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Extract from the Register of European Patents

EP About this file: EP1777535

EP1777535 - System and method for glitch detection in a secure microcontroller [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  20.03.2009
Database last updated on 25.09.2024
Most recent event   Tooltip20.03.2009Application deemed to be withdrawnpublished on 22.04.2009  [2009/17]
Applicant(s)For all designated states
STMicroelectronics, Inc.
1310 Electronic Drive Carrollton
Texas 75006 / US
For all designated states
STMICROELECTRONICS SA
29, Boulevard Romain Rolland
92120 Montrouge / FR
[N/P]
Former [2007/25]For all designated states
STMicroelectronics, Inc.
1310 Electronics Drive Carrollton
Texas 75006 / US
For all designated states
STMICROELECTRONICS SA
29, Boulevard Romain Rolland
92120 Montrouge / FR
Former [2007/17]For all designated states
STMicroelectronics, Inc.
1310 Electronics Drive Carrollton
Texas 75006 / US
Inventor(s)01 / Fruhauf, Serge F.
20871 Tula Court
Cupertino Santa Clara County, CA 95014 / US
02 / Pomet, Alain C.
Les Bannettes
13790 Rousset / FR
 [2007/17]
Representative(s)Style, Kelda Camilla Karen, et al
Page White & Farrer Limited
Bedford House
21A John Street
London WC1N 2BF / GB
[N/P]
Former [2007/17]Style, Kelda Camilla Karen, et al
Page White & Farrer Bedford House John Street
London, WC1N 2BF / GB
Application number, filing date06255109.803.10.2006
[2007/17]
Priority number, dateUS2005024332804.10.2005         Original published format: US 243328
[2007/17]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1777535
Date:25.04.2007
Language:EN
[2007/17]
Type: A3 Search report 
No.:EP1777535
Date:31.10.2007
[2007/44]
Search report(s)(Supplementary) European search report - dispatched on:EP04.10.2007
ClassificationIPC:G01R31/317, G06K19/073
[2007/17]
CPC:
G01R31/31719 (EP,US); G06K19/07309 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT [2008/28]
Former [2007/17]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Vorrichtung und Verfahren zur Störsignaldetektion in einem geschützten Mikroprozessor[2007/17]
English:System and method for glitch detection in a secure microcontroller[2007/17]
French:Système et procédé de détection de signal parasite dans un microcontrolleur sécurisé[2007/17]
Examination procedure14.03.2008Examination requested  [2008/17]
14.04.2008Despatch of a communication from the examining division (Time limit: M06)
01.05.2008Loss of particular rights, legal effect: designated state(s)
04.06.2008Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR
25.10.2008Application deemed to be withdrawn, date of legal effect  [2009/17]
02.12.2008Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2009/17]
Fees paidPenalty fee
Additional fee for renewal fee
31.10.200803   M06   Not yet paid
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Documents cited:Search[A]US5732249  (MASUDA SHINICHI [JP], et al) [A] 1-15 * column A; figures 1-36; claims 1-25 * * column 1, lines 6,7 * * column 2, line 40 - column 12, line 8 *;
 [A]JP2002100980  (RICOH KK) [A] 1-15 * column A; figure 1 *;
 [A]US2002060595  (NAKANO TOSHIHIKO [JP]) [A] 1-15 * column A; figures 1-10; claims 1-14 ** paragraphs [0002] , [0015] - [0018] *;
 [X]US2003214772  (HUGUES JEAN-FRANCOIS [FR], et al) [X] 1-15 * column A; figures 1-5; claims 1-12 * * paragraphs [0002] , [0012] , [0013] * * paragraphs [0017] - [0050] * * paragraphs [0055] - [0069] *;
 [A]US2004044922  (WU CHUNG-HSIAO R [US]) [A] 1-15 * column A; figures 1-13; claims 1-30 * * paragraphs [0008] , [0067] - [0073] *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.