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Extract from the Register of European Patents

EP About this file: EP1795938

EP1795938 - Method and device for examining samples [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  01.03.2013
Database last updated on 14.09.2024
Most recent event   Tooltip18.07.2014Lapse of the patent in a contracting state
New state(s): HU		published on 20.08.2014  [2014/34]
Applicant(s)For all designated states
Carl Zeiss MicroImaging GmbH
Carl-Zeiss-Promenade 10
07745 Jena / DE
[2007/24]
Inventor(s)01 / Wilhelm, Stefan
Loderstrasse 3
07743 Jena / DE
02 / Simbürger, Eva, Dr.
Kopernikusstrasse 33
14482 Potsdam / DE
03 / Kempe, Michael, Dr.
Am Mönchenberge 8
07751 Jena / DE
 [2012/14]
Former [2007/24]01 / Wilhelm, Stefan
Katharienstrasse 19
07743 Jena / DE
02 / Simbürger, Eva, Dr.
Kopernikusstrasse 33
14482 Potsdam / DE
03 / Kempe, Michael, Dr.
Am Mönchenberge 8
07751 Jena / DE
Representative(s)Käckell, Peter, et al
Geyer, Fehners & Partner (G.b.R.) Sellierstrasse 1
07745 Jena / DE
[2008/33]
Former [2007/24]Hampe, Holger
Carl Zeiss Jena GmbH, Zentralbereich Recht und Patente, Patentabteilung
07740 Jena / DE
Application number, filing date06023598.314.11.2006
[2007/24]
Priority number, dateDE2005105933808.12.2005         Original published format: DE102005059338
[2007/24]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report 
No.:EP1795938
Date:13.06.2007
Language:DE
[2007/24]
Type: A3 Search report 
No.:EP1795938
Date:22.08.2007
[2007/34]
Type: B1 Patent specification 
No.:EP1795938
Date:25.04.2012
Language:DE
[2012/17]
Search report(s)(Supplementary) European search report - dispatched on:EP25.07.2007
ClassificationIPC:G02B21/00, G02B21/16, G01N21/64, G02B27/10, G02B27/14
[2011/51]
CPC:
G01N21/6458 (EP,US); G02B21/0032 (EP,US); G02B21/0076 (EP,US);
G02B21/008 (EP,US); G02B21/16 (EP,US); Y10S359/90 (EP,US)
Former IPC [2007/34]G02B21/00, G01N21/64, G02B27/10, G02B27/14
Former IPC [2007/24]G02B21/00, G01N21/64
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2007/24]
TitleGerman:Verfahren und Anordnung zur Untersuchung von Proben[2007/24]
English:Method and device for examining samples[2007/24]
French:Procédé et agencement destinés à l'analyse d'échantillons[2007/24]
Examination procedure14.11.2006Examination requested  [2007/24]
06.03.2008Despatch of a communication from the examining division (Time limit: M06)
13.09.2008Reply to a communication from the examining division
02.09.2009Despatch of a communication from the examining division (Time limit: M06)
11.03.2010Reply to a communication from the examining division
02.07.2010Despatch of a communication from the examining division (Time limit: M04)
05.11.2010Reply to a communication from the examining division
03.03.2011Despatch of a communication from the examining division (Time limit: M06)
07.09.2011Reply to a communication from the examining division
07.12.2011Communication of intention to grant the patent
14.03.2012Fee for grant paid
14.03.2012Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  06.03.2008
Opposition(s)28.01.2013No opposition filed within time limit [2013/14]
Fees paidRenewal fee
07.02.2009Renewal fee patent year 03
24.11.2009Renewal fee patent year 04
23.11.2010Renewal fee patent year 05
23.11.2011Renewal fee patent year 06
Penalty fee
Additional fee for renewal fee
30.11.200803   M06   Fee paid on   07.02.2009
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU14.11.2006
CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
IT25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
TR25.04.2012
BG25.07.2012
GR26.07.2012
ES05.08.2012
IS25.08.2012
PT27.08.2012
IE14.11.2012
LU14.11.2012
AT30.11.2012
BE30.11.2012
CH30.11.2012
LI30.11.2012
MC30.11.2012
[2014/34]
Former [2014/27]CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
IT25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
TR25.04.2012
BG25.07.2012
GR26.07.2012
ES05.08.2012
IS25.08.2012
PT27.08.2012
IE14.11.2012
LU14.11.2012
AT30.11.2012
BE30.11.2012
CH30.11.2012
LI30.11.2012
MC30.11.2012
Former [2014/21]CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
IT25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
TR25.04.2012
BG25.07.2012
GR26.07.2012
ES05.08.2012
IS25.08.2012
PT27.08.2012
IE14.11.2012
AT30.11.2012
BE30.11.2012
CH30.11.2012
LI30.11.2012
MC30.11.2012
Former [2014/09]CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
IT25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
BG25.07.2012
GR26.07.2012
ES05.08.2012
IS25.08.2012
PT27.08.2012
IE14.11.2012
AT30.11.2012
BE30.11.2012
CH30.11.2012
LI30.11.2012
Former [2013/47]CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
IT25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
BG25.07.2012
GR26.07.2012
ES05.08.2012
IS25.08.2012
PT27.08.2012
IE14.11.2012
BE30.11.2012
CH30.11.2012
LI30.11.2012
Former [2013/38]CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
IT25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
BG25.07.2012
GR26.07.2012
ES05.08.2012
IS25.08.2012
PT27.08.2012
BE30.11.2012
CH30.11.2012
LI30.11.2012
Former [2013/34]CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
IT25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
BG25.07.2012
GR26.07.2012
ES05.08.2012
IS25.08.2012
PT27.08.2012
CH30.11.2012
LI30.11.2012
Former [2013/33]CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
IT25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
GR26.07.2012
ES05.08.2012
IS25.08.2012
PT27.08.2012
CH30.11.2012
LI30.11.2012
Former [2013/22]CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
IT25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
GR26.07.2012
ES05.08.2012
IS25.08.2012
PT27.08.2012
Former [2013/11]CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
IT25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
GR26.07.2012
IS25.08.2012
PT27.08.2012
Former [2013/10]CY25.04.2012
CZ25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
RO25.04.2012
SE25.04.2012
SI25.04.2012
SK25.04.2012
GR26.07.2012
IS25.08.2012
PT27.08.2012
Former [2013/09]CY25.04.2012
DK25.04.2012
EE25.04.2012
FI25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
SE25.04.2012
SI25.04.2012
GR26.07.2012
IS25.08.2012
PT27.08.2012
Former [2013/08]CY25.04.2012
DK25.04.2012
FI25.04.2012
LT25.04.2012
LV25.04.2012
NL25.04.2012
PL25.04.2012
SE25.04.2012
SI25.04.2012
GR26.07.2012
IS25.08.2012
PT27.08.2012
Former [2013/01]CY25.04.2012
FI25.04.2012
LT25.04.2012
LV25.04.2012
PL25.04.2012
SE25.04.2012
SI25.04.2012
GR26.07.2012
IS25.08.2012
PT27.08.2012
Former [2012/51]CY25.04.2012
FI25.04.2012
LT25.04.2012
LV25.04.2012
PL25.04.2012
SE25.04.2012
SI25.04.2012
GR26.07.2012
IS25.08.2012
Former [2012/50]CY25.04.2012
FI25.04.2012
LT25.04.2012
LV25.04.2012
PL25.04.2012
SE25.04.2012
GR26.07.2012
IS25.08.2012
Former [2012/49]CY25.04.2012
FI25.04.2012
LT25.04.2012
PL25.04.2012
SE25.04.2012
IS25.08.2012
Former [2012/48]FI25.04.2012
LT25.04.2012
SE25.04.2012
Former [2012/47]LT25.04.2012
Documents cited:Search[A]EP0148803  (SFENA [FR], et al) [A] 27-31 * abstract *;
 [A]US5105304  (TANAKA SATORU [JP], et al) [A] 27-31 * abstract *;
 [Y]EP0548830  (TEXAS INSTRUMENTS INC [US]) [Y] 34,35 * abstract *;
 [A]DE19829944  (ZEISS CARL JENA GMBH [DE]) [A] 1 * abstract *;
 [Y]DE19835070  (ZEISS CARL JENA GMBH [DE]) [Y] 34,35 * abstract *;
 [Y]DE19835072  (ZEISS CARL JENA GMBH [DE]) [Y] 34,35 * abstract *;
 [AY]WO0212863  (ZEISS CARL JENA GMBH [DE]) [A] 1 * figure - * * page 4, line 20 - page 6 * * page 8 - page 12 * [Y] 6,7,23-25;
 [Y]US6396053  (YOKOI EIJI [JP]) [Y] 34,35 * abstract *;
 [A]US2002109840  (WOLLESCHENSKY RALF [DE], et al) [A] 15-18 * figures 2-9 * * paragraph [0027] - paragraph [0029] * * paragraph [0049] - paragraph [0059] *;
 [XY]DE10137158  (LEICA MICROSYSTEMS [DE]) [X] 1 * the whole document * [Y] 34,35;
 [A]EP1308715  (ZEISS CARL JENA GMBH [DE]) [A] 15-18 * abstract * * paragraph [0012] - paragraph [0035] *;
 [Y]EP1396739  (ZEISS CARL JENA GMBH [DE]) [Y] 32,33* abstract *;
 [XY]US2004218174  (NATORI YASUAKI [JP]) [X] 1-5,8-13,19-24,26,27,31,34-42 * figure - * * paragraph [0028] - paragraph [0115] * [Y] 6,7,23-25,32,33;
 [XY]DE10339311  (LEICA MICROSYSTEMS [DE]) [X] 1-4,6,8-13,15-23,26 * abstract * * paragraph [0012] - paragraph [0015] * * paragraph [0030] * [Y] 32,33;
 [A]EP1591825  (ZEISS CARL JENA GMBH [DE]) [A] 27-31 * abstract *
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