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Extract from the Register of European Patents

EP About this file: EP1688778

EP1688778 - Optical scanning imaging system [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  04.04.2008
Database last updated on 20.09.2024
Most recent event   Tooltip04.04.2008No opposition filed within time limitpublished on 07.05.2008  [2008/19]
Applicant(s)For all designated states
Samsung Electronics Co., Ltd.
416 Maetan-Dong
Yeongtong-Gu
Suwon-si, Gyeonggi-Do / KR
[N/P]
Former [2006/32]For all designated states
Samsung Electronics Co., Ltd.
416 Maetan-Dong Yeongtong-Gu
Suwon-si, Gyeonggi-Do / KR
Inventor(s)01 / Ju-hyun, Lee
214-1301 Family 2-danji Apt. Munjeong 2-dong
Songpa-gu Seoul / KR
02 / Yong-Kweun, Mun
403-1801 Geumhwa Mael Jugong Apt. Sanggal-dong
Giheung-gu Yongin-si Gyeonggi-do / KR
 [2006/32]
Representative(s)Greene, Simon Kenneth
Elkington and Fife LLP
Prospect House
8 Pembroke Road
Sevenoaks, Kent TN13 1XR / GB
[N/P]
Former [2006/32]Greene, Simon Kenneth
Elkington and Fife LLP, Prospect House, 8 Pembroke Road Sevenoaks
Kent TN13 1XR / GB
Application number, filing date06250602.703.02.2006
[2006/32]
Priority number, dateKR2005001141507.02.2005         Original published format: KR 2005011415
[2006/32]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1688778
Date:09.08.2006
Language:EN
[2006/32]
Type: B1 Patent specification 
No.:EP1688778
Date:30.05.2007
Language:EN
[2007/22]
Search report(s)(Supplementary) European search report - dispatched on:EP03.05.2006
ClassificationIPC:G02B26/12, G02F1/35, H04N9/31
[2006/32]
CPC:
H04N9/3129 (EP,US); G09B3/06 (KR); G02B26/105 (EP,US);
G02B26/125 (EP,US); G09B1/22 (KR)
Designated contracting statesDE,   FR,   GB [2007/16]
Former [2006/32]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Optisches Scan-Bildgebungssystem[2006/32]
English:Optical scanning imaging system[2006/32]
French:Système d'imagerie à balayage optique[2006/32]
Examination procedure15.02.2006Examination requested  [2006/32]
05.07.2006Amendment by applicant (claims and/or description)
29.11.2006Communication of intention to grant the patent
21.03.2007Fee for grant paid
21.03.2007Fee for publishing/printing paid
Opposition(s)03.03.2008No opposition filed within time limit [2008/19]
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Documents cited:Search[A]US5715021  (GIBEAU FRANK C [US], et al) [A] 1-11 * column 12, line 9 - line 39 * * column 13, line 22 - line 40 * * column 22, line 30 - line 63 * * figures 6a,7a,12 *;
 [A]US5892556  (DETER CHRISTHARD [DE]) [A] 1-11 * figure 4 * * column 8, line 26 - line 58 *;
 [A]  - REINTJES J ET AL, "Direct observation of the orientation Kerr effect in the self-focusing of picosecond pulses", PHYSICAL REVIEW LETTERS USA, (19720626), vol. 28, no. 26, ISSN 0031-9007, pages 1697 - 1700, XP002376386 [A] 1-11 * page 1697, column L, paragraph 2 - column R, paragraph 1 * * page 1698, column L, paragraph 2 * * figure 2a *

DOI:   http://dx.doi.org/10.1103/PhysRevLett.28.1697
 [A]  - VAMPOUILLE M ET AL, "Application of controlled self-focusing in CS2 to shortening picosecond laser pulses", OPTICAL AND QUANTUM ELECTRONICS UK, (198205), vol. 14, no. 3, ISSN 0306-8919, pages 253 - 261, XP001246753 [A] 1-11 * 1. Introduction *

DOI:   http://dx.doi.org/10.1007/BF00619605
 [A]  - MANSOOR SHEIK-BAHAE ET AL, "SENSITIVE MEASUREMENT OF OPTICAL NONLINEARITIES USING A SINGLE BEAM", IEEE JOURNAL OF QUANTUM ELECTRONICS, IEEE SERVICE CENTER, PISCATAWAY, NJ, US, (19900401), vol. 26, no. 4, ISSN 0018-9197, pages 760 - 769, XP000149716 [A] 1-11 * page 760 - page 761, column L * * page 764, paragraph L - page 765, column R, paragraph 2 *

DOI:   http://dx.doi.org/10.1109/3.53394
by applicantUS6636339
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.