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Extract from the Register of European Patents

EP About this file: EP1836473

EP1836473 - EVALUATING METHOD OF THE RESIDUAL STRESS DETERMINING METHOD USING THE CONTINUOUS INDENTATION METHOD [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  23.08.2019
Database last updated on 14.09.2024
FormerThe patent has been granted
Status updated on  14.09.2018
FormerGrant of patent is intended
Status updated on  11.09.2018
FormerExamination is in progress
Status updated on  11.08.2018
FormerGrant of patent is intended
Status updated on  08.04.2018
FormerExamination is in progress
Status updated on  25.02.2017
Most recent event   Tooltip03.07.2020Lapse of the patent in a contracting state
New state(s): CY
published on 05.08.2020  [2020/32]
Applicant(s)For all designated states
Jung, Won Seok
32-9, Hwoiwon 1-dong, Hwoiwon-gu
Masan-si, Gyeongsangnam-do 630-040 / KR
For all designated states
Frontics, Inc.
3rd Fl. 305 ho, Center for Advanced Materials
Research Institute, Seoul National Univ.
An 56-1 Sillim-dong
Gwanak-gu, Seoul / KR
[2018/42]
Former [2007/39]For all designated states
Jung, Won Seok
32-9, Hwoiwon 1-dong, Hwoiwon-gu
Masan-si, Gyeongsangnam-do 630-040 / KR
For all designated states
Frontics, Inc.
3rd Fl. 305 ho, Center for Advanced Materials Research Institute, Seoul National Univ. An 56-1 Sillim-dong, Gwanak-gu;
An 56-1 Sillim-dong, Gwanak-gu; / KR
Inventor(s)01 / KIM, Kwang Ho
B01 Ho
66-21 Bongcheon 6-dong
Gwank-gu
Seoul, 151-050 / KR
 [2018/42]
Former [2007/39]01 / KIM, Kwang Ho
B01 Ho, 66-21 Bongcheon 6-dong, Gwank-gu
Seoul, 151-050 / KR
Representative(s)Schumacher & Willsau
Patentanwaltsgesellschaft mbH
Nymphenburger Straße 42
80335 München / DE
[2018/42]
Former [2013/31]Schumacher & Willsau
Patentanwaltsgesellschaft mbH Nymphenburger Strasse 42
80335 München / DE
Former [2007/39]Schumacher, Dirk
Schumacher & Willsau Patentanwaltssozietät Nymphenburger Strasse 42
80335 München / DE
Application number, filing date05821024.622.11.2005
[2007/39]
WO2005KR03947
Priority number, dateKR2004010675916.12.2004         Original published format: KR 20040106759
[2007/39]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2006071001
Date:06.07.2006
Language:EN
[2006/27]
Type: A1 Application with search report 
No.:EP1836473
Date:26.09.2007
Language:EN
The application published by WIPO in one of the EPO official languages on 06.07.2006 takes the place of the publication of the European patent application.
[2007/39]
Type: B1 Patent specification 
No.:EP1836473
Date:17.10.2018
Language:EN
[2018/42]
Search report(s)International search report - published on:KR06.07.2006
(Supplementary) European search report - dispatched on:EP06.11.2013
ClassificationIPC:G01N3/42
[2007/39]
CPC:
G01N3/42 (EP,KR,US); G01N3/48 (KR); G01N2011/0033 (KR);
G01N2203/0076 (EP,US); G01N2203/0078 (KR); G01N2203/008 (EP,KR,US);
G01N2203/0082 (EP,KR,US) (-)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2018/42]
Former [2007/39]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:AUSWERTUNGSVERFAHREN FÜR DAS EIGENSPANNUNGSBESTIMMUNGSVERFAHREN UNTER VERWENDUNG DES DAUEREINDRUCKVERFAHRENS[2007/39]
English:EVALUATING METHOD OF THE RESIDUAL STRESS DETERMINING METHOD USING THE CONTINUOUS INDENTATION METHOD[2007/39]
French:PROCEDE D'EVALUATION POUR LE PROCEDE DE DETERMINATION DE LA CONTRAINTE RESIDUELLE A L'AIDE DU PROCEDE DE PENETRATION EN CONTINU[2007/39]
Entry into regional phase16.07.2007National basic fee paid 
16.07.2007Search fee paid 
16.07.2007Designation fee(s) paid 
16.07.2007Examination fee paid 
Examination procedure16.07.2007Examination requested  [2007/39]
02.06.2014Amendment by applicant (claims and/or description)
07.01.2015Despatch of a communication from the examining division (Time limit: M06)
26.06.2015Reply to a communication from the examining division
20.11.2015Despatch of a communication from the examining division (Time limit: M08)
18.07.2016Reply to a communication from the examining division
15.02.2017Despatch of a communication from the examining division (Time limit: M06)
14.08.2017Reply to a communication from the examining division
09.04.2018Communication of intention to grant the patent
03.08.2018Disapproval of the communication of intention to grant the patent by the applicant or resumption of examination proceedings by the EPO
03.08.2018Fee for grant paid
03.08.2018Fee for publishing/printing paid
11.09.2018Information about intention to grant a patent
11.09.2018Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  07.01.2015
Opposition(s)18.07.2019No opposition filed within time limit [2019/39]
Fees paidRenewal fee
21.11.2007Renewal fee patent year 03
07.11.2008Renewal fee patent year 04
23.11.2009Renewal fee patent year 05
07.09.2010Renewal fee patent year 06
05.09.2011Renewal fee patent year 07
21.09.2012Renewal fee patent year 08
10.09.2013Renewal fee patent year 09
18.11.2014Renewal fee patent year 10
25.11.2015Renewal fee patent year 11
18.11.2016Renewal fee patent year 12
13.11.2017Renewal fee patent year 13
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Lapses during opposition  TooltipHU22.11.2005
AT17.10.2018
CY17.10.2018
CZ17.10.2018
DK17.10.2018
EE17.10.2018
ES17.10.2018
FI17.10.2018
IT17.10.2018
LT17.10.2018
LV17.10.2018
MC17.10.2018
NL17.10.2018
PL17.10.2018
RO17.10.2018
SE17.10.2018
SI17.10.2018
SK17.10.2018
TR17.10.2018
IE22.11.2018
LU22.11.2018
BE30.11.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
PT17.02.2019
[2020/32]
Former [2020/30]HU22.11.2005
AT17.10.2018
CZ17.10.2018
DK17.10.2018
EE17.10.2018
ES17.10.2018
FI17.10.2018
IT17.10.2018
LT17.10.2018
LV17.10.2018
MC17.10.2018
NL17.10.2018
PL17.10.2018
RO17.10.2018
SE17.10.2018
SI17.10.2018
SK17.10.2018
TR17.10.2018
IE22.11.2018
LU22.11.2018
BE30.11.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
PT17.02.2019
Former [2020/17]AT17.10.2018
CZ17.10.2018
DK17.10.2018
EE17.10.2018
ES17.10.2018
FI17.10.2018
IT17.10.2018
LT17.10.2018
LV17.10.2018
MC17.10.2018
NL17.10.2018
PL17.10.2018
RO17.10.2018
SE17.10.2018
SI17.10.2018
SK17.10.2018
TR17.10.2018
IE22.11.2018
LU22.11.2018
BE30.11.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
PT17.02.2019
Former [2019/50]AT17.10.2018
CZ17.10.2018
DK17.10.2018
EE17.10.2018
ES17.10.2018
FI17.10.2018
IT17.10.2018
LT17.10.2018
LV17.10.2018
MC17.10.2018
NL17.10.2018
PL17.10.2018
RO17.10.2018
SE17.10.2018
SI17.10.2018
SK17.10.2018
IE22.11.2018
LU22.11.2018
BE30.11.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
PT17.02.2019
Former [2019/48]AT17.10.2018
CZ17.10.2018
DK17.10.2018
EE17.10.2018
ES17.10.2018
FI17.10.2018
IT17.10.2018
LT17.10.2018
LV17.10.2018
MC17.10.2018
NL17.10.2018
PL17.10.2018
RO17.10.2018
SE17.10.2018
SK17.10.2018
IE22.11.2018
LU22.11.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
PT17.02.2019
Former [2019/40]AT17.10.2018
CZ17.10.2018
DK17.10.2018
EE17.10.2018
ES17.10.2018
FI17.10.2018
IT17.10.2018
LT17.10.2018
LV17.10.2018
MC17.10.2018
NL17.10.2018
PL17.10.2018
RO17.10.2018
SE17.10.2018
SK17.10.2018
LU22.11.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
PT17.02.2019
Former [2019/37]AT17.10.2018
CZ17.10.2018
DK17.10.2018
EE17.10.2018
ES17.10.2018
FI17.10.2018
IT17.10.2018
LT17.10.2018
LV17.10.2018
MC17.10.2018
NL17.10.2018
PL17.10.2018
RO17.10.2018
SE17.10.2018
LU22.11.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
PT17.02.2019
Former [2019/35]AT17.10.2018
CZ17.10.2018
DK17.10.2018
ES17.10.2018
FI17.10.2018
IT17.10.2018
LT17.10.2018
LV17.10.2018
NL17.10.2018
PL17.10.2018
SE17.10.2018
LU22.11.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
PT17.02.2019
Former [2019/34]AT17.10.2018
DK17.10.2018
ES17.10.2018
FI17.10.2018
IT17.10.2018
LT17.10.2018
LV17.10.2018
NL17.10.2018
PL17.10.2018
SE17.10.2018
LU22.11.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
PT17.02.2019
Former [2019/26]AT17.10.2018
ES17.10.2018
FI17.10.2018
LT17.10.2018
LV17.10.2018
NL17.10.2018
PL17.10.2018
SE17.10.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
PT17.02.2019
Former [2019/24]AT17.10.2018
ES17.10.2018
FI17.10.2018
LT17.10.2018
LV17.10.2018
NL17.10.2018
PL17.10.2018
SE17.10.2018
BG17.01.2019
GR18.01.2019
IS17.02.2019
Former [2019/23]AT17.10.2018
ES17.10.2018
FI17.10.2018
LT17.10.2018
LV17.10.2018
NL17.10.2018
PL17.10.2018
BG17.01.2019
IS17.02.2019
Former [2019/22]FI17.10.2018
LT17.10.2018
NL17.10.2018
PL17.10.2018
BG17.01.2019
IS17.02.2019
Former [2019/21]FI17.10.2018
LT17.10.2018
NL17.10.2018
IS17.02.2019
Former [2019/20]LT17.10.2018
NL17.10.2018
Former [2019/17]NL17.10.2018
Documents cited:Search[Y]WO9961883  (INVENTIUM LLC [US]) [Y] 1-14 * page 18, line 3 - line 24; figure 2 * * page 21, line 6 - page 23, line 10 *;
 [Y]US2003217591  (KWON DONGIL [KR], et al) [Y] 1-14 * paragraph [0112] - paragraph [0137]; figure 14 *;
 [Y]  - YUN-HEE LEE ET AL, "Residual stresses in DLC/Si and Au/Si systems: Application of a stress-relaxation model to the nanoindentation technique", JOURNAL OF MATERIALS RESEARCH, (20020401), vol. 17, no. 04, doi:10.1557/JMR.2002.0131, ISSN 0884-2914, pages 901 - 906, XP055085439 [Y] 1-14 * the whole document *

DOI:   http://dx.doi.org/10.1557/JMR.2002.0131
 [A]  - BHARAT BHUSHAN ET AL, "Nanomechanical characterisation of solid surfaces and thin films", INTERNATIONAL MATERIALS REVIEWS, (20030601), vol. 48, no. 3, doi:10.1179/095066003225010227, ISSN 0950-6608, pages 125 - 164, XP055085459 [A] 1-14 * the whole document *

DOI:   http://dx.doi.org/10.1179/095066003225010227
 [A]  - YEOL CHOI ET AL, "Analysis of sharp-tip-indentation load-depth curve for contact area determination taking into account pile-up and sink-in effects", JOURNAL OF MATERIALS RESEARCH, (20041101), vol. 19, no. 11, doi:10.1557/JMR.2004.0419, ISSN 0884-2914, pages 3307 - 3315, XP055085449 [A] 1-14 * the whole document *

DOI:   http://dx.doi.org/10.1557/JMR.2004.0419
International search[A]US6311135  (SURESH SUBRA [US], et al);
 [A]US6568250  (SINHA ARVIND K [US]);
 [A]US5463896  (ABBATE AGOSTINO [US], et al);
 [A]JPH0579928  (HITACHI LTD)
Examination   - JANG J-I ET AL, "Assessing welding residual stress in A335 P12 steel welds before and after stress-relaxation annealing through instrumented indentation technique", SCRIPTA MATERIALIA, ELSEVIER, AMSTERDAM, NL, (20030317), vol. 48, no. 6, doi:10.1016/S1359-6462(02)00537-7, ISSN 1359-6462, pages 743 - 748, XP004404059

DOI:   http://dx.doi.org/10.1016/S1359-6462(02)00537-7
by applicantWO9961883
 US2003217591
 KR100416723B
    - YEOL CHOI et al., "Analysis of sharp-tip-indentation load-depth curve for contact area determination taking into account pile-up and sink-in effects", Journal of Materials Research, (20041101), vol. 19, no. 11, doi:doi:10.1557/JMR.2004.0419, ISBN 0884-2914, pages 3307 - 3315, XP055085449

DOI:   http://dx.doi.org/10.1557/JMR.2004.0419
    - "Assessing welding residual stress in A335 P12 steel welds before and after stress-relaxation annealing through instrumented indentation technique", JANG J-I et al., Scripta Materi-alia, Elsevier, (20030317), vol. 48, pages 743 - 748
    - YUN-HEE LEE et al., "Residual stresses in DLC/Si and Au/Si systems: Application of a stress-relaxation model to the nanoindentation technique", Journal of Materials Research, (20020401), vol. 17, no. 04, doi:doi:10.1557/JMR.2002.0131, ISBN 0884-2914, pages 901 - 906, XP055085439

DOI:   http://dx.doi.org/10.1557/JMR.2002.0131
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