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Extract from the Register of European Patents

EP About this file: EP2142083

EP2142083 - LAYERED STRUCTURE FOR CORROSION RESISTANT INTERCONNECT CONTACTS [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  06.12.2013
Database last updated on 31.08.2024
Most recent event   Tooltip06.12.2013Refusal of applicationpublished on 08.01.2014  [2014/02]
Applicant(s)For all designated states
MEDTRONIC, INC.
710 Medtronic Parkway MS LC340
Minneapolis, Minnesota 55432 / US
[2010/02]
Inventor(s)01 / RUBEN, David A.
2164 East Norcroft Street
Mesa, Arizona 85213 / US
 [2010/02]
Representative(s)Hughes, Andrea Michelle
Dehns
St Bride's House
10 Salisbury Square
London EC4Y 8JD / GB
[N/P]
Former [2010/02]Hughes, Andrea Michelle
Frank B. Dehn & Co. St Bride's House 10 Salisbury Square London
EC4Y 8JD / GB
Application number, filing date08746988.828.04.2008
[2010/02]
WO2008US61706
Priority number, dateUS2007074158327.04.2007         Original published format: US 741583
[2010/02]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2008134603
Date:06.11.2008
Language:EN
[2008/45]
Type: A2 Application without search report 
No.:EP2142083
Date:13.01.2010
Language:EN
The application published by WIPO in one of the EPO official languages on 06.11.2008 takes the place of the publication of the European patent application.
[2010/02]
Search report(s)International search report - published on:EP31.12.2008
ClassificationIPC:A61B5/02
[2010/02]
CPC:
A61B5/0215 (EP,US); A61B2562/028 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2010/02]
TitleGerman:SCHICHTSTRUKTUR FÜR KORROSIONSBESTÄNDIGE VERBINDUNGSKONTAKTE[2010/02]
English:LAYERED STRUCTURE FOR CORROSION RESISTANT INTERCONNECT CONTACTS[2010/02]
French:STRUCTURE EN COUCHES POUR CONTACTS D'INTERCONNEXION RÉSISTANT À LA CORROSION[2010/02]
Entry into regional phase02.11.2009National basic fee paid 
02.11.2009Designation fee(s) paid 
02.11.2009Examination fee paid 
Examination procedure02.11.2009Examination requested  [2010/02]
01.03.2011Despatch of a communication from the examining division (Time limit: M06)
18.10.2011Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
27.12.2011Reply to a communication from the examining division
20.01.2012Despatch of a communication from the examining division (Time limit: M06)
11.07.2012Reply to a communication from the examining division
02.08.2012Despatch of a communication from the examining division (Time limit: M04)
05.11.2012Reply to a communication from the examining division
02.07.2013Cancellation of oral proceeding that was planned for 17.09.2013
23.08.2013Despatch of communication that the application is refused, reason: substantive examination [2014/02]
02.09.2013Application refused, date of legal effect [2014/02]
17.09.2013Date of oral proceedings (cancelled)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  01.03.2011
Request for further processing for:The application is deemed to be withdrawn due to failure to reply to the examination report
27.12.2011Request for further processing filed
27.12.2011Full payment received (date of receipt of payment)
Request granted
18.01.2012Decision despatched
Fees paidRenewal fee
15.03.2010Renewal fee patent year 03
06.04.2011Renewal fee patent year 04
28.03.2012Renewal fee patent year 05
29.04.2013Renewal fee patent year 06
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Cited inInternational search[X]WO03041096  (STARCK H C INC [US]) [X] 1-15 * abstract *;
 [X]WO2006104432  (ST JUDE MEDICAL [SE], et al) [X] 1-15 * page 1, line 11 - page 3, line 30 * * page 19, lines 15-29 * * claims 1,5-8 *;
 [X]  - ARSHAK ET AL, "Development of oxide thick film capacitors for a real time pressure monitoring system", MATERIALS SCIENCE AND ENGINEERING C, ELSEVIER SCIENCE S.A, CH, (20060717), vol. 27, no. 5-8, ISSN 0928-4931, pages 1406 - 1410, XP022190518 [X] 1-15 * abstract * * Sections "1.Introduction" and "4. Conclusions" *

DOI:   http://dx.doi.org/10.1016/j.msec.2006.06.003
 [A]  - SRIKANTH V ET AL, "Thermal expansion anisotropy, microcracking and acoustic emission of Nb2O5 ceramics", CERAMICS INTERNATIONAL, ELSEVIER, AMSTERDAM, NL, vol. 18, no. 4, ISSN 0272-8842, (19920101), pages 251 - 261, (19920101), XP022784795 [A] * Section "1. INTRODUCTION" and figure 5 *

DOI:   http://dx.doi.org/10.1016/0272-8842(92)90103-K
 [A]  - DOUGLASS ET AL, "The thermal expansion of niobium pentoxide and its effect on the spalling of niobium oxidation films", JOURNAL OF THE LESS-COMMON METALS, ELSEVIER-SEQUOIA S.A. LAUSANNE, CH, vol. 5, no. 2, ISSN 0022-5088, (19630401), pages 151 - 157, (19630401), XP022818492 [A] * table 1 *

DOI:   http://dx.doi.org/10.1016/0022-5088(63)90008-0
ExaminationUS5324326
 JP2006033748
 WO2006086037
 US2006204776
 US2007060969
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.