.01.2018
Former [2018/47]AT14.06.2017
CZ14.06.2017
DK14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
NL14.06.2017
PL14.06.2017
RO14.06.2017
SE14.06.2017
SI14.06.2017
SK14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
LU21.01.2018
Former [2018/40]AT14.06.2017
CZ14.06.2017
DK14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
NL14.06.2017
PL14.06.2017
RO14.06.2017
SE14.06.2017
SI14.06.2017
SK14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
Former [2018/21]AT14.06.2017
CZ14.06.2017
DK14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
NL14.06.2017
PL14.06.2017
RO14.06.2017
SE14.06.2017
SK14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
Former [2018/11]AT14.06.2017
CZ14.06.2017
EE14.06.2017
FI14.06.2017
IT14.06.2017
LT14.06.2017
NL14.06.2017
PL14.06.2017
RO14.06.2017
SE14.06.2017
SK14.06.2017
BG14.09.2017
GR15.09.2017
IS14.10.2017
Former [2018/10]AT14.06.2017
CZ14.06.2017
EE14.06.2017
FI14.06.2017
LT14.06.2017
NL14.06.2017
RO14.06.2017
SE14.06.2017
SK14.06.2017
BG14.09.2017
GR15.09.2017
Former [2018/09]EE14.06.2017
FI14.06.2017
LT14.06.2017
NL14.06.2017
SE14.06.2017
BG14.09.2017
GR15.09.2017
Former [2017/52]FI14.06.2017
LT14.06.2017
NL14.06.2017
SE14.06.2017
BG14.09.2017
GR15.09.2017
Former [2017/50]FI14.06.2017
LT14.06.2017
SE14.06.2017
BG14.09.2017
GR15.09.2017
Former [2017/49]FI14.06.2017
LT14.06.2017
GR15.09.2017
Documents cited:Search[X]US4156842  (BROOKS JAMES L [US], et al) [X] 10-12 * figure 1 * * column 2, line 50 - column 3, line 42 * * column 4, line 13 - line 28 * * column 6, line 60 - column 7, line 13 *;
 [A]EP0443835  (HEWLETT PACKARD CO [US]) [A] 1,2,9,10 * figures 1-7 * * page 2, line 36 - page 3, line 15 ** claims 1,6,8 *;
 [A]US6054867  (WAKAMATSU HIDEKI [JP]) [A] 1,2,9,10 * figures 2,6,8 *;
 [XA]  - AGILENT TECHNOLOGIES, "Agilent 4155C/4156C Semiconductor Parameter Analyzer User's Guide , Edition 1", AGILENT MANUALS, (200101), vol. 1, pages 1.1-1.20,2.41-2.46,4.39,4.41,7.19 - 7.25, XP002334387 [X] 10-12 * the whole document * [A] 1,2,9
 [XA]  - SI. FANG, Electrical Modeling of Main Injector Dipole Magnets, FERMI NATIONAL ACCELERATOR LABORATORY, (19950317), XP002334389 [X] 10-12 * figures 1,2 * * page 1 - page 2 * [A] 1,2,6,9
 [X]  - GUILLAUME P ET AL, "Parametric identification of two-port models in the frequency domain", INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE. ATLANTA, MAY 14, (19910514), vol. CONF. 8, ISBN 0-87942-579-2, pages 263 - 271, XP010036959 [X] 10-12 * figure 2 * * abstract * * page 263, paragraph I.INTRODUCTION * * page 267, paragraph VIII.CONCLUSIONS *

DOI:   http://dx.doi.org/10.1109/IMTC.1991.161590
 [A]  - SCHLAGENHAUFOR F ET AL, "Using N-port models for the analysis of radiating structures", 2002 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY. EMC. SYMPOSIUM RECORD. MINNEAPOLIS, MN, AUG. 19 - 23, 2002, INTERNATIONL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, NEW YORK, NY : IEEE, US, (20020819), VOL. 1 OF 2, ISBN 0-7803-7264-6, pages 297 - 302, XP010603241 [A] 1,2,9,10 * figure 1 * * page 297, paragraphs N-PORT.BASICS-THEORY *

DOI:   http://dx.doi.org/10.1109/ISEMC.2002.1032492
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