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EP1815217
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EP About this file: EP1815217
| EP1815217 - LIGHT INTENSITY MEASURING METHOD AND ELECTRONIC DEVICE [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 09.07.2010 Database last updated on 02.11.2024 | Most recent event Tooltip | 09.07.2010 | Application deemed to be withdrawn | published on 11.08.2010 [2010/32] | Applicant(s) | For all designated states Koninklijke Philips Electronics N.V. Groenewoudseweg 1 5621 BA Eindhoven / NL | [N/P] |
| Former [2007/32] | For all designated states Koninklijke Philips Electronics N.V. Groenewoudseweg 1 5621 BA Eindhoven / NL | Inventor(s) | 01 /
KUIPER, Stein c/o Philips Intellectual Property & Standards Cross Oak Lane, Redhill Surrey RH1 5HA / GB | 02 /
HENDRIKS, Bernardus H.W. c/o Philips Intellectual Property & Standards Cross Oak Lane, Redhill Surrey RH1 5HA / GB | 03 /
ZIJLSTRA, Robert W.J. c/o Philips Intellectual Property & Standards Cross Oak Lane, Redhill Surrey RH1 5HA / GB | [2007/32] | Representative(s) | Schouten, Marcus Maria NXP B.V. Intellectual Property & Licensing High Tech Campus 60 5656 AG Eindhoven / NL | [N/P] |
| Former [2007/32] | Schouten, Marcus Maria Philips Intellectual Property & Standards P.O. Box 220 5600 AE Eindhoven / NL | Application number, filing date | 05802333.4 | 07.11.2005 | [2007/32] | WO2005IB53639 | Priority number, date | GB20040025399 | 18.11.2004 Original published format: GB 0425399 | [2007/32] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2006054195 | Date: | 26.05.2006 | Language: | EN | [2006/21] | Type: | A1 Application with search report | No.: | EP1815217 | Date: | 08.08.2007 | Language: | EN | The application published by WIPO in one of the EPO official languages on 26.05.2006 takes the place of the publication of the European patent application. | [2007/32] | Search report(s) | International search report - published on: | EP | 26.05.2006 | Classification | IPC: | G01J1/42, G02B26/02 | [2007/32] | CPC: |
G01J1/429 (EP,US);
G01J1/50 (EP,US);
G02B1/06 (EP,US);
G02B26/005 (EP,US);
G01J1/0488 (EP,US)
| Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR [2007/32] | Extension states | AL | Not yet paid | BA | Not yet paid | HR | Not yet paid | MK | Not yet paid | YU | Not yet paid | Title | German: | LICHTINTENSITÄTS-MESSVERFAHREN UND ELEKTRONISCHE EINRICHTUNG | [2007/32] | English: | LIGHT INTENSITY MEASURING METHOD AND ELECTRONIC DEVICE | [2007/32] | French: | PROCEDE DE MESURE DE L'INTENSITE LUMINEUSE ET COMPOSANT ELECTRONIQUE | [2007/32] | Entry into regional phase | 18.06.2007 | National basic fee paid | 18.06.2007 | Designation fee(s) paid | 18.06.2007 | Examination fee paid | Examination procedure | 18.06.2007 | Examination requested [2007/32] | 10.10.2007 | Despatch of a communication from the examining division (Time limit: M06) | 14.04.2008 | Reply to a communication from the examining division | 05.10.2009 | Communication of intention to grant the patent | 16.02.2010 | Application deemed to be withdrawn, date of legal effect [2010/32] | 22.03.2010 | Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time [2010/32] | Fees paid | Renewal fee | 30.11.2007 | Renewal fee patent year 03 | 28.03.2008 | Renewal fee patent year 04 | Penalty fee | Additional fee for renewal fee | 30.11.2009 | 05 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [XDY]WO2004027489 (KONINKL PHILIPS ELECTRONICS NV [NL], et al) [XD] 1-6,14,15 * page 12, line 1 - line 15; figures 6,9,12,13 * [Y] 7-13; | [AD]WO2004038480 (KONINKL PHILIPS ELECTRONICS NV [NL], et al) [AD] 1-15 * page 16, line 23 - page 17, line 12; figure 19 *; | [X]EP1400834 (HEWLETT PACKARD DEVELOPMENT CO [US]) [X] 1-3 * abstract *; | [X]JPS6063430 ; | [Y]DE10120697 (SIEMENS AG [DE]) [Y] 7-13 * paragraphs [0004] , [0009] , [0010] , [0022]; figure 1 * | [A] - ROQUES-CARMES THIBAULT ET AL, "Liquid behavior inside a reflective display pixel based on electrowetting", JOURNAL OF APPLIED PHYSICS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, (20040415), vol. 95, no. 8, ISSN 0021-8979, pages 4389 - 4396, XP012067801 [A] 1-15 * the whole document * DOI: http://dx.doi.org/10.1063/1.1667595 | [X] - PATENT ABSTRACTS OF JAPAN, (19850816), vol. 009, no. 199, Database accession no. (P - 380), & JP60063430 A 19850411 (HOSHI DENKI SEIZOU KK) [X] 1-3 * abstract * | by applicant | WO03069380 | US2001017985 | WO2004002748 | WO2004038480 | WO2004077126 |