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Extract from the Register of European Patents

EP About this file: EP1973152

EP1973152 - SUBSTRATE CLEANING APPARATUS, METHOD OF SUBSTRATE CLEANING, SUBSTRATE TREATING SYSTEM AND RECORDING MEDIUM [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  11.01.2013
Database last updated on 11.09.2024
Most recent event   Tooltip11.01.2013Application deemed to be withdrawnpublished on 13.02.2013  [2013/07]
Applicant(s)For all designated states
TOKYO ELECTRON LIMITED
3-6 Akasaka 5-chome Minato-ku
Tokyo 107-8481 / JP
[2008/39]
Inventor(s)01 / MATSUMOTO, Kazuhisa
c/o Tokyo Electron Kyushu Limited 1-1, Fukuhara
Koshi-shi Kumamoto 861-1116 / JP
 [2008/39]
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastrasse 30
81925 München / DE
[N/P]
Former [2008/39]HOFFMANN EITLE
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München / DE
Application number, filing date06832964.820.11.2006
[2008/39]
WO2006JP323114
Priority number, dateJP2006000223410.01.2006         Original published format: JP 2006002234
[2008/39]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2007080707
Date:19.07.2007
Language:JA
[2007/29]
Type: A1 Application with search report 
No.:EP1973152
Date:24.09.2008
Language:EN
[2008/39]
Search report(s)International search report - published on:JP19.07.2007
(Supplementary) European search report - dispatched on:EP26.08.2010
ClassificationIPC:H01L21/304, H01L21/00
[2010/39]
CPC:
H01L21/67051 (EP,US); H01L21/304 (KR); H01L21/02087 (EP,US);
H01L21/67046 (EP,US); H01L21/6708 (EP,US)
Former IPC [2008/39]H01L21/304
Designated contracting statesAT,   DE [2009/09]
Former [2008/39]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:SUBSTRATREINIGUNGSVORRICHTUNG, SUBSTRATREINIGUNGSVERFAHREN, SUBSTRATBEHANDLUNGSSYSTEM UND AUFZEICHNUNGSMEDIUM[2008/39]
English:SUBSTRATE CLEANING APPARATUS, METHOD OF SUBSTRATE CLEANING, SUBSTRATE TREATING SYSTEM AND RECORDING MEDIUM[2008/39]
French:APPAREIL ET PROCEDE DE NETTOYAGE DE SUBSTRAT, SYSTEME DE TRAITEMENT DE SUBSTRAT ET SUPPORT D ENREGISTREMENT[2008/39]
Entry into regional phase19.12.2007Translation filed 
19.12.2007National basic fee paid 
19.12.2007Search fee paid 
19.12.2007Designation fee(s) paid 
19.12.2007Examination fee paid 
Examination procedure19.12.2007Examination requested  [2008/39]
12.08.2008Loss of particular rights, legal effect: designated state(s)
18.09.2008Despatch of communication of loss of particular rights: designated state(s) BE, BG, CH, CY, CZ, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR
10.03.2011Amendment by applicant (claims and/or description)
11.04.2012Despatch of a communication from the examining division (Time limit: M04)
22.08.2012Application deemed to be withdrawn, date of legal effect  [2013/07]
27.09.2012Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2013/07]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  11.04.2012
Fees paidRenewal fee
26.11.2008Renewal fee patent year 03
27.11.2009Renewal fee patent year 04
23.11.2010Renewal fee patent year 05
23.11.2011Renewal fee patent year 06
Penalty fee
Additional fee for renewal fee
30.11.201207   M06   Not yet paid
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Documents cited:Search[Y]US5705223  (BUNKOFSKE RAYMOND JAMES [US]) [Y] 1-14 * column 4, line 48 - column 6, line 31 *;
 [A]WO9940612  (SPEEDFAM CORP [US]) [A] 1,13 * abstract *;
 [A]US6015467  (NAGASAWA KOICHI [JP], et al) [A] 1,11,13 * abstract *;
 [A]US2001037858  (TANIYAMA HIROKI [JP], et al) [A] 1,11,14 * paragraph [0068]; figures 4,7 *;
 [Y]JP2003092278  (SHIBAURA MECHATRONICS CORP) [Y] 1-14 * abstract *;
 [A]JP2003309096  (HITACHI LTD, et al) [A] 1,11,13* abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.