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Extract from the Register of European Patents

EP About this file: EP1806559

EP1806559 - Surveying procedure and system for a high-rise structure [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  06.06.2008
Database last updated on 29.10.2024
Most recent event   Tooltip06.06.2008Application deemed to be withdrawnpublished on 09.07.2008  [2008/28]
Applicant(s)For all designated states
Leica Geosystems AG
Heinrich-Wild-Strasse
9435 Heerbrugg / CH
[2007/28]
Inventor(s)01 / VAN CRANENBROECK, Joel
Rue du Tienne de Mont, 11
BE-5530, Mont
Yvoir / BE
 [2007/28]
Representative(s)Harmann, Bernd-Günther
Kaminski Harmann
Patentanwälte AG
Landstrasse 124
9490 Vaduz / LI
[N/P]
Former [2007/28]Harmann, Bernd-Günther
Büchel, Kaminski & Partner Patentanwälte Est. Austrasse 79
9490 Vaduz / LI
Application number, filing date06100189.710.01.2006
[2007/28]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1806559
Date:11.07.2007
Language:EN
[2007/28]
Search report(s)(Supplementary) European search report - dispatched on:EP11.08.2006
ClassificationIPC:G01C15/00
[2007/28]
CPC:
G01C15/00 (EP,KR,US); G01C7/02 (KR); G09B25/06 (KR);
G09B29/003 (KR)
Designated contracting states(deleted) [2008/12]
Former [2007/28]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Vermessungsverfahren für eine hohe Baustruktur[2007/28]
English:Surveying procedure and system for a high-rise structure[2007/28]
French:Méthode et dispositif d'arpentage pour un immeuble-tour[2007/28]
Examination procedure12.01.2008Application deemed to be withdrawn, date of legal effect  [2008/28]
19.02.2008Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2008/28]
Fees paidRenewal fee
27.03.2008Renewal fee patent year 03
Penalty fee
Additional fee for renewal fee
31.01.200803   M06   Fee paid on   27.03.2008
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Documents cited:Search[A]US6434508  (LIN CHIH-HSIUNG [TW], et al) [A] 9* abstract *;
 [A]CA2482871  (LEICA GEOSYSTEMS AG [CH]) [A] 1,7 * figures 3,7,17 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.