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Extract from the Register of European Patents

EP About this file: EP1780802

EP1780802 - X-ray radiation image detector based on amorphous selen [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.02.2013
Database last updated on 25.09.2024
Most recent event   Tooltip01.02.2013No opposition filed within time limitpublished on 06.03.2013  [2013/10]
Applicant(s)For all designated states
Fujifilm Corporation
2-26-30 Nishiazabu Minato-ku
Tokyo / JP
[2007/18]
Inventor(s)01 / Imai, Shinji
FUJIFILM Corporation
798, Miyanodai
Kaisei-machi
Ashigarakami-gun, Kanagawa-ken / JP
 [2012/13]
Former [2007/18]01 / Imai, Shinji
FUJIFILM Corporation 798, Miyanodai Kaisei-machi
Ashigarakami-gun, Kanagawa-ken / JP
Representative(s)Klunker . Schmitt-Nilson . Hirsch
Patentanwälte
Destouchesstrasse 68
80796 München / DE
[N/P]
Former [2012/13]Klunker . Schmitt-Nilson . Hirsch
Patentanwälte Destouchesstrasse 68
80796 München / DE
Former [2008/39]Klunker . Schmitt-Nilson . Hirsch
Destouchesstrasse 68
80796 München / DE
Former [2007/18]Klunker . Schmitt-Nilson . Hirsch
Winzererstrasse 106
80797 München / DE
Application number, filing date06022743.631.10.2006
[2007/18]
Priority number, dateJP2005031815501.11.2005         Original published format: JP 2005318155
JP2006022499522.08.2006         Original published format: JP 2006224995
[2007/18]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1780802
Date:02.05.2007
Language:EN
[2007/18]
Type: A3 Search report 
No.:EP1780802
Date:21.11.2007
[2007/47]
Type: B1 Patent specification 
No.:EP1780802
Date:28.03.2012
Language:EN
[2012/13]
Search report(s)(Supplementary) European search report - dispatched on:EP19.10.2007
ClassificationIPC:H01L31/08, H01L31/0376, H01L31/0272, H01L31/115, G01T1/26, G01T1/29
[2007/18]
CPC:
G01T1/244 (EP,US); G01T1/246 (EP,US); H01L27/14676 (EP,US);
H01L31/02725 (EP,US); H01L31/036 (EP,US)
Designated contracting statesDE,   FR,   NL [2008/31]
Former [2007/18]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Röntgenstrahlungsbilddetektor basierend auf Selen[2007/18]
English:X-ray radiation image detector based on amorphous selen[2007/18]
French:Détecteur d'images à rayons X à base de sélénium amorphe[2007/18]
Examination procedure20.05.2008Examination requested  [2008/27]
22.05.2008Loss of particular rights, legal effect: designated state(s)
09.06.2008Amendment by applicant (claims and/or description)
27.06.2008Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, PL, PT, RO, SE, SI, SK, TR
19.11.2010Communication of intention to grant the patent
18.03.2011Fee for grant paid
18.03.2011Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  19.11.2010
Opposition(s)03.01.2013No opposition filed within time limit [2013/10]
Fees paidRenewal fee
29.10.2008Renewal fee patent year 03
29.10.2009Renewal fee patent year 04
29.10.2010Renewal fee patent year 05
28.10.2011Renewal fee patent year 06
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Documents cited:Search[Y]US5320927  (FENDER WILLIAM D [US], et al) [Y] 1,2,16,17 * column 4, lines 9-28 * * column 5, lines 9-24 *;
 [A]US6171643  (POLISCHUK BRADLEY TRENT [CA], et al) [A] 1-31 * column 4, lines 11-24 * * column 5, lines 22-31 * * column 7, lines 13-28 * * column 8, line 18 - column 10, line 51 * * figure 1 *;
 [XY]JP2002329848  (FUJI PHOTO FILM CO LTD) [X] 8,9,23,24 * paragraphs [0011] , [0014] - [0029] - [0074] - [0090]; figures 1,2 * [Y] 1,2,16,17;
 [A]US2004104362  (IMAI SHINJI [JP]) [A] 1-31 * figure 1 ** paragraphs [0010] - [0019] - [0039] *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.