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Extract from the Register of European Patents

EP About this file: EP1696273

EP1696273 - Method and apparatus for optimising illumination for full-chip layer [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  12.06.2009
Database last updated on 31.08.2024
Most recent event   Tooltip12.06.2009No opposition filed within time limitpublished on 15.07.2009  [2009/29]
Applicant(s)For all designated states
ASML MaskTools B.V.
De Run 6501
5504 DR Veldhoven / NL
[2006/35]
Inventor(s)01 / Socha, Robert
137 Monte Villa Court
Campbell CA 95008 / US
02 / Chen, Jang Fung
11752 Pine Brook Lane
Cupertino, CA 95014 / US
 [2006/35]
Representative(s)van den Hooven, Jan, et al
ASML Netherlands B.V.
Corporate Intellectual Property
P.O. Box 324
5500 AH Veldhoven / NL
[N/P]
Former [2009/14]Van den Hooven, Jan, et al
ASML Netherlands B.V. Corporate Intellectual Property P.O. Box 324
5500 AH Veldhoven / NL
Former [2006/35]Leeming, John Gerard
J.A. Kemp & Co., 14 South Square, Gray's Inn
London WC1R 5JJ / GB
Application number, filing date06250911.221.02.2006
[2006/35]
Priority number, dateUS20050654962P23.02.2005         Original published format: US 654962 P
[2006/35]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1696273
Date:30.08.2006
Language:EN
[2006/35]
Type: A3 Search report 
No.:EP1696273
Date:18.07.2007
[2007/29]
Type: B1 Patent specification 
No.:EP1696273
Date:06.08.2008
Language:EN
[2008/32]
Search report(s)(Supplementary) European search report - dispatched on:EP19.06.2007
ClassificationIPC:G03F7/20
[2006/35]
CPC:
G03F7/705 (EP,KR,US); G03F7/70125 (EP,KR,US); G03F1/36 (KR)
Designated contracting statesDE,   FR,   GB,   IT,   NL [2008/13]
Former [2006/35]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Methode und Apparat zur Optimierung der Beleuchtung einer Schicht eines vollständigen Chips[2006/35]
English:Method and apparatus for optimising illumination for full-chip layer[2006/35]
French:Méthode et appareil pour optimiser l'illumination d'une couche de puce en entier[2006/35]
Examination procedure24.10.2007Examination requested  [2007/49]
07.02.2008Communication of intention to grant the patent
17.06.2008Fee for grant paid
17.06.2008Fee for publishing/printing paid
Opposition(s)07.05.2009No opposition filed within time limit [2009/29]
Fees paidRenewal fee
14.02.2008Renewal fee patent year 03
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Documents cited:Search[A]JP2000243690  (NEC CORP) [A] 1-23 * abstract * * claim 1 *;
 [A]US2005015233  (GORDON RONALD L [US]) [A] 1-23 * abstract * * paragraphs [0010] , [0011] , [0014] * * claim 1 *;
 [A]EP1473596  (ASML NETHERLANDS BV [NL]) [A] 1-23 * abstract * * figures 13,14a,14b *
by applicantUS6046792
 US5969441
    - M. BORN; E. WOLF, PRINCIPLES OF OPTICS, PERGAMON PRESS, vol. 530
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.