blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Release notes
European Patent Register Assistant
European Patent Register Resource Book
European Patent Register – pocket guide
FAQ - European Patent Register
Federated Register (Flyer)
Global Dossier (Flyer)
Register events
Deep link coverage
Federated Register content
The Patent Information Tour
Fair use charter

Extract from the Register of European Patents

EP About this file: EP1746449

EP1746449 - Microscope lens system [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  08.10.2010
Database last updated on 03.10.2024
Most recent event   Tooltip19.10.2012Lapse of the patent in a contracting state
New state(s): TR		published on 21.11.2012  [2012/47]
Applicant(s)For all designated states
Carl Zeiss MicroImaging GmbH
Carl-Zeiss-Promenade 10
07745 Jena / DE
[2009/49]
Former [2007/04]For all designated states
Carl Zeiss Microlmaging GmbH
Carl-Zeiss-Promenade 10
07745 Jena / DE
Inventor(s)01 / Wolleschensky, Ralf Dipl.-Phys.
Botzstr. 1
07743 Jena / DE
02 / Dobschal, Hans-Jürgen
Am Kötschauer Weg 26 A
99510 Kleinromstedt / DE
03 / Brunner, Robert Dr.
Berghoffsweg 6d
07743 Jena / DE
 [2007/39]
Former [2007/04]01 / Wolleschensky, Ralf Dipl.-Phys.
An der Promenade 3
99510 Apolda OT Schöten / DE
02 / Dobschal, Hans-Jürgen
Am Kötschauer Weg 26 A
99510 Kleinromstedt / DE
03 / Brunner, Robert Dr.
Berghoffsweg 6d
07743 Jena / DE
Representative(s)Patentanwälte Geyer, Fehners & Partner mbB
Perhamerstrasse 31
80687 München / DE
[N/P]
Former [2007/04]Geyer, Fehners & Partner
Patentanwälte Perhamerstrasse 31
80687 München / DE
Application number, filing date06013007.723.06.2006
[2007/04]
Priority number, dateDE2005103444222.07.2005         Original published format: DE102005034442
[2007/04]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP1746449
Date:24.01.2007
Language:DE
[2007/04]
Type: B1 Patent specification 
No.:EP1746449
Date:02.12.2009
Language:DE
[2009/49]
Search report(s)(Supplementary) European search report - dispatched on:EP16.10.2006
ClassificationIPC:G02B21/02, G02B21/08, // G02B7/02
[2007/04]
CPC:
G02B21/33 (EP,US); G02B21/02 (EP,US); G02B21/082 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2007/04]
TitleGerman:Mikroskopobjektivsystem[2007/04]
English:Microscope lens system[2007/04]
French:Système d'objectif de microscope[2007/04]
Examination procedure23.07.2007Examination requested  [2007/36]
21.08.2007Despatch of a communication from the examining division (Time limit: M04)
21.08.2007Reply to a communication from the examining division
23.05.2008Despatch of a communication from the examining division (Time limit: M06)
13.01.2009Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
11.03.2009Reply to a communication from the examining division
31.07.2009Communication of intention to grant the patent
14.10.2009Fee for grant paid
14.10.2009Fee for publishing/printing paid
Opposition(s)03.09.2010No opposition filed within time limit [2010/45]
Request for further processing for:The application is deemed to be withdrawn due to failure to reply to the examination report
11.03.2009Request for further processing filed
11.03.2009Full payment received (date of receipt of payment)
Fees paidRenewal fee
12.06.2008Renewal fee patent year 03
16.06.2009Renewal fee patent year 04
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipCY02.12.2009
CZ02.12.2009
DK02.12.2009
EE02.12.2009
FI02.12.2009
IE02.12.2009
IT02.12.2009
LT02.12.2009
LV02.12.2009
NL02.12.2009
PL02.12.2009
RO02.12.2009
SE02.12.2009
SI02.12.2009
SK02.12.2009
TR02.12.2009
BG02.03.2010
GR03.03.2010
ES13.03.2010
IS02.04.2010
PT02.04.2010
HU03.06.2010
GB23.06.2010
LU23.06.2010
BE30.06.2010
CH30.06.2010
FR30.06.2010
LI30.06.2010
MC30.06.2010
[2012/47]
Former [2012/43]CY02.12.2009
CZ02.12.2009
DK02.12.2009
EE02.12.2009
FI02.12.2009
IE02.12.2009
IT02.12.2009
LT02.12.2009
LV02.12.2009
NL02.12.2009
PL02.12.2009
RO02.12.2009
SE02.12.2009
SI02.12.2009
SK02.12.2009
BG02.03.2010
GR03.03.2010
ES13.03.2010
IS02.04.2010
PT02.04.2010
HU03.06.2010
GB23.06.2010
LU23.06.2010
BE30.06.2010
CH30.06.2010
FR30.06.2010
LI30.06.2010
MC30.06.2010
Former [2012/42]CY02.12.2009
CZ02.12.2009
DK02.12.2009
EE02.12.2009
FI02.12.2009
IE02.12.2009
IT02.12.2009
LT02.12.2009
LV02.12.2009
NL02.12.2009
PL02.12.2009
RO02.12.2009
SE02.12.2009
SI02.12.2009
SK02.12.2009
BG02.03.2010
GR03.03.2010
ES13.03.2010
IS02.04.2010
PT02.04.2010
HU03.06.2010
GB23.06.2010
BE30.06.2010
CH30.06.2010
FR30.06.2010
LI30.06.2010
MC30.06.2010
Former [2011/32]CY02.12.2009
CZ02.12.2009
DK02.12.2009
EE02.12.2009
FI02.12.2009
IE02.12.2009
IT02.12.2009
LT02.12.2009
LV02.12.2009
NL02.12.2009
PL02.12.2009
RO02.12.2009
SE02.12.2009
SI02.12.2009
SK02.12.2009
BG02.03.2010
GR03.03.2010
ES13.03.2010
IS02.04.2010
PT02.04.2010
GB23.06.2010
BE30.06.2010
CH30.06.2010
FR30.06.2010
LI30.06.2010
MC30.06.2010
Former [2011/20]CY02.12.2009
CZ02.12.2009
DK02.12.2009
EE02.12.2009
FI02.12.2009
IE02.12.2009
IT02.12.2009
LT02.12.2009
LV02.12.2009
NL02.12.2009
PL02.12.2009
RO02.12.2009
SE02.12.2009
SI02.12.2009
SK02.12.2009
BG02.03.2010
GR03.03.2010
ES13.03.2010
IS02.04.2010
PT02.04.2010
CH30.06.2010
LI30.06.2010
MC30.06.2010
Former [2011/16]CY02.12.2009
CZ02.12.2009
DK02.12.2009
EE02.12.2009
FI02.12.2009
IE02.12.2009
IT02.12.2009
LT02.12.2009
LV02.12.2009
NL02.12.2009
PL02.12.2009
RO02.12.2009
SE02.12.2009
SI02.12.2009
SK02.12.2009
BG02.03.2010
GR03.03.2010
ES13.03.2010
IS02.04.2010
PT02.04.2010
MC30.06.2010
Former [2011/08]CY02.12.2009
CZ02.12.2009
DK02.12.2009
EE02.12.2009
FI02.12.2009
IE02.12.2009
LT02.12.2009
LV02.12.2009
NL02.12.2009
PL02.12.2009
RO02.12.2009
SE02.12.2009
SI02.12.2009
SK02.12.2009
BG02.03.2010
GR03.03.2010
ES13.03.2010
IS02.04.2010
PT02.04.2010
MC30.06.2010
Former [2011/02]CY02.12.2009
CZ02.12.2009
EE02.12.2009
FI02.12.2009
IE02.12.2009
LT02.12.2009
LV02.12.2009
NL02.12.2009
PL02.12.2009
RO02.12.2009
SE02.12.2009
SI02.12.2009
SK02.12.2009
BG02.03.2010
GR03.03.2010
ES13.03.2010
IS02.04.2010
PT02.04.2010
Former [2010/40]CY02.12.2009
CZ02.12.2009
EE02.12.2009
FI02.12.2009
IE02.12.2009
LT02.12.2009
LV02.12.2009
NL02.12.2009
PL02.12.2009
RO02.12.2009
SE02.12.2009
SI02.12.2009
SK02.12.2009
BG02.03.2010
ES13.03.2010
IS02.04.2010
PT02.04.2010
Former [2010/33]CY02.12.2009
FI02.12.2009
LT02.12.2009
LV02.12.2009
PL02.12.2009
SE02.12.2009
SI02.12.2009
ES13.03.2010
Former [2010/25]CY02.12.2009
FI02.12.2009
LT02.12.2009
LV02.12.2009
PL02.12.2009
SE02.12.2009
SI02.12.2009
Documents cited:Search[X]US6122046  (ALMOGY GILAD [IL]) [X] 1-6,9-11,14,15 * abstract * * column 5, line 60 - column 6, line 67 *;
 [X]US6226118  (KOYAMA KENICHI [JP]) [X] 1-6,9,10,14,15 * abstract * * column 8, lines 1-51 * * column 9, lines 11-13 *;
 [X]US2003044967  (HEFFELFINGER DAVID M [US], et al) [X] 1-6,9,10,14,15 * abstract * * paragraph [0003] * * paragraph [0011] * * paragraph [0057] * * paragraph [0074] *;
 [A]DE10303812  (LEICA MICROSYSTEMS [DE]) [A] 12* paragraph [0026] *;
 [A]US2004165257  (SHAFER DAVID R [US], et al) [A] 1,14,15 * abstract * * paragraph [0071] *
ExaminationUS5153873
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.