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EP2120037
European procedure
Extract from the Register of European Patents
EP About this file: EP2120037
| EP2120037 - Measuring probe for a scanning microscope and method of operation thereof [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 01.12.2017 Database last updated on 12.07.2024 | |
| Former | The patent has been granted Status updated on 23.12.2016 | ||
| Former | Grant of patent is intended Status updated on 16.12.2016 | Most recent event Tooltip | 01.12.2017 | No opposition filed within time limit | published on 03.01.2018 [2018/01] | Applicant(s) | For all designated states Mitutoyo Corporation 20-1, Sakado 1-chome Takatsu-ku Kawasaki-shi, Kanagawa 213-8533 / JP | For all designated states Bundesrepublik Deutschland endvertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt 38116 Braunschweig / DE | [2017/04] |
| Former [2009/47] | For all designated states Mitutoyo Corporation 20-1, Sakado 1-chome, Takatsuku Kawasaki-shi Kanagawa 213-8533 / JP | ||
| For all designated states Bundesrepublik Deutschland endvertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt 38116 Braunschweig / DE | Inventor(s) | 01 /
Illers, Hartmut Am Platz 20 38729 Hahausen / DE | 02 /
Hidaka, Kazuhiko c/o Mitutoyo Research Center Europe B.V. De Rijn 18 5684 PJ Best / NL | 03 /
Saito, Akinori 430-1, Kamiyokoba Tsukuba-shi, Ibaraki-ken 305-0854 / JP | 04 /
Danzebrink, Dr. Hans-Ullrich Zur Siekwiese 17 38124 Braunschweig / DE | [2017/04] |
| Former [2011/18] | 01 /
Illers, Hartmut Am Platz 20 38729 Hahausen / DE | ||
| 02 /
Hidaka, Kazuhiko, c/o Mitutoyo research Center Europe BV De Rijn 18 5684 PJ Best / NL | |||
| 03 /
Saito, Akinori 430-1, Kamiyokoba Tsukuba-shi, Ibaraki-ken 305-0854 / JP | |||
| 04 /
Danzebrink, Dr. Hans-Ullrich Zur Siekwiese 17 38124 Braunschweig / DE | |||
| Former [2009/47] | 01 /
Danzebrink, Dr. Hans-Ullrich Zur Siekewiese 17 38124 Braunschweig / DE | ||
| 02 /
Hidaka, Kazuhiko, c/o Mitutoyo research Center Europe BV De Rijn 18 5684 PJ Best / NL | |||
| 03 /
Illers, Hartmut Am Platz 20 38729 Hahausen / DE | |||
| 04 /
Saito, Akinori 430-1, Kamiyokoba Tsukuba-shi, Ibaraki-ken 305-0854 / JP | Representative(s) | Grünecker Patent- und Rechtsanwälte PartG mbB Leopoldstraße 4 80802 München / DE | [2017/04] |
| Former [2009/47] | Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät Leopoldstrasse 4 80802 München / DE | Application number, filing date | 08009133.3 | 16.05.2008 | [2009/47] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP2120037 | Date: | 18.11.2009 | Language: | EN | [2009/47] | Type: | B1 Patent specification | No.: | EP2120037 | Date: | 25.01.2017 | Language: | EN | [2017/04] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 31.07.2008 | Classification | IPC: | B82Y35/00, G01Q70/04 | [2016/41] | CPC: |
G01Q70/04 (EP)
|
| Former IPC [2009/47] | G01N13/10, G12B21/22 | Designated contracting states | DE, FR, GB, IT [2017/04] |
| Former [2010/29] | DE, FR, GB, IT | ||
| Former [2009/47] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR | Title | German: | Messsonde für ein Scanmikroskop und Betriebsverfahren dafür | [2009/47] | English: | Measuring probe for a scanning microscope and method of operation thereof | [2009/47] | French: | Sonde de mesure pour microscope à balayage et son procédé de fonctionnement | [2009/47] | Examination procedure | 18.05.2010 | Examination requested [2010/26] | 19.05.2010 | Loss of particular rights, legal effect: designated state(s) | 24.06.2010 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HR, HU, IE, IS, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR | 16.03.2012 | Despatch of a communication from the examining division (Time limit: M04) | 26.07.2012 | Reply to a communication from the examining division | 07.10.2014 | Despatch of a communication from the examining division (Time limit: M04) | 17.02.2015 | Reply to a communication from the examining division | 14.09.2016 | Communication of intention to grant the patent | 09.12.2016 | Fee for grant paid | 09.12.2016 | Fee for publishing/printing paid | 09.12.2016 | Receipt of the translation of the claim(s) | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 16.03.2012 | Opposition(s) | 26.10.2017 | No opposition filed within time limit [2018/01] | Fees paid | Renewal fee | 28.05.2010 | Renewal fee patent year 03 | 27.05.2011 | Renewal fee patent year 04 | 29.03.2012 | Renewal fee patent year 05 | 28.05.2013 | Renewal fee patent year 06 | 27.03.2014 | Renewal fee patent year 07 | 27.05.2015 | Renewal fee patent year 08 | 30.03.2016 | Renewal fee patent year 09 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [DA]EP1653478 (MITUTOYO CORP [JP]) [DA] 1-15 * figures 1-5 * * paragraphs [0023] - [0049] *; | [A]EP0527601 (NIPPON KOGAKU KK [JP]) [A] 1-15 * figures 1-5 * * column 2, line 50 - column 4, line 34 *; | [A]DE10112316 (MITUTOYO CORP [JP]) [A] 1-15 * figures 1-4 * * paragraphs [0040] - [0085] *; | [A]JP2002162219 (MITUTOYO CORP) [A] 1-15 * figures 1-4 * | by applicant | EP1653478 |