blank Quick help
blank Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...
blank News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...
blank Related links

Release notes
European Patent Register Assistant
European Patent Register Resource Book
European Patent Register – pocket guide
FAQ - European Patent Register
FAQ - Register Alert
Federated Register (Flyer)
Global Dossier (Flyer)
Register events
Deep link coverage
Federated Register content
The Patent Information Tour
Fair use charter

Extract from the Register of European Patents

EP About this file: EP2047313

EP2047313 - METHOD FOR LASER SCANNING MICROSCOPY AND BEAM COMBINER [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  31.08.2012
Database last updated on 14.09.2024
Most recent event   Tooltip31.08.2012Application deemed to be withdrawnpublished on 03.10.2012  [2012/40]
Applicant(s)For all designated states
Carl Zeiss Microscopy GmbH
Carl-Zeiss-Promenade 10
07745 Jena / DE
For all designated states
Cube Optics AG
Robert-Koch-Strasse 30
55129 Mainz / DE
[N/P]
Former [2012/38]For all designated states
Carl Zeiss Microscopy GmbH
Carl Zeiss Promenade 10
07745 Jena / DE
For all designated states
Cube Optics AG
Robert-Koch-Strasse 30
55129 Mainz / DE
Former [2009/16]For all designated states
Carl Zeiss MicroImaging GmbH
Carl-Zeiss-Promenade 10
07745 Jena / DE
For all designated states
Cube Optics AG
Robert-Koch-Strasse 30
55129 Mainz / DE
Inventor(s)01 / PACHOLIK, Jörg
Am Wiesenbach 18
07751 Kunitz / DE
02 / HUHSE, Dieter
Stindestrasse 27
12167 Berlin / DE
03 / PAATZSCH, Thomas
Stadionerhof Strasse 1
55116 Mainz / DE
 [2009/16]
Representative(s)Hampe, Holger
Carl Zeiss Jena GmbH
Zentralbereich Recht und Patente
Patentabteilung
Carl-Zeiss-Promenade 10
07745 Jena / DE
[N/P]
Former [2010/03]Hampe, Holger
Carl Zeiss Jena GmbH, Zentralbereich Recht und Patente, Patentabteilung Carl-Zeiss-Promenade 10
07745 Jena / DE
Former [2009/16]Hampe, Holger
C/o Carl Zeiss AG Standort Jena Carl-Zeiss-Promenade 10
07745 Jena / DE
Application number, filing date07786280.324.07.2007
[2009/16]
WO2007EP06549
Priority number, dateDE2006103490928.07.2006         Original published format: DE102006034909
[2009/16]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO2008012057
Date:31.01.2008
Language:DE
[2008/05]
Type: A1 Application with search report 
No.:EP2047313
Date:15.04.2009
Language:DE
The application published by WIPO in one of the EPO official languages on 31.01.2008 takes the place of the publication of the European patent application.
[2009/16]
Search report(s)International search report - published on:EP31.01.2008
ClassificationIPC:G02B21/00
[2009/16]
CPC:
G02B21/002 (EP,US); G01N21/6458 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MT,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2009/16]
TitleGerman:VERFAHREN ZUR LASER-SCANNING-MIKROSKOPIE UND STRAHLVEREINIGER[2009/16]
English:METHOD FOR LASER SCANNING MICROSCOPY AND BEAM COMBINER[2009/16]
French:PROCÉDÉ DE MICROSCOPIE À BALAYAGE LASER ET CONCENTRATEUR DE FAISCEAUX[2009/16]
Entry into regional phase30.01.2009National basic fee paid 
30.01.2009Designation fee(s) paid 
30.01.2009Examination fee paid 
Examination procedure30.01.2009Examination requested  [2009/16]
19.05.2009Despatch of a communication from the examining division (Time limit: M06)
25.11.2009Reply to a communication from the examining division
28.09.2011Despatch of a communication from the examining division (Time limit: M06)
11.04.2012Application deemed to be withdrawn, date of legal effect  [2012/40]
15.05.2012Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2012/40]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  19.05.2009
Fees paidRenewal fee
20.07.2009Renewal fee patent year 03
27.07.2010Renewal fee patent year 04
25.07.2011Renewal fee patent year 05
23.07.2012Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[X]US2005249457  (SEYFRIED VOLKER [DE], et al) [X] 1-5 * abstract * * paragraphs [0005] - [0007] - [0016] - [0020] - [0034] - [0043] * * claim 6 * * figures 1-4 *;
 [X]US2002131049  (SCHMITT JOSEPH M [US]) [X] 1-5 * abstract * * paragraphs [0020] - [0025] - [0029] , [0030] * * figures 1,2,5 *;
 [X]DE102004030669  (LEICA MICROSYSTEMS [DE]) [X] 1-5 * the whole document *
ExaminationDE19633185
 US2001028031
 US2006017001
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.