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Extract from the Register of European Patents

EP About this file: EP1708008

EP1708008 - Beam homogenizer and laser irradition apparatus [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  22.06.2012
Database last updated on 02.11.2024
Most recent event   Tooltip22.06.2012No opposition filed within time limitpublished on 25.07.2012  [2012/30]
Applicant(s)For all designated states
Semiconductor Energy Laboratory Co., Ltd.
398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / JP
[N/P]
Former [2006/40]For all designated states
SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
398 Hase
Atsugi-shi, Kanagawa-ken 243-0036 / JP
Inventor(s)01 / Moriwaka, Tomoaki
c/o Semiconductor Energy Lab., Co. Ltd. 398, Hase
Atsugi-shi Kanagawa-ken 243-0036 / JP
 [2006/40]
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstrasse 4
80802 München / DE
[N/P]
Former [2006/40]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Maximilianstrasse 58
80538 München / DE
Application number, filing date06006435.928.03.2006
[2006/40]
Priority number, dateJP2005010639201.04.2005         Original published format: JP 2005106392
[2006/40]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1708008
Date:04.10.2006
Language:EN
[2006/40]
Type: B1 Patent specification 
No.:EP1708008
Date:17.08.2011
Language:EN
[2011/33]
Search report(s)(Supplementary) European search report - dispatched on:EP17.08.2006
ClassificationIPC:G02B27/09, B23K26/067
[2006/40]
CPC:
G02B27/0966 (EP,US); B23K26/064 (EP,US); B23K26/0648 (EP,US);
B23K26/0665 (EP,US); B23K26/067 (EP,US); G02B27/0961 (EP,US)
Designated contracting statesDE,   FI,   FR,   GB,   NL [2007/24]
Former [2006/40]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Strahlhomogenisator und Laserbestrahlungsvorrichtung[2010/25]
English:Beam homogenizer and laser irradition apparatus[2006/40]
French:Homogénéisateur de faisceau et appareil d'irradiation laser[2006/40]
Former [2006/40]Strahlenhomogenisator und Laserbestrahlungsvorrichtung
Examination procedure26.03.2007Examination requested  [2007/19]
26.04.2007Despatch of a communication from the examining division (Time limit: M04)
04.09.2007Reply to a communication from the examining division
25.08.2008Despatch of a communication from the examining division (Time limit: M04)
18.12.2008Reply to a communication from the examining division
22.07.2010Communication of intention to grant the patent
11.11.2010Fee for grant paid
11.11.2010Fee for publishing/printing paid
16.12.2010Despatch of a communication from the examining division (Time limit: M02)
16.02.2011Reply to a communication from the examining division
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  26.04.2007
Opposition(s)21.05.2012No opposition filed within time limit [2012/30]
Fees paidRenewal fee
14.03.2008Renewal fee patent year 03
27.03.2009Renewal fee patent year 04
15.03.2010Renewal fee patent year 05
15.03.2011Renewal fee patent year 06
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipFI17.08.2011
NL17.08.2011
[2012/09]
Former [2012/08]NL17.08.2011
Documents cited:Search[A]JP2001023920  ;
 [XY]US4769750  (MATSUMOTO KOICHI [JP], et al) [X] 1-3 * column 5, lines 12-24; figure 4 * * column 1 * [Y] 4-6;
 [X]US4988188  (OHTA MASAKATSU [JP]) [X] 1-3 * column 4, line 16 - line 23; figure 2 *;
 [YA]EP1122020  (SEMICONDUCTOR ENERGY LAB [JP]) [Y] 4-6,34-37 * figures 1,2,10,11; example 11 * [A] 1-3,7-33;
 [XY]WO0161411  (SILICON VALLEY GROUP [US]) [X] 1-3,7-33 * page 11, line 17 - page 13, line 19; figures 2A,4A,4C * [Y] 4-6,34-37
 [A]  - PATENT ABSTRACTS OF JAPAN, (20010508), vol. 2000, no. 16, & JP2001023920 A 20010126 (SUMITOMO HEAVY IND LTD; NEC CORP) [A] 4-6,34-37 * abstract *
ExaminationDE10049557
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.