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Extract from the Register of European Patents

EP About this file: EP2082219

EP2082219 - USE OF A SUBSTRATE FOR THE DETECTION OF CHEMICAL DOPANTS [Right-click to bookmark this link]
Former [2009/31]USE OF A SUBSTRATE FOR THE DETECTION OF CHEMICAL WARFARE AGENTS
[2010/40]
StatusNo opposition filed within time limit
Status updated on  16.12.2011
Database last updated on 18.09.2024
Most recent event   Tooltip04.10.2013Lapse of the patent in a contracting state
New state(s): HU		published on 06.11.2013  [2013/45]
Applicant(s)For all designated states
EADS Deutschland GmbH
Willy-Messerschmitt-Strasse
85521 Ottobrunn / DE
[2011/06]
Former [2009/31]For all designated states
EADS Deutschland GmbH
Willy-Messerschmitt-Strasse
85521 Ottobrunn / DE
Inventor(s)01 / EICKHOFF, Martin
Kleinlindener Strasse 21
35398 Giessen-Allendorf / DE
02 / HELWIG, Andreas
Fraunhoferstr. 9 Rgb
80469 München / DE
03 / GARRIDO, José Antonio
Karlsbaderstr. 18 a
85435 Erding / DE
04 / MÜLLER, Gerhard
Sudetenstr. 126
85567 Grafing / DE
 [2009/31]
Representative(s)Meel, Thomas
Airbus Defence and Space GmbH
Patentabteilung
88039 Friedrichshafen / DE
[N/P]
Former [2009/31]Meel, Thomas
Patentassessor EADS Deutschland GmbH Patentabteilung, DSLA IP1
88039 Friedrichshafen / DE
Application number, filing date07856004.212.11.2007
[2009/31]
WO2007DE02040
Priority number, dateDE2006105389014.11.2006         Original published format: DE102006053890
[2009/31]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report
No.:WO2008058518
Date:22.05.2008
Language:DE
[2008/21]
Type: A2 Application without search report 
No.:EP2082219
Date:29.07.2009
Language:DE
The application published by WIPO in one of the EPO official languages on 22.05.2008 takes the place of the publication of the European patent application.
[2009/31]
Type: B1 Patent specification 
No.:EP2082219
Date:09.02.2011
Language:DE
[2011/06]
Search report(s)International search report - published on:EP10.07.2008
ClassificationIPC:G01N27/12, G01N33/22
[2009/31]
CPC:
G01N27/12 (EP,US); G01N33/0054 (EP,US); Y02A50/20 (EP,US);
Y10T29/49117 (EP,US); Y10T436/163333 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MT,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2009/31]
TitleGerman:VERWENDUNG EINES SUBSTRATS ZUR DETEKTION CHEMISCHER DOTIERSTOFFE[2010/40]
English:USE OF A SUBSTRATE FOR THE DETECTION OF CHEMICAL DOPANTS[2010/40]
French:UTILISATION D'UN SUBSTRAT POUR DÉTECTER DES AGENTS DOPANTS[2010/40]
Former [2009/31]VERWENDUNG EINES SUBSTRATS ZUR DETEKTION CHEMISCHER KAMPFSTOFFE
Former [2009/31]USE OF A SUBSTRATE FOR THE DETECTION OF CHEMICAL WARFARE AGENTS
Former [2009/31]DÉTECTEUR D'UN AGENT DE COMBAT CHIMIQUE POUR LA DÉTECTION D'AGENTS DE COMBAT CHIMIQUES, PROCÉDÉ DE PRODUCTION ET UTILISATION D'UN SUBSTRAT UTILISÉ EN TANT QUE DÉTECTEUR D'AGENT CHIMIQUE
Entry into regional phase06.05.2009National basic fee paid 
06.05.2009Designation fee(s) paid 
06.05.2009Examination fee paid 
Examination procedure08.05.2009Examination requested  [2009/31]
09.02.2010Despatch of a communication from the examining division (Time limit: M04)
08.06.2010Reply to a communication from the examining division
18.06.2010Despatch of a communication from the examining division (Time limit: M02)
06.08.2010Reply to a communication from the examining division
17.09.2010Communication of intention to grant the patent
26.11.2010Fee for grant paid
26.11.2010Fee for publishing/printing paid
Opposition(s)10.11.2011No opposition filed within time limit [2012/03]
Fees paidRenewal fee
24.11.2009Renewal fee patent year 03
23.11.2010Renewal fee patent year 04
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipCY09.02.2011
CZ09.02.2011
DK09.02.2011
EE09.02.2011
FI09.02.2011
HU09.02.2011
IE09.02.2011
IS09.02.2011
LT09.02.2011
LV09.02.2011
MT09.02.2011
NL09.02.2011
PL09.02.2011
RO09.02.2011
SE09.02.2011
SI09.02.2011
SK09.02.2011
TR09.02.2011
BG09.05.2011
GR10.05.2011
PT09.06.2011
[2013/45]
Former [2013/44]CY09.02.2011
CZ09.02.2011
DK09.02.2011
EE09.02.2011
FI09.02.2011
IE09.02.2011
IS09.02.2011
LT09.02.2011
LV09.02.2011
MT09.02.2011
NL09.02.2011
PL09.02.2011
RO09.02.2011
SE09.02.2011
SI09.02.2011
SK09.02.2011
TR09.02.2011
BG09.05.2011
GR10.05.2011
PT09.06.2011
Former [2013/33]CY09.02.2011
CZ09.02.2011
DK09.02.2011
EE09.02.2011
FI09.02.2011
IE09.02.2011
IS09.02.2011
LT09.02.2011
LV09.02.2011
MT09.02.2011
NL09.02.2011
PL09.02.2011
RO09.02.2011
SE09.02.2011
SI09.02.2011
SK09.02.2011
BG09.05.2011
GR10.05.2011
PT09.06.2011
Former [2013/14]CY09.02.2011
CZ09.02.2011
DK09.02.2011
EE09.02.2011
FI09.02.2011
IE09.02.2011
LT09.02.2011
LV09.02.2011
MT09.02.2011
NL09.02.2011
PL09.02.2011
RO09.02.2011
SE09.02.2011
SI09.02.2011
SK09.02.2011
BG09.05.2011
GR10.05.2011
PT09.06.2011
Former [2011/49]CY09.02.2011
CZ09.02.2011
DK09.02.2011
EE09.02.2011
FI09.02.2011
IE09.02.2011
LT09.02.2011
LV09.02.2011
NL09.02.2011
PL09.02.2011
RO09.02.2011
SE09.02.2011
SI09.02.2011
SK09.02.2011
BG09.05.2011
GR10.05.2011
PT09.06.2011
Former [2011/47]CY09.02.2011
DK09.02.2011
EE09.02.2011
FI09.02.2011
IE09.02.2011
LT09.02.2011
LV09.02.2011
NL09.02.2011
PL09.02.2011
SE09.02.2011
SI09.02.2011
BG09.05.2011
GR10.05.2011
PT09.06.2011
Former [2011/38]CY09.02.2011
FI09.02.2011
LT09.02.2011
LV09.02.2011
NL09.02.2011
PL09.02.2011
SE09.02.2011
SI09.02.2011
BG09.05.2011
GR10.05.2011
PT09.06.2011
Former [2011/37]CY09.02.2011
FI09.02.2011
LT09.02.2011
LV09.02.2011
PL09.02.2011
SE09.02.2011
SI09.02.2011
BG09.05.2011
GR10.05.2011
PT09.06.2011
Former [2011/36]LT09.02.2011
LV09.02.2011
PL09.02.2011
SE09.02.2011
GR10.05.2011
PT09.06.2011
Cited inInternational search[PXA]  - HELWIG A ET AL, "Gas sensing interactions at hydrogenated diamond surfaces", IEEE SENSORS JOURNAL, (200709), vol. 7, no. 9, ISSN 1530-437X, pages 1349 - 1353, XP011189507 [PX] 14-22 * the whole document * [A] 1-13

DOI:   http://dx.doi.org/10.1109/JSEN.2007.905019
 [XA]  - REZEK ET AL, "Intrinsic hydrogen-terminated diamond as ion-sensitive field effect transistor", SENSORS AND ACTUATORS B, (20060817), vol. 122, no. 2, ISSN 0925-4005, pages 596 - 599, XP005924563 [X] 14-22 * abstract * [A] 1-13

DOI:   http://dx.doi.org/10.1016/j.snb.2006.07.004
 [XA]  - GI R S ET AL, "POSSIBILITY OF REALIZING A GAS SENSOR USING SURFACE CONDUCTIVE LAYER ON DIAMOND FILMS", JAPANESE JOURNAL OF APPLIED PHYSICS, JAPAN SOCIETY OF APPLIED PHYSICS, TOKYO, JP, (199704), vol. 36, no. 4A, ISSN 0021-4922, pages 2057 - 2060, XP000732319 [X] 14-22 * abstract * [A] 1-13

DOI:   http://dx.doi.org/10.1143/JJAP.36.2057
 [DXA]  - TANIELIAN M ET AL, "Effect of adsorbates and insulating layers on the conductance of plasma deposited a-Si:H", JOURNAL OF NON-CRYSTALLINE SOLIDS, (198001), vol. 35-36, ISSN 0022-3093, pages 575 - 580, XP002477733 [DX] 14-22 * abstract * [A] 1-13

DOI:   http://dx.doi.org/10.1016/0022-3093(80)90656-0
by applicant   - M. TANIELIAN ET AL., "Effect of Adsorbates and Insulating Layers on the Conductance of Plasma Deposited a-Si:H*", JOURNAL OF NON-CRYSTALLINE SOLIDS, (1980), vol. 35, 36, pages 575 - 580
    - G. MüLLER ET AL., JOURNAL OF NON-CRYSTALLINE SOLIDS, (1983), vol. 59, 60, pages 469 - 472
    - R. SUNG GI, "Hall Effect Measurements of Surface Conductive Layer of undoped Diamond Films in N02 and NH3 Atmospheres", JPN. J. APPL. PHYS., (1999), vol. 38, pages 3492 - 3496
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.