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Extract from the Register of European Patents

EP About this file: EP1840979

EP1840979 - Process for forming a semiconductor layer [Right-click to bookmark this link]
Former [2007/40]Semiconductor layer, process for forming the same, and semiconductor light emitting device
[2011/29]
StatusNo opposition filed within time limit
Status updated on  05.10.2012
Database last updated on 13.11.2024
Most recent event   Tooltip05.10.2012No opposition filed within time limitpublished on 07.11.2012  [2012/45]
Applicant(s)For all designated states
Fujifilm Corporation
2-26-30 Nishiazabu Minato-ku
Tokyo / JP
[2007/40]
Inventor(s)01 / Asano, Hideki
Fujifilm Corp.
577, Ushijima
Kaisei-machi
Ashigarakami-gun Kanagawa-ken / JP
 [2011/48]
Former [2007/40]01 / Asano, Hideki
Fujifilm Corp. 577, Ushijima Kaisei-machi
Ashigarakami-gun Kanagawa-ken / JP
Representative(s)Klunker . Schmitt-Nilson . Hirsch
Patentanwälte
Destouchesstrasse 68
80796 München / DE
[N/P]
Former [2011/48]Klunker . Schmitt-Nilson . Hirsch
Patentanwälte Destouchesstrasse 68
80796 München / DE
Former [2007/40]Klunker . Schmitt-Nilson . Hirsch
Destouchesstrasse 68
80796 München / DE
Application number, filing date07006263.327.03.2007
[2007/40]
Priority number, dateJP2006009687931.03.2006         Original published format: JP 2006096879
JP2007004223922.02.2007         Original published format: JP 2007042239
[2007/40]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1840979
Date:03.10.2007
Language:EN
[2007/40]
Type: A3 Search report 
No.:EP1840979
Date:20.10.2010
[2010/42]
Type: B1 Patent specification 
No.:EP1840979
Date:30.11.2011
Language:EN
[2011/48]
Search report(s)(Supplementary) European search report - dispatched on:EP17.09.2010
ClassificationIPC:H01L21/205, C30B25/10, C30B29/40, // H01L27/15, H01L33/32, H01S5/343
[2011/48]
CPC:
H01L27/153 (EP,US); C30B25/105 (EP,US); C30B29/403 (EP,US);
H01L21/02403 (EP,US); H01L21/02458 (EP,US); H01L21/02505 (EP,US);
H01L21/0254 (EP,US); H01L21/0262 (EP,US); H01L24/32 (EP,US);
H01L33/007 (EP,US); H01L2224/45144 (EP,US); H01L2224/48091 (EP,US);
H01L2224/48227 (EP,US); H01L2224/73265 (EP,US); H01L2924/12041 (EP,US);
H01L2924/12042 (EP,US); H01L33/06 (EP,US); H01L33/08 (EP,US) (-)
C-Set:
H01L2224/45144, H01L2924/00 (US,EP);
H01L2224/48091, H01L2924/00014 (EP,US);
H01L2924/12041, H01L2924/00 (US,EP);
H01L2924/12042, H01L2924/00 (US,EP)
Former IPC [2007/40]H01L33/00, H01S5/343, H01L27/15, H01L21/205, C30B25/02, C30B29/40
Designated contracting statesDE,   FR,   GB [2011/26]
Former [2007/40]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MT,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Verfahren zur Herstellung einer Halbleiterschicht[2011/29]
English:Process for forming a semiconductor layer[2011/29]
French:Procédé de formation d'une couche semi-conductrice[2011/29]
Former [2007/40]Halbleiterschicht, Verfahren zu deren Herstellung und lichtemittierendes Halbleiterbauelement
Former [2007/40]Semiconductor layer, process for forming the same, and semiconductor light emitting device
Former [2007/40]Couche semi-conductrice, procédé de formation correspondant et dispositif semi-conducteur électroluminescent
Examination procedure19.04.2011Amendment by applicant (claims and/or description)
19.04.2011Examination requested  [2011/22]
21.04.2011Loss of particular rights, legal effect: designated state(s)
27.05.2011Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, PL, PT, RO, SE, SI, SK, TR
07.07.2011Communication of intention to grant the patent
12.10.2011Fee for grant paid
12.10.2011Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  07.07.2011
Opposition(s)31.08.2012No opposition filed within time limit [2012/45]
Fees paidRenewal fee
27.03.2009Renewal fee patent year 03
30.03.2010Renewal fee patent year 04
30.03.2011Renewal fee patent year 05
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Documents cited:Search[XA]EP0496030  (PIONEER ELECTRONIC CORP [JP]) [X] 1-4,8 * column 1, lines 3-56 * * column 2, line 45 - column 4, line 34; figures 1,2 * [A] 9-14;
 [XY]JPH04213878  (NIPPON TELEGRAPH & TELEPHONE) [X] 1-4,8 * paragraphs [0007] , [0012] , [0016] - [0019]; figures 1,2,4-8 * [Y] 9-21;
 [A]WO9723912  (PHILIPS ELECTRONICS NV [NL], et al) [A] 20,21 * page 2, lines 33,34 * * page 3, line 29 - page 5, line 19; figure 1 ** page 8, line 10 - page 9, line 34; figures 5-7 *;
 [Y]US5959307  (NAKAMURA SHUJI [JP], et al) [Y] 9-13 * column 5, lines 20-24 * * column 6, lines 1-37; figures 2-5 *;
 [X]US6080599  (YAMAMOTO MASAHIRO [JP], et al) [X] 1-4,8 * column 9, lines 44-62; figures 15A,B *;
 [Y]US6163038  (CHEN CHIN-YUAN [TW], et al) [Y] 9-12,14-21 * column 4, line 11 - column 5, line 67; figures 6-9 *;
 [X]JP2005303250  (MATSUSHITA ELECTRIC IND CO LTD) [X] 1-4,8 * paragraphs [0127] - [0133]; figure 11; table 5 *;
 [XI]  - YOSHIDA S ET AL, "GaInNP MQW structure LED grown by laser-assisted MOCVD", PHYSICA STATUS SOLIDI C WILEY-VCH GERMANY, (2003), no. 7, ISSN 1610-1634, pages 2236 - 2239, XP002599103 [X] 5,6 * abstract * * page 2237, paragraph Experimental - paragraph Results; figures 1,2 * [I] 7

DOI:   http://dx.doi.org/10.1002/pssc.200303433
 [XI]  - ZHOU B ET AL, "Growth mechanisms in excimer laser photolytic deposition of gallium nitride at 500 DEG C", JOURNAL OF CRYSTAL GROWTH, ELSEVIER, AMSTERDAM, NL LNKD- DOI:10.1016/0022-0248(95)00602-8, (19960301), vol. 160, no. 3, ISSN 0022-0248, pages 201 - 206, XP004006400 [X] 5,6 * abstract * * page 201, column 2, line 1 - page 202, column 1, line 27 * [I] 7

DOI:   http://dx.doi.org/10.1016/0022-0248(95)00602-8
 [X]  - KANGAWA Y ET AL, "Study of pulse laser assisted metalorganic vapor phase epitaxy of InGaN with large indium mole fraction", JAPANESE JOURNAL OF APPLIED PHYSICS, PART 2 (LETTERS) JAPAN SOC. APPL. PHYS JAPAN, (20040801), vol. 43, no. 8A, ISSN 0021-4922, pages L1026 - L1028, XP002599104 [X] 5 * page L1026, column 2, lines 3-19; figure 1 *
by applicant   - YOSHIDA S. ET AL., "GatnNP MQW structure LED grown by laser-assisted MOCVD", PHYSICA STATUS SOLIDI C, (2003), vol. 0, no. 7, pages 2236 - 2239
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.