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EP2172154
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EP About this file: EP2172154
| EP2172154 - NONINVASIVE BIOMETRIC DEVICE AND NONINVASIVE BIOMETRIC METHOD [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 13.09.2013 Database last updated on 22.01.2025 | Most recent event Tooltip | 13.09.2013 | Withdrawal of application | published on 16.10.2013 [2013/42] | Applicant(s) | For all designated states Sysmex Corporation 5-1, Wakinohama-Kaigandori 1-chome Chuo-ku Kobe-shi, Hyogo 651-0073 / JP | [2010/14] | Inventor(s) | 01 /
OZAWA, Toshiyuki c/o SYSMEX CORPORATION 5-1 Wakinohama-kaigandori1-chome Chuo-ku Kobe-shi Hyogo 651-0073 / JP | 02 /
NUMADA, Shigehiro c/o SYSMEX CORPORATION 5-1 Wakinohama-kaigandori1-chome Chuo-ku Kobe-shi Hyogo 651-0073 / JP | 03 /
KODERA, Toshihiko c/o TOA Corporation 7-2-1 Minatojimanakamachi Chuo-ku Kobe-shi Hyogo 650-0046 / JP | [2010/14] | Representative(s) | Hoffmann Eitle Patent- und Rechtsanwälte PartmbB Arabellastrasse 30 81925 München / DE | [N/P] |
| Former [2010/14] | HOFFMANN EITLE Patent- und Rechtsanwälte Arabellastrasse 4 81925 München / DE | Application number, filing date | 08791810.8 | 29.07.2008 | [2010/14] | WO2008JP63575 | Priority number, date | JP20070198669 | 31.07.2007 Original published format: JP 2007198669 | [2010/14] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2009017113 | Date: | 05.02.2009 | Language: | JA | [2009/06] | Type: | A1 Application with search report | No.: | EP2172154 | Date: | 07.04.2010 | Language: | EN | [2010/14] | Search report(s) | International search report - published on: | JP | 05.02.2009 | (Supplementary) European search report - dispatched on: | EP | 28.08.2013 | Classification | IPC: | A61B5/1455, A61B5/145 | [2013/39] | CPC: |
A61B5/14546 (EP,US);
A61B5/1455 (EP,US);
A61B5/681 (EP,US);
A61B5/026 (EP,US);
A61B5/489 (EP,US)
|
| Former IPC [2010/14] | A61B5/1455 | Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR [2010/14] | Title | German: | NICHT-INVASIVE BIOMETRISCHE VORRICHTUNG UND NICHT-INVASIVES BIOMETRISCHES VERFAHREN | [2010/14] | English: | NONINVASIVE BIOMETRIC DEVICE AND NONINVASIVE BIOMETRIC METHOD | [2010/14] | French: | DISPOSITIF BIOMÉTRIQUE NON INVASIF ET PROCÉDÉ BIOMÉTRIQUE NON INVASIF | [2010/14] | Entry into regional phase | 10.12.2009 | Translation filed | 10.12.2009 | National basic fee paid | 10.12.2009 | Search fee paid | 10.12.2009 | Designation fee(s) paid | 10.12.2009 | Examination fee paid | Examination procedure | 10.12.2009 | Examination requested [2010/14] | 03.09.2013 | Application withdrawn by applicant [2013/42] | Fees paid | Renewal fee | 29.07.2010 | Renewal fee patent year 03 | 28.07.2011 | Renewal fee patent year 04 | 25.07.2012 | Renewal fee patent year 05 | 24.07.2013 | Renewal fee patent year 06 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]EP1214904 (OMRON TATEISI ELECTRONICS CO [JP]) [A] 1,11* abstract *; | [A]US2006129038 (ZELENCHUK ALEX R [US], et al) [A] 1-14 * paragraphs [0090] , [0091]; figure 13 *; | [A]EP1743570 (SYSMEX CORP [JP]) [A] 1-14 * the whole document * | International search | [X]JP2007044491 (SYSMEX CORP) [X] 1-10* , Abstract; Claims; Par. Nos. [0006], [0048], [0055], [0058]; Figs. 21, 22, 3, 1 & US 2007/0015980 A1 & EP 1743570 A1 * |