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EP2163906
European procedure
Extract from the Register of European Patents
EP About this file: EP2163906
| EP2163906 - Method of detecting a movement of a measuring probe and measuring instrument [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 02.01.2015 Database last updated on 31.08.2024 | Most recent event Tooltip | 02.01.2015 | No opposition filed within time limit | published on 04.02.2015 [2015/06] | Applicant(s) | For all designated states Mitutoyo Corporation 20-1, Sakado 1-chome Takatsu-ku Kawasaki-shi, Kanagawa 213-8533 / JP | For all designated states Bundesrepublik Deutschland endvertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt 38116 Braunschweig / DE | [N/P] |
| Former [2010/11] | For all designated states Mitutoyo Corporation 20-1, Sakado 1-chome, Takatsuku Kawasaki-shi Kanagawa 213-8533 / JP | ||
| For all designated states Bundesrepublik Deutschland endvertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt 38116 Braunschweig / DE | Inventor(s) | 01 /
Illers, Hartmut Am Platz 20 38729 Hahausen / DE | 02 /
Danzenbrink, Hans Ullrich Zur Siekwiese 17 38124 Braunschweig / DE | 03 /
Saito, Akinori 430-1, Kamiyokoba Tsukuba-shi Ibaraki-ken 305-0854 / JP | 04 /
Hidaka, Kazuhiko c/o Milutoyo Research Center Europe B.V. De Rijn 18 5684 PJ Best / NL | [2014/09] |
| Former [2011/13] | 01 /
Illers, Hartmut Am Platz 20 38729 Hahausen / DE | ||
| 02 /
Danzenbrink, Hans Ullrich Zur Siekwiese 17 38124 Braunschweig / DE | |||
| 03 /
Saito, Akinori 430-1, Kamiyokoba, Tsukuba-shi Ibaraki-ken 305-0854 / JP | |||
| 04 /
Hidaka, Kazuhiko c/o Milutoyo Research Center, Europe B.V., De Rijn 18 5684 PJ Best / NL | |||
| Former [2011/12] | 01 /
* * * | ||
| 02 /
Hidaka, Kazuhiko, c/o Mitutoyo Research Center Europe BV De Rijn 18 5684 PJ Best / NL | |||
| 03 /
* * * | |||
| 04 /
Saito, Akinori 430-1, Kamiyokoba Tsukuba-shi, Ibaraki-ken 305-0854 / JP | |||
| Former [2010/11] | 01 /
Danzebrink, Dr. Hans-Ullrich Zur Siekwiese 17 38124 Braunschweig / DE | ||
| 02 /
Hidaka, Kazuhiko, c/o Mitutoyo Research Center Europe BV De Rijn 18 5684 PJ Best / NL | |||
| 03 /
Illers, Hartmut Am platz 20 38729 Hahausen / DE | |||
| 04 /
Saito, Akinori 430-1, Kamiyokoba Tsukuba-shi, Ibaraki-ken 305-0854 / JP | Representative(s) | Grünecker Patent- und Rechtsanwälte PartG mbB Leopoldstrasse 4 80802 München / DE | [N/P] |
| Former [2014/09] | Grünecker, Kinkeldey, Stockmair & Schwanhäusser Leopoldstrasse 4 80802 München / DE | ||
| Former [2010/11] | Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät Leopoldstrasse 4 80802 München / DE | Application number, filing date | 08016297.7 | 16.09.2008 | [2010/11] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP2163906 | Date: | 17.03.2010 | Language: | EN | [2010/11] | Type: | B1 Patent specification | No.: | EP2163906 | Date: | 26.02.2014 | Language: | EN | [2014/09] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 25.02.2009 | Classification | IPC: | G01Q20/02, G01Q30/02, // G01B9/02 | [2013/35] | CPC: |
G01Q20/02 (EP,US);
G01B9/02031 (EP,US);
G01B2290/70 (EP,US)
|
| Former IPC [2010/11] | G01Q20/02, G01Q30/02, G01B9/00 | Designated contracting states | DE, GB [2010/47] |
| Former [2010/11] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR | Title | German: | Verfahren zur Bewegungserkennung einer Messsonde und Messinstrument | [2010/11] | English: | Method of detecting a movement of a measuring probe and measuring instrument | [2010/11] | French: | Procédé de détection du mouvement d'une sonde de mesure et instrument de mesure | [2010/11] | Examination procedure | 16.09.2010 | Examination requested [2010/43] | 18.09.2010 | Loss of particular rights, legal effect: designated state(s) | 11.10.2010 | Despatch of a communication from the examining division (Time limit: M04) | 26.10.2010 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, FR, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR | 17.11.2010 | Reply to a communication from the examining division | 22.08.2013 | Communication of intention to grant the patent | 20.12.2013 | Fee for grant paid | 20.12.2013 | Fee for publishing/printing paid | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 11.10.2010 | Opposition(s) | 27.11.2014 | No opposition filed within time limit [2015/06] | Fees paid | Renewal fee | 29.09.2010 | Renewal fee patent year 03 | 28.09.2011 | Renewal fee patent year 04 | 20.09.2012 | Renewal fee patent year 05 | 20.09.2013 | Renewal fee patent year 06 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [YA]US4732483 (BIEGEN JAMES F [US]) [Y] 3,9-14 * figure 1 * * column 3, line 23 - column 5, line 9 * [A] 1,2,4-8,15; | [DA]EP1653478 (MITUTOYO CORP [JP]) [DA] 1-14* the whole document *; | [A]EP1860396 (JAPAN SCIENCE & TECH AGENCY [JP]) [A] 1-6,8-14 * figures 1-12 * * paragraphs [0010] - [0048] *; | [XY] - DEN BOEF A J, "Scanning force microscopy using a simple low-noise interferometer", APPLIED PHYSICS LETTERS USA, (19890731), vol. 55, no. 5, ISSN 0003-6951, pages 439 - 441, XP002515115 [X] 1,2,4-8,15 * figure 1 * * page 439, column 1, line 24 - page 440, column 1, line 46 * [Y] 3,9-14 DOI: http://dx.doi.org/10.1063/1.101891 | by applicant | EP1653478 | - DEN BOEF AJ, "Scanning force microscopy using a simple low-noise interferometer", APPLIED PHYSICS LETTERS USA, (19890731), vol. 55, no. 5, pages 439 - 441 | EP20080009133 | EP20080009131 |