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Extract from the Register of European Patents

EP About this file: EP1684282

EP1684282 - Optical recording medium [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  27.02.2009
Database last updated on 02.09.2024
Most recent event   Tooltip27.02.2009Application deemed to be withdrawnpublished on 01.04.2009  [2009/14]
Applicant(s)For all designated states
TDK Corporation
13-1, Nihonbashi 1-chome Chuo-ku
Tokyo 103-8272 / JP
[2006/30]
Inventor(s)01 / Kobayashi, Tatsuhiro
TDK Corporation 1-13-1, Nihonbashi Chuo-ku
Tokyo 103-8272 / JP
02 / Kikukawa, Takashi
TDK Corporation 1-13-1, Nihonbashi Chuo-ku
Tokyo 103-8272 / JP
03 / Fukuzawa, Narutoshi
TDK Corporation 1-13-1, Nihonbashi Chuo-ku
Tokyo 103-8272 / JP
 [2006/30]
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstrasse 4
80802 München / DE
[N/P]
Former [2006/30]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Maximilianstrasse 58
80538 München / DE
Application number, filing date06001433.924.01.2006
[2006/30]
Priority number, dateJP2005001628325.01.2005         Original published format: JP 2005016283
[2006/30]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1684282
Date:26.07.2006
Language:EN
[2006/30]
Type: A3 Search report 
No.:EP1684282
Date:07.11.2007
[2007/45]
Search report(s)(Supplementary) European search report - dispatched on:EP09.10.2007
ClassificationIPC:G11B7/24
[2006/30]
CPC:
G11B7/00452 (EP,US); G11B7/241 (KR); G11B7/243 (EP,US);
G11B7/257 (KR); G11B2007/2432 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2006/30]
TitleGerman:Optisches Aufzeichnungsmedium[2006/30]
English:Optical recording medium[2006/30]
French:Support d'enregistrement optique[2006/30]
Examination procedure25.03.2008Amendment by applicant (claims and/or description)
25.03.2008Examination requested  [2008/19]
02.06.2008Despatch of a communication from the examining division (Time limit: M04)
14.10.2008Application deemed to be withdrawn, date of legal effect  [2009/14]
11.11.2008Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2009/14]
Fees paidRenewal fee
30.01.2008Renewal fee patent year 03
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Documents cited:Search[XY]  - CHUBING PENG, "Super-resolution near field readout in phase-change optical disk data storage", APPLIED OPTICS, (20010810), vol. 40, no. 23, pages 3022 - 3931, XP002451428 [X] 1-3,5,6 * tables 3,5 * [Y] 4
 [Y]  - JOOHO KIM, "Super Resolution by elliptical buble formation with PtOx and AgInSbTe layers", APPLIED PHYSICS LETTERS, (20030901), vol. 83, no. 9, pages 1701 - 1703, XP002451427 [Y] 4 * the whole document *

DOI:   http://dx.doi.org/10.1063/1.1605794
Examination   - KIKUKAWA T. ET AL, "Recording and Readout Mechanism of Super-Resolution Near Field Structure Disc with Silver-Oxide Layer", JAPANESE JOURNAL OF APPLIED PHYSICS, (200302), vol. 42, no. PART1,2B, pages 1038 - 1039, XP002303724

DOI:   http://dx.doi.org/10.1143/JJAP.42.1038
    - BING-MAU CHEN ET AL, "Rewritable and Initialization free AgOx type super-resolution optical recording medium", INTERNATIONAL SYMPOSIUM ON OPTICAL MEMORY AND OPTICAL DATA STORAGE, TOPICAL MEETING, PISCATAWAY NJ, USA, (200207), pages 174 - 176, XP010600164
    - KIKUKAWA T. ET AL, "Rigid bubble pit formation and huge signal to noise enhancement in super-resolution near field structure disk with platinum- oxide layer", APPLIED PHYSICS LETTERS, (20021216), vol. 81, no. 25, pages 4697 - 4699, XP002458620

DOI:   http://dx.doi.org/10.1063/1.1529078
by applicant   - CHUBING PENG, "Superresolution near-field readout in phase-change optical disk data storage", APPLIED OPTICS, OPTICAL SOCIETY OF AMERICA, WASHINGTON, DC, US, vol. 40, no. 23, pages 3022 - 3931
    - JOOHO KIM ET AL., "Super-resolution by elliptical bubble formation with PtOx and AgInSbTe layers", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS, MELVILLE, NY, vol. 83, no. 9, pages 1701 - 1703
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.