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EP1810299
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EP About this file: EP1810299
| EP1810299 - INTEGRATED SUB-NANOMETER-SCALE ELECTRON BEAM SYSTEMS [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 01.05.2009 Database last updated on 02.11.2024 | Most recent event Tooltip | 01.05.2009 | Application deemed to be withdrawn | published on 03.06.2009 [2009/23] | Applicant(s) | For all designated states BIOMED SOLUTIONS, LLC. 150 Lucius Gordon Drive, Suite 215 West Henrietta, NY 14586 / US | [2007/30] | Inventor(s) | 01 /
SCHNEIKER, Conrad W. 2238 E. Hedrick Dr. 16 Tucson, AZ 85719-2426 / US | [2007/30] | Representative(s) | Geyer, Ulrich F. Wagner & Geyer Partnerschaft mbB Patent- und Rechtsanwälte Gewürzmühlstrasse 5 80538 München / DE | [N/P] |
| Former [2007/30] | Geyer, Ulrich F. WAGNER & GEYER, Patentanwälte, Gewürzmühlstrasse 5 80538 München / DE | Application number, filing date | 05825622.3 | 01.11.2005 | [2007/30] | WO2005US39501 | Priority number, date | US20040983566 | 08.11.2004 Original published format: US 983566 | [2007/30] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | WO2006052549 | Date: | 18.05.2006 | Language: | EN | [2006/20] | Type: | A2 Application without search report | No.: | EP1810299 | Date: | 25.07.2007 | Language: | EN | The application published by WIPO in one of the EPO official languages on 18.05.2006 takes the place of the publication of the European patent application. | [2007/30] | Search report(s) | International search report - published on: | US | 30.11.2006 | (Supplementary) European search report - dispatched on: | EP | 14.03.2008 | Classification | IPC: | G21K1/08, G21K5/04, H01J1/304, H01J3/02, H01J3/18 | [2008/15] | CPC: |
G21K1/08 (EP,US);
G21K5/04 (EP,US);
H01J1/304 (EP,US);
H01J3/021 (EP,US);
H01J37/065 (EP,US);
H01J37/073 (EP,US);
H01J37/12 (EP,US);
H01J9/025 (EP,US);
B33Y80/00 (EP,US);
H01J2201/30407 (EP,US);
H01J2237/062 (EP,US);
H01J2237/06341 (EP,US);
|
| Former IPC [2007/30] | G21K1/08 | Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR [2007/30] | Extension states | AL | Not yet paid | BA | Not yet paid | HR | Not yet paid | MK | Not yet paid | YU | Not yet paid | Title | German: | INTEGRIERTE ELEKTRONENSTRAHLSYSTEME MIT SUB-NANOMETER-SKALA | [2007/30] | English: | INTEGRATED SUB-NANOMETER-SCALE ELECTRON BEAM SYSTEMS | [2007/30] | French: | SYSTEMES A FAISCEAUX ELECTRONIQUES SUB-NANOMETRIQUES INTEGRES | [2007/30] | Entry into regional phase | 08.05.2007 | National basic fee paid | 08.05.2007 | Search fee paid | 08.05.2007 | Designation fee(s) paid | 08.05.2007 | Examination fee paid | Examination procedure | 08.05.2007 | Examination requested [2007/30] | 10.07.2008 | Despatch of a communication from the examining division (Time limit: M04) | 21.11.2008 | Application deemed to be withdrawn, date of legal effect [2009/23] | 08.01.2009 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2009/23] | Fees paid | Renewal fee | 28.11.2007 | Renewal fee patent year 03 | Penalty fee | Additional fee for renewal fee | 30.11.2008 | 04 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XY]EP1249855 (INTEGRATED CIRCUIT TESTING [DE]) [X] 1 * paragraphs [0081] - [0083]; figure 4a * [Y] 2; | [X]US2002024279 (SIMPSON MICHAEL L [US], et al) [X] 1,2,8,9 * paragraphs [0036] , [0037] , [0060]; figure 13 *; | [X]EP0290026 (CANON KK [JP]) [X] 1,2 * page 5, lines 30-54 * * page 6, lines 10-23 * * figure 10 *; | [Y]US5647785 (JONES GARY WAYNE [US], et al) [Y] 2 * column 13, lines 1-7 *; | [X]US6373175 (CADE NEIL ALEXANDER [GB], et al) [X] 1-5,8-10 * column 3, line 49 - column 6, line 18 * * figure 4 * | International search | [X]US6771012 (AHMED HAROON [GB], et al); | [AP]US2005084980 (KOO TAE-WOONG [US], et al) |