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Extract from the Register of European Patents

EP About this file: EP1767932

EP1767932 - Device and method for non-destructive testing of components [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  20.03.2015
Database last updated on 02.11.2024
Most recent event   Tooltip20.03.2015No opposition filed within time limitpublished on 22.04.2015  [2015/17]
Applicant(s)For all designated states
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
Hansastrasse 27c
80686 München / DE
[N/P]
Former [2009/51]For all designated states
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
Hansastrasse 27c
80686 München / DE
Former [2007/13]For all designated states
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
Hansastrasse 27c
80686 München / DE
Inventor(s)01 / Szielasko, Klaus, Dr.
Jahnstrasse 58a
66125 Saarbrücken / DE
 [2014/19]
Former [2007/13]01 / Szielasko, Klaus, Dipl.-Ing.
Jahnstrasse 58a
66125 Saarbrücken / DE
Representative(s)Pfenning, Meinig & Partner mbB
Patent- und Rechtsanwälte
An der Frauenkirche 20
01067 Dresden / DE
[N/P]
Former [2014/20]Pfenning, Meinig & Partner GbR
Patent- und Rechtsanwälte
An der Frauenkirche 20
01067 Dresden / DE
Former [2009/35]Pfenning, Meinig & Partner GbR
Patent- und Rechtsanwälte An der Frauenkirche 20
01067 Dresden / DE
Former [2007/13]Pfenning, Meinig & Partner GbR
Patent- und Rechtsanwälte Gostritzer Strasse 61-63
01217 Dresden / DE
Application number, filing date06017846.426.08.2006
[2007/13]
Priority number, dateDE2005104657423.09.2005         Original published format: DE102005046574
[2007/13]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP1767932
Date:28.03.2007
Language:DE
[2007/13]
Type: B1 Patent specification 
No.:EP1767932
Date:14.05.2014
Language:DE
[2014/20]
Search report(s)(Supplementary) European search report - dispatched on:EP10.01.2007
ClassificationIPC:G01N27/90
[2007/13]
CPC:
G01N27/9046 (EP)
Designated contracting statesFR,   GB [2014/15]
Former [2007/49]DE,  FR,  GB 
Former [2007/13]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Vorrichtung und Verfahren zur zerstörungsfreien Prüfung von Bauteilen[2007/13]
English:Device and method for non-destructive testing of components[2007/13]
French:Dispositif et procédé destinés à la vérification non destructive de composants[2007/13]
Examination procedure25.08.2007Examination requested  [2007/41]
29.09.2007Loss of particular rights, legal effect: designated state(s)
02.10.2007Despatch of a communication from the examining division (Time limit: M04)
07.11.2007Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR
22.01.2008Reply to a communication from the examining division
06.07.2011Despatch of a communication from the examining division (Time limit: M06)
20.12.2011Reply to a communication from the examining division
17.01.2012Despatch of a communication from the examining division (Time limit: M06)
29.06.2012Reply to a communication from the examining division
12.11.2013Cancellation of oral proceeding that was planned for 18.02.2014
29.11.2013Communication of intention to grant the patent
18.02.2014Date of oral proceedings (cancelled)
19.03.2014Fee for grant paid
19.03.2014Fee for publishing/printing paid
19.03.2014Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  02.10.2007
Opposition(s)17.02.2015No opposition filed within time limit [2015/17]
Fees paidRenewal fee
29.08.2008Renewal fee patent year 03
26.08.2009Renewal fee patent year 04
31.08.2010Renewal fee patent year 05
31.08.2011Renewal fee patent year 06
31.08.2012Renewal fee patent year 07
29.08.2013Renewal fee patent year 08
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]JP3358740B  ;
 [Y]JP3286958B  ;
 [A]US4207520  (FLORA JOHN H [US], et al) [A] 1-18* the whole document *;
 [Y]EP0100009  (FRAUNHOFER GES FORSCHUNG [DE]) [Y] 1-18 * page 5, line 32 - page 6, line 31; figure 2 *;
 [X]WO9101496  (SECR DEFENCE BRIT [GB]) [X] 1-18 * page 8, line 6 - page 12, line 14 *;
 JPH06102255  [ ] (TECHNO DENSHI KK, et al) [ ] * abstract *;
 JPH06102256  [ ] (TECHNO DENSHI KK, et al);
 [YD]EP0595117  (FRAUNHOFER GES FORSCHUNG [DE]) [YD] 1-18 * column 5, line 41 - column 6, line 45; figures 4,6 *;
 [Y]  - DATABASE WPI, 0, Derwent World Patents Index, vol. 2004, no. 12, Database accession no. 2004-111973, XP002412382 & JP3358740B B2 20021224 (NFP KK) [Y] 1-18 * abstract *
 [Y]  - DATABASE WPI, 0, Derwent World Patents Index, vol. 2004, no. 08, Database accession no. 2004-074439, XP002412383 & JP3286958B B2 20020527 (NFP KK) [Y] 1-18 * abstract *
 [Y]  - MILLER G ET AL, "A combined Q and heterodyne sensor incorporating real-time DSP for reinforcement imaging, corrosion detection and material characterisation", SENSORS AND ACTUATORS A, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, (20050630), vol. 121, no. 2, ISSN 0924-4247, pages 339 - 346, XP004913698 [Y] 1-18 * paragraph [03.1]; figure 1 *

DOI:   http://dx.doi.org/10.1016/j.sna.2005.02.023
 [Y]  - G. ANTONELLI, F. BINASCO, G. DANESE, D. DOTTI, "Virtually Zero Cross-Talk Dual-Frequency Eddy Current Analyzer Based on Personal Computer", IEEE TRANS. INSTRUM. MEASUR., (199406), vol. 43, no. 3, pages 463 - 468, XP002411058 [Y] 1-18 * figure 3 *

DOI:   http://dx.doi.org/10.1109/19.293468
ExaminationUS5619135
    - JOHNSON M ET AL, "Hall-Effect Measurements under Alternating-Current Excitation for the Reconstruction of Obliterated Serial Numbers in Magnetic Steels", FINAL REPORT IOWA STATE UNIVERSITY,, (20041001), XP007920068
    - OCTAVIAN POSTOLACHE ET AL, "Induction defectoscope based on uniform eddy current probe with GMRs", INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC), 2010 IEEE, IEEE, PISCATAWAY, NJ, USA, (20100503), ISBN 978-1-4244-2832-8, pages 1278 - 1283, XP031691711
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.