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EP1726941
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EP About this file: EP1726941
| EP1726941 - Method for inspecting the quality of probe beads [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 24.04.2009 Database last updated on 08.10.2024 | Most recent event Tooltip | 24.04.2009 | Application deemed to be withdrawn | published on 27.05.2009 [2009/22] | Applicant(s) | For all designated states HITACHI SOFTWARE ENGINEERING CO., LTD. 1-43, Suehiro-cho 1-chome Tsurumi-ku Yokohama-shi, Kanagawa 230-0045 / JP | [2006/48] | Inventor(s) | 01 /
Kogi, Osamu, c/o Hitachi Software Engineering Co. 4-12-7, Higashishinagawa, Shinagawa-ku Tokyo 140-0002 / JP | 02 /
Ban, Noriko, c/o Hitachi Software Engineering Co. 4-12-7, Higashishinagawa, Shinagawa-ku Tokyo 140-0002 / JP | [2006/48] | Representative(s) | Liesegang, Roland Boehmert & Boehmert Anwaltspartnerschaft mbB Pettenkoferstrasse 22 80336 München / DE | [N/P] |
| Former [2006/48] | Liesegang, Roland FORRESTER & BOEHMERT Pettenkoferstrasse 20-22 80336 München / DE | Application number, filing date | 06010072.4 | 16.05.2006 | [2006/48] | Priority number, date | JP20050152254 | 25.05.2005 Original published format: JP 2005152254 | [2006/48] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1726941 | Date: | 29.11.2006 | Language: | EN | [2006/48] | Type: | A3 Search report | No.: | EP1726941 | Date: | 04.06.2008 | [2008/23] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 07.05.2008 | Classification | IPC: | G01N21/64, G01N15/14 | [2006/48] | CPC: |
G01N15/1459 (EP,US);
G01N21/6428 (EP,US);
G01N2015/1486 (EP,US);
G01N2021/6417 (EP,US);
G01N2021/6439 (EP,US)
| Designated contracting states | DE, FR, GB [2009/07] |
| Former [2006/48] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR | Title | German: | Verfahren zur Qualitätskontrolle von Sonden-Beads | [2006/48] | English: | Method for inspecting the quality of probe beads | [2006/48] | French: | Procédé d'inspection de la qualité des perles de sonde | [2006/48] | Examination procedure | 16.05.2006 | Examination requested [2006/48] | 28.07.2008 | Despatch of a communication from the examining division (Time limit: M04) | 05.12.2008 | Loss of particular rights, legal effect: designated state(s) | 09.12.2008 | Application deemed to be withdrawn, date of legal effect [2009/22] | 13.01.2009 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2009/22] | 13.01.2009 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR | Fees paid | Renewal fee | 28.03.2008 | Renewal fee patent year 03 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US5093234 (SCHWARTZ ABRAHAM [US]) [A] 1 * abstract *; | [A]EP0735360 (BECTON DICKINSON CO [US]) [A] 1 * abstract *; | [A]WO9735189 (UNIV WASHINGTON [US]) [A] 1-11 * page 8, line 17 - page 9, line 18 *; | WO0061198 [ ] (HITACHI CHEMICAL CO LTD [JP], et al); | [DA]JP2000346842 (HITACHI LTD, et al) [DA] 1 * abstract *; | [A]EP1239286 (HITACHI LTD [JP]) [A] 1 * paragraphs [0074] , [0075] *; | [X]US6524793 (CHANDLER VAN S [US], et al) [X] 1-11 * column 5, line 36 - column 6, line 10 * |