blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Extract from the Register of European Patents

EP About this file: EP1834337

EP1834337 - SRAM TEST METHOD AND SRAM TEST ARRANGEMENT TO DETECT WEAK CELLS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  19.07.2013
Database last updated on 25.09.2024
Most recent event   Tooltip18.07.2014Lapse of the patent in a contracting state
New state(s): HU
published on 20.08.2014  [2014/34]
Applicant(s)For all designated states
NXP B.V.
High Tech Campus 60
5656 AG Eindhoven / NL
[2009/50]
Former [2008/45]For all designated states
NXP B.V.
High Tech Campus 60
5656 AG Eindhoven / NL
Former [2008/42]For all designated states
NXP B.V.
High Tech Campus 60
5656 AG Eindhoven / NL
Former [2007/38]For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
Inventor(s)01 / PINEDA DE GYVEZ, Jose de Jesus
Philips Intel. Prop. & Standards
Cross Oak Lane
Redhill, Surrey RH1 5HA / GB
02 / AZIMANE, Mohamed
Philips Intel. Prop. & Standards
Cross Oak Lane
Redhill, Surrey RH1 5HA / GB
03 / PAVLOV, Andrei, S.
Philips Intel. Prop. & Standards
Cross Oak Lane
Redhill, Surrey RH1 5HA / GB
 [2012/37]
Former [2007/38]01 / PINEDA DE GYVEZ, Jose de Jesus
Philips Intel. Prop. & Standards, Cross Oak Lane
Redhill, Surrey RH1 5HA / GB
02 / AZIMANE, Mohamed
Philips Intel. Prop. & Standards, Cross Oak Lane
Redhill, Surrey RH1 5HA / GB
03 / PAVLOV, Andrei, S.
Philips Intel. Prop. & Standards, Cross Oak Lane
Redhill, Surrey RH1 5HA / GB
Representative(s)Williamson, Paul Lewis, et al
NXP Semiconductors
Intellectual Property and Licensing
Red Central
60 High Street, Redhill
Surrey RH1 1NY / GB
[N/P]
Former [2012/37]Williamson, Paul Lewis, et al
NXP Semiconductors
Intellectual Property and Licensing
Red Central
60 High Street, Redhill
Surrey RH1 1NY / GB
Former [2009/09]Williamson, Paul Lewis, et al
NXP Semiconductors UK Ltd. Intellectual Property Department Betchworth House Station Road Redhill
Surrey RH1 1DL / GB
Former [2008/33]White, Andrew Gordon
NXP Semiconductors Intellectual Property Department Cross Oak Lane
Redhill, Surrey RH1 5HA / GB
Former [2007/38]White, Andrew Gordon
NXP Semiconductors IP Department Cross Oak Lane
Redhill, Surrey RH1 5HA / GB
Application number, filing date05802806.908.11.2005
[2007/38]
WO2005IB53677
Priority number, dateGB2004002600526.11.2004         Original published format: GB 0426005
[2007/38]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2006056902
Date:01.06.2006
Language:EN
[2006/22]
Type: A1 Application with search report 
No.:EP1834337
Date:19.09.2007
Language:EN
The application published by WIPO in one of the EPO official languages on 01.06.2006 takes the place of the publication of the European patent application.
[2007/38]
Type: B1 Patent specification 
No.:EP1834337
Date:12.09.2012
Language:EN
[2012/37]
Search report(s)International search report - published on:EP01.06.2006
ClassificationIPC:G11C29/50
[2012/16]
CPC:
G11C29/00 (KR); G11C29/50 (EP,US)
Former IPC [2007/38]G11C29/00
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2007/38]
TitleGerman:SRAM-TESTVERFAHREN UND SRAM-TESTANORDNUNG ZUR DETEKTION SCHWACHER ZELLEN[2007/38]
English:SRAM TEST METHOD AND SRAM TEST ARRANGEMENT TO DETECT WEAK CELLS[2007/38]
French:PROCEDE DE TEST DE SRAM ET SYSTEME DE TEST DE SRAM POUR DETECTER DE CELLULES FAIBLES[2007/38]
Entry into regional phase26.06.2007National basic fee paid 
26.06.2007Designation fee(s) paid 
26.06.2007Examination fee paid 
Examination procedure26.06.2007Examination requested  [2007/38]
30.09.2009Despatch of a communication from the examining division (Time limit: M04)
22.01.2010Reply to a communication from the examining division
25.04.2012Communication of intention to grant the patent
01.08.2012Fee for grant paid
01.08.2012Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  30.09.2009
Opposition(s)13.06.2013No opposition filed within time limit [2013/34]
Fees paidRenewal fee
30.11.2007Renewal fee patent year 03
01.12.2008Renewal fee patent year 04
30.11.2009Renewal fee patent year 05
30.11.2010Renewal fee patent year 06
30.11.2011Renewal fee patent year 07
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU08.11.2005
AT12.09.2012
BE12.09.2012
CY12.09.2012
CZ12.09.2012
DK12.09.2012
EE12.09.2012
FI12.09.2012
IT12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
PL12.09.2012
RO12.09.2012
SE12.09.2012
SI12.09.2012
SK12.09.2012
TR12.09.2012
IE08.11.2012
LU08.11.2012
CH30.11.2012
LI30.11.2012
MC30.11.2012
BG12.12.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
PT14.01.2013
[2014/34]
Former [2014/27]AT12.09.2012
BE12.09.2012
CY12.09.2012
CZ12.09.2012
DK12.09.2012
EE12.09.2012
FI12.09.2012
IT12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
PL12.09.2012
RO12.09.2012
SE12.09.2012
SI12.09.2012
SK12.09.2012
TR12.09.2012
IE08.11.2012
LU08.11.2012
CH30.11.2012
LI30.11.2012
MC30.11.2012
BG12.12.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
PT14.01.2013
Former [2014/21]AT12.09.2012
BE12.09.2012
CY12.09.2012
CZ12.09.2012
DK12.09.2012
EE12.09.2012
FI12.09.2012
IT12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
PL12.09.2012
RO12.09.2012
SE12.09.2012
SI12.09.2012
SK12.09.2012
TR12.09.2012
IE08.11.2012
CH30.11.2012
LI30.11.2012
MC30.11.2012
BG12.12.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
PT14.01.2013
Former [2013/47]AT12.09.2012
BE12.09.2012
CY12.09.2012
CZ12.09.2012
DK12.09.2012
EE12.09.2012
FI12.09.2012
IT12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
PL12.09.2012
RO12.09.2012
SE12.09.2012
SI12.09.2012
SK12.09.2012
IE08.11.2012
CH30.11.2012
LI30.11.2012
BG12.12.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
PT14.01.2013
Former [2013/37]AT12.09.2012
BE12.09.2012
CY12.09.2012
CZ12.09.2012
DK12.09.2012
EE12.09.2012
FI12.09.2012
IT12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
PL12.09.2012
RO12.09.2012
SE12.09.2012
SI12.09.2012
SK12.09.2012
CH30.11.2012
LI30.11.2012
BG12.12.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
PT14.01.2013
Former [2013/34]AT12.09.2012
BE12.09.2012
CY12.09.2012
CZ12.09.2012
DK12.09.2012
EE12.09.2012
FI12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
PL12.09.2012
RO12.09.2012
SE12.09.2012
SI12.09.2012
SK12.09.2012
CH30.11.2012
LI30.11.2012
BG12.12.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
PT14.01.2013
Former [2013/33]AT12.09.2012
BE12.09.2012
CY12.09.2012
CZ12.09.2012
EE12.09.2012
FI12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
PL12.09.2012
RO12.09.2012
SE12.09.2012
SI12.09.2012
SK12.09.2012
CH30.11.2012
LI30.11.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
PT14.01.2013
Former [2013/31]AT12.09.2012
BE12.09.2012
CY12.09.2012
CZ12.09.2012
EE12.09.2012
FI12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
PL12.09.2012
RO12.09.2012
SE12.09.2012
SI12.09.2012
SK12.09.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
PT14.01.2013
Former [2013/28]BE12.09.2012
CY12.09.2012
CZ12.09.2012
EE12.09.2012
FI12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
PL12.09.2012
RO12.09.2012
SE12.09.2012
SI12.09.2012
SK12.09.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
PT14.01.2013
Former [2013/23]BE12.09.2012
CY12.09.2012
CZ12.09.2012
EE12.09.2012
FI12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
PL12.09.2012
RO12.09.2012
SE12.09.2012
SI12.09.2012
SK12.09.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
Former [2013/22]BE12.09.2012
CY12.09.2012
CZ12.09.2012
EE12.09.2012
FI12.09.2012
LT12.09.2012
LV12.09.2012
NL12.09.2012
SE12.09.2012
SI12.09.2012
GR13.12.2012
ES23.12.2012
IS12.01.2013
Former [2013/20]BE12.09.2012
CY12.09.2012
FI12.09.2012
LT12.09.2012
LV12.09.2012
SE12.09.2012
SI12.09.2012
GR13.12.2012
Former [2013/12]CY12.09.2012
FI12.09.2012
LT12.09.2012
LV12.09.2012
SE12.09.2012
SI12.09.2012
GR13.12.2012
Former [2013/11]CY12.09.2012
FI12.09.2012
LT12.09.2012
LV12.09.2012
SI12.09.2012
GR13.12.2012
Former [2013/10]CY12.09.2012
FI12.09.2012
LT12.09.2012
Former [2013/09]FI12.09.2012
LT12.09.2012
Former [2013/08]LT12.09.2012
Cited inInternational search[A]US5559745  (BANIK JASHOJIBAN [US], et al) [A] 1,7 * column 2, line 24 - line 46; figures 1-4 *;
 [A]US5835429  (SCHWARZ WILLIAM [US]) [A] 1,7 * abstract *;
 [DA]US2003210593  (SELVIN ERIC B [US], et al) [DA] 1,7 * paragraphs [0034] - [0041]; figures 1-4 *
by applicantUS5559745
 US6778450
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.