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EP About this file: EP1744268

EP1744268 - RFID tag and manufacturing method thereof [Right-click to bookmark this link]
Status	The application is deemed to be withdrawn Status updated on 08.07.2011 Database last updated on 11.09.2024
Most recent event Tooltip	08.07.2011	Application deemed to be withdrawn	published on 10.08.2011 [2011/32]
Applicant(s)	For all designated states HITACHI, LTD. 6-6, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 / JP
	[N/P]
Former [2007/03]	For all designated states HITACHI, LTD. 6-6, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 / JP
Inventor(s)	01 / Inoue, Kosuke c/o Hitachi, Ltd. Intellectual Property Group 6-1, Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8820 / JP
	02 / Homma, Hiroshi c/o Hitachi, Ltd. Intellectual Property Group 6-1, Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8820 / JP
	03 / Odashima, Hitoshi c/o Hitachi, Ltd. Intellectual Property Group 6-1, Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8820 / JP
	04 / Kanda, Naoya c/o Hitachi, Ltd. Intellectual Property Group 6-1, Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8820 / JP
	05 / Ueda, Kie c/o Hitachi, Ltd. Intellectual Property Group 6-1, Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8820 / JP
	[2010/16]
Former [2007/19]	01 / Inoue, Kosue Hitachi, Ltd., Intell. Property Group 6-1, Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8820 / JP
	02 / Homma, Hiroshi Hitachi, Ltd., Intell. Prop. Group 6-1, Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8820 / JP
	03 / Odashima, Hitoshi Hitachi, Ltd., Intell. Prop. Group 6-1, Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8820 / JP
	04 / Kanda, Naoya Hitachi, Ltd., Intell. Prop. Group 6-1, Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8820 / JP
	05 / Ueda, Kie Hitachi, Ltd., Intell. Property Group 6-1, Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8820 / JP
Former [2007/03]	01 / Inoue, Kosue Hitachi, Ltd. Intellectual Property Group 1-6-1, Marunouchi Chiyoda-ku, Tokyo 100-8820 / JP
	02 / Homma, Hiroshi Hitachi, Ltd. Intellectual Property Group 1-6-1, Marunouchi Chiyoda-ku, Tokyo 100-8820 / JP
	03 / Odashima, Hitoshi Hitachi, Ltd. Intellectual Property Group 1-6-1, Marunouchi Chiyoda-ku, Tokyo 100-8820 / JP
	04 / Kanda, Naoya Hitachi, Ltd. Intellectual Property Group 1-6-1, Marunouchi Chiyoda-ku, Tokyo 100-8820 / JP
	05 / Ueda, Kie Hitachi, Ltd. Intellectual Property Group 1-6-1, Marunouchi Chiyoda-ku, Tokyo 100-8820 / JP
Representative(s)	Calderbank, Thomas Roger, et al Mewburn Ellis LLP City Tower 40 Basinghall Street London EC2V 5DE / GB
	[N/P]
Former [2009/36]	Calderbank, Thomas Roger, et al Mewburn Ellis LLP 33 Gutter Lane London EC2V 8AS / GB
Former [2007/03]	Calderbank, Thomas Roger, et al MEWBURN ELLIS York House 23 Kingsway London WC2B 6HP / GB
Application number, filing date	06253435.9	30.06.2006
	[2007/03]
Priority number, date	JP20050194496	04.07.2005 Original published format: JP 2005194496
	[2007/03]
Filing language	EN
Procedural language	EN
Publication	Type:	A2 Application without search report
	No.:	EP1744268
	Date:	17.01.2007
	Language:	EN
	[2007/03]
	Type:	A3 Search report
	No.:	EP1744268
	Date:	03.06.2009
	[2009/23]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	08.05.2009
Classification	IPC:	G06K19/077	[2007/03]
	CPC:	G06K19/0775 (EP,US); G06K19/077 (KR); G06K19/07 (KR); G06K19/07749 (EP,US); H01L24/75 (EP,US); H01L2224/16225 (EP,US); (+) H01L2224/16238 (EP,US); H01L2224/32225 (EP,US); H01L2224/73204 (EP,US); H01L2224/75 (EP,US); H01L2224/75252 (EP,US); H01L2224/7565 (EP,US); H01L2224/81191 (EP,US); H01L2924/01078 (EP,US); H01L2924/01079 (EP,US); H01L2924/12042 (EP,US); H01L2924/14 (EP,US); H01L2924/181 (EP,US) (-)
	C-Set:	H01L2224/73204, H01L2224/16225, H01L2224/32225, H01L2924/00 (EP,US); H01L2924/12042, H01L2924/00 (US,EP); H01L2924/14, H01L2924/00 (US,EP); H01L2924/181, H01L2924/00012 (US,EP)
Designated contracting states	DE, FR, GB [2010/06]
Former [2007/03]	AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LI, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR
Title	German:	RFID-Etikett und Herstellungsverfahren dafür	[2007/03]
	English:	RFID tag and manufacturing method thereof	[2007/03]
	French:	Etiquette RFID et procédé de fabrication correspondant	[2007/03]
Examination procedure	17.07.2006	Examination requested [2007/03]
	18.06.2009	Amendment by applicant (claims and/or description)
	02.11.2009	Despatch of a communication from the examining division (Time limit: M06)
	04.12.2009	Loss of particular rights, legal effect: designated state(s)
	12.01.2010	Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR
	06.05.2010	Reply to a communication from the examining division
	04.10.2010	Despatch of a communication from the examining division (Time limit: M04)
	15.02.2011	Application deemed to be withdrawn, date of legal effect [2011/32]
	23.03.2011	Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2011/32]
Divisional application(s)	The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 02.11.2009
Fees paid	Renewal fee
	23.06.2008	Renewal fee patent year 03
	22.06.2009	Renewal fee patent year 04
	21.06.2010	Renewal fee patent year 05
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[A]EP1014302 (DAINIPPON PRINTING CO LTD [JP]) [A] 1-13 * paragraph [0024] - paragraph [0033] * * paragraphs [0047] , [0048] *;
		[A]US6357106 (OKU MITSUMASA [JP], et al) [A] 1-13* column 5, line 9 - column 7, line 38 *;
		[A]US2004159709 (OHTA EIJI [JP], et al) [A] 1-13 * paragraph [0044] - paragraph [0047] *
	Examination	US2001050138
		WO2004038793
		GB2407094
		EP1555691
	by applicant	US2001050138

The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.

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