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Extract from the Register of European Patents

EP About this file: EP2190024

EP2190024 - Photoelectric device with multiple junctions and method of manufacturing same [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  22.04.2011
Database last updated on 29.07.2024
Most recent event   Tooltip22.04.2011Application deemed to be withdrawnpublished on 25.05.2011  [2011/21]
Applicant(s)For all designated states
Université de Neuchâtel
Faubourg du Lac 5a
2000 Neuchatel / CH
[2010/21]
Inventor(s)01 / Domine, Didier
Route de Corban 10
2825 Courchapoix / CH
02 / Cuony, Peter
Desor 3
2000 Neuchâtel / CH
03 / Bailat, Julien
Au village 26
2855 Glovelier / CH
 [2010/21]
Representative(s)Bovard SA Neuchâtel
Rue des Noyers 11
2000 Neuchâtel / CH
[N/P]
Former [2010/21]GLN
Rue du Puits-Godet 8a
2000 Neuchâtel / CH
Application number, filing date08169424.219.11.2008
[2010/21]
Filing languageFR
Procedural languageFR
PublicationType: A1 Application with search report 
No.:EP2190024
Date:26.05.2010
Language:FR
[2010/21]
Search report(s)(Supplementary) European search report - dispatched on:EP08.05.2009
ClassificationIPC:H01L31/0236, H01L31/078
[2010/21]
CPC:
H01L31/0236 (US); H01L31/02366 (EP); H01L31/0547 (EP,US);
H01L31/0687 (EP,US); H01L31/1824 (EP,US); H01L31/202 (EP,US);
Y02E10/52 (EP,US); Y02E10/544 (EP,US); Y02E10/545 (EP,US);
Y02P70/50 (EP,US) (-)
Designated contracting states[2011/05]
Former [2010/21]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MT,  NL,  NO,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Fotoelektrische Vorrichtung mit Multi-Schnittstellen und ihr Umsetzungsverfahren[2010/21]
English:Photoelectric device with multiple junctions and method of manufacturing same[2010/21]
French:Dispositif photoélectrique a jonctions multiples et son procédé de realisation[2010/21]
Examination procedure30.11.2010Application deemed to be withdrawn, date of legal effect  [2011/21]
10.01.2011Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2011/21]
Fees paidPenalty fee
Additional fee for renewal fee
30.11.201003   M06   Not yet paid
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Documents cited:Search[XD]US2002011263  (MURAMOTO MASAHIKO [JP], et al) [XD] 1-13 * abstract * * paragraph [0032] - paragraph [0034] * * paragraphs [0049] , [0063] * * paragraph [0100] * * paragraph [0109] - paragraph [0119] *;
 [XD]US6825408  (NAGANO YASUE [JP], et al) [XD] 1-13 * abstract * * paragraphs [0026] , [0044] *;
 [A]US2002134425  (YAMAMOTO HIROSHI [JP], et al) [A] 1,9 * abstract * * paragraph [0020] - paragraph [0026] *;
 [A]US2002050289  (WADA KENJI [JP], et al) [A] 1,9 * abstract * * paragraph [0023] - paragraph [0039] *;
 [A]  - SANNOMIYA H ED - JAPAN SOCIETY OF APPLIED PHYSICS, "A-SIC/A-SI/A-SIGE MULTI-BANDGAP STACKED SOLAR CELLS WITH BANDGAP PROFILING", PROCEEDINGS OF THE INTERNATIONAL PHOTOVOLTAIC SCIENCE AND ENGINEERING CONFERENCE. KYOTO, NOV. 26 - 30, 1990; [PROCEEDINGS OF THE INTERNATIONAL PHOTOVOLTAIC SCIENCE AND ENGINEERING CONFERENCE], KYOTO, KYOTO UNIVERSITY, JP, (19901126), vol. CONF. 5, pages 387 - 390, XP000215068 [A] 1,9 * the whole document *
by applicantUS6825408
 US6459034
 WO2007113037
    - S. FAY ET AL., "Opto-electronic properties of rough LP- CVD ZnO:B for use as TCO in thin-film silicon solar cells", THIN SOLID FILMS, (2007), vol. 515, no. 24, doi:doi:10.1016/j.tsf.2007.03.130, pages 8558 - 8561, XP022265913

DOI:   http://dx.doi.org/10.1016/j.tsf.2007.03.130
    - J. MEIER ET AL., "Progress in up-scaling of thin film silicon solar cells by large- area PECVD KAI systems", PROC. OF THE 31TH IEEE PHOTOVOLTAIC SPECIALIST CONFERENCE, (200501), doi:doi:10.1109/PVSC.2005.1488418, pages 1464 - 1467, XP010823034

DOI:   http://dx.doi.org/10.1109/PVSC.2005.1488418
    - S. FAY ET AL., "Opto-electronic properties of rough LP-CVD ZnO:B for use as TCO in thin-film silicon solar cells", THIN SOLID FILMS, (2007), vol. 515, no. 24, doi:doi:10.1016/j.tsf.2007.03.130, pages 8558 - 8561, XP022265913

DOI:   http://dx.doi.org/10.1016/j.tsf.2007.03.130
    - D. FISCHER ET AL., 25 IEEE PVSC, (1996), page 1053
    - THORNTON, J. VAC. SCI. TECHNOL. A, (1986), vol. 4, no. 6, pages 3059 - 3065
    - DALAKOS; PLAWSKY; PERSANS, MRS SYMP. PROC., (2003), vol. 762
    - G. CICALA; G. BRUNO; P. CAPEZZUTO, PURE & APPL. CHEM., (1996), vol. 68, no. 5, pages 1143 - 1149
    - J. BENEDICT ET AL., PROC. MAT. RES. SOC. SYMP., (1992), page 254
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.