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Extract from the Register of European Patents

EP About this file: EP1912223

EP1912223 - Operating techniques for reducing the program and read disturbs of a non-volatile memory [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  26.08.2011
Database last updated on 03.10.2024
Most recent event   Tooltip04.10.2013Lapse of the patent in a contracting state
New state(s): HU		published on 06.11.2013  [2013/45]
Applicant(s)For all designated states
SanDisk Corporation
601 McCarthy Boulevard
Milpitas, CA 95035 / US
[2008/16]
Inventor(s)01 / Li, Yan
1775 Milmont Drive
Milpitas, CA 95035 / US
02 / Chen, Jian
5476 Castle Glen Avenue
San Jose, CA 95129 / US
 [2008/16]
Representative(s)Hitchcock, Esmond Antony, et al
Marks & Clerk LLP
90 Long Acre
London
WC2E 9RA / GB
[N/P]
Former [2008/16]Hitchcock, Esmond Antony, et al
Marks & Clerk 90 Long Acre
London WC2E 9RA / GB
Application number, filing date07011551.426.02.2003
[2008/16]
Priority number, dateUS2002008649527.02.2002         Original published format: US 86495
[2008/16]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1912223
Date:16.04.2008
Language:EN
[2008/16]
Type: B1 Patent specification 
No.:EP1912223
Date:20.10.2010
Language:EN
[2010/42]
Search report(s)(Supplementary) European search report - dispatched on:EP07.03.2008
ClassificationIPC:G11C16/34, G11C16/04
[2008/16]
CPC:
G11C16/3427 (EP,US); G06F12/00 (KR); G11C16/0483 (EP,US);
G11C16/12 (EP,US); G11C16/28 (EP,US); G11C16/3418 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   SI,   SK,   TR [2008/16]
TitleGerman:Verfahrenstechniken zur Reduzierung von Programm- und Lesestörungen eines nicht-flüchtigen Speichers[2008/16]
English:Operating techniques for reducing the program and read disturbs of a non-volatile memory[2008/16]
French:Techniques de fonctionnement pour réduire le programme et les perturbations de lecture d'une mémoire non volatile[2008/16]
Examination procedure13.06.2007Examination requested  [2008/16]
21.08.2007Loss of particular rights, legal effect: Claims
10.10.2007Despatch of communication of loss of particular rights: Claims {1}
06.11.2008Despatch of a communication from the examining division (Time limit: M06)
15.05.2009Reply to a communication from the examining division
10.05.2010Communication of intention to grant the patent
07.09.2010Fee for grant paid
07.09.2010Fee for publishing/printing paid
Parent application(s)   TooltipEP03251165.1  / EP1341185
Opposition(s)21.07.2011No opposition filed within time limit [2011/39]
Fees paidRenewal fee
13.06.2007Renewal fee patent year 03
13.06.2007Renewal fee patent year 04
13.06.2007Renewal fee patent year 05
25.02.2008Renewal fee patent year 06
13.02.2009Renewal fee patent year 07
16.02.2010Renewal fee patent year 08
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT20.10.2010
BE20.10.2010
CY20.10.2010
CZ20.10.2010
DK20.10.2010
EE20.10.2010
FI20.10.2010
HU20.10.2010
IT20.10.2010
SE20.10.2010
SI20.10.2010
SK20.10.2010
TR20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
IE26.02.2011
LU26.02.2011
CH28.02.2011
LI28.02.2011
MC28.02.2011
[2013/45]
Former [2013/44]AT20.10.2010
BE20.10.2010
CY20.10.2010
CZ20.10.2010
DK20.10.2010
EE20.10.2010
FI20.10.2010
IT20.10.2010
SE20.10.2010
SI20.10.2010
SK20.10.2010
TR20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
IE26.02.2011
LU26.02.2011
CH28.02.2011
LI28.02.2011
MC28.02.2011
Former [2013/26]AT20.10.2010
BE20.10.2010
CY20.10.2010
CZ20.10.2010
DK20.10.2010
EE20.10.2010
FI20.10.2010
IT20.10.2010
SE20.10.2010
SI20.10.2010
SK20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
IE26.02.2011
LU26.02.2011
CH28.02.2011
LI28.02.2011
MC28.02.2011
Former [2013/25]AT20.10.2010
BE20.10.2010
CZ20.10.2010
DK20.10.2010
EE20.10.2010
FI20.10.2010
IT20.10.2010
SE20.10.2010
SI20.10.2010
SK20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
IE26.02.2011
LU26.02.2011
CH28.02.2011
LI28.02.2011
MC28.02.2011
Former [2012/08]AT20.10.2010
BE20.10.2010
CZ20.10.2010
DK20.10.2010
EE20.10.2010
FI20.10.2010
IT20.10.2010
SE20.10.2010
SI20.10.2010
SK20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
IE26.02.2011
CH28.02.2011
LI28.02.2011
MC28.02.2011
Former [2012/03]AT20.10.2010
BE20.10.2010
CZ20.10.2010
DK20.10.2010
EE20.10.2010
FI20.10.2010
IT20.10.2010
SE20.10.2010
SI20.10.2010
SK20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
CH28.02.2011
LI28.02.2011
MC28.02.2011
Former [2011/48]AT20.10.2010
BE20.10.2010
CZ20.10.2010
DK20.10.2010
EE20.10.2010
FI20.10.2010
SE20.10.2010
SI20.10.2010
SK20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
CH28.02.2011
LI28.02.2011
MC28.02.2011
Former [2011/45]AT20.10.2010
BE20.10.2010
CZ20.10.2010
DK20.10.2010
EE20.10.2010
FI20.10.2010
SE20.10.2010
SI20.10.2010
SK20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
MC28.02.2011
Former [2011/38]AT20.10.2010
BE20.10.2010
CZ20.10.2010
DK20.10.2010
EE20.10.2010
FI20.10.2010
SE20.10.2010
SI20.10.2010
SK20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
Former [2011/35]AT20.10.2010
BE20.10.2010
CZ20.10.2010
EE20.10.2010
FI20.10.2010
SE20.10.2010
SI20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
Former [2011/33]AT20.10.2010
BE20.10.2010
FI20.10.2010
SE20.10.2010
SI20.10.2010
BG20.01.2011
GR21.01.2011
ES31.01.2011
PT21.02.2011
Former [2011/30]AT20.10.2010
BE20.10.2010
FI20.10.2010
SE20.10.2010
SI20.10.2010
BG20.01.2011
GR21.01.2011
PT21.02.2011
Documents cited:Search[X]US6072721  (ARASE KENSHIRO [JP]);
 [X]EP1137012  (MICROCHIP TECH INC [US]);
 [X]US2001038118  (SAKUI KOJI [JP], et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.