-
EP2253085
European procedure
- EP About this file
- EP Legal status
- EP Federated register
- EP Event history
- EP Citations
- EP Patent family
- EP All documents
Extract from the Register of European Patents
EP About this file: EP2253085
| EP2253085 - SIGNAL QUALITY ESTIMATION FOR OFDMA SYSTEMS [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 03.10.2014 Database last updated on 14.11.2024 | Most recent event Tooltip | 03.10.2014 | Application deemed to be withdrawn | published on 05.11.2014 [2014/45] | Applicant(s) | For all designated states QUALCOMM Incorporated International IP Administration 5775 Morehouse Drive San Diego, California 92121-1714 / US | [2010/47] | Inventor(s) | 01 /
PARK, Jong, Hyeon 5775 Morehouse Drive San Diego, California 92121-1714 / US | 02 /
KIM, Je, Woo 5775 Morehouse Drive San Diego, California 92121-1714 / US | [2010/47] | Representative(s) | Catesby, Olivia Joanne, et al Tomkins & Co. 5 Dartmouth Road Dublin 6 / IE | [N/P] |
| Former [2010/47] | Catesby, Olivia Joanne, et al Tomkins & Co 5 Dartmouth Road Dublin 6 / IE | Application number, filing date | 08795930.0 | 19.06.2008 | [2010/47] | WO2008US67449 | Priority number, date | US20080035394 | 21.02.2008 Original published format: US 35394 | [2010/47] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2009105122 | Date: | 27.08.2009 | Language: | EN | [2009/35] | Type: | A1 Application with search report | No.: | EP2253085 | Date: | 24.11.2010 | Language: | EN | The application published by WIPO in one of the EPO official languages on 27.08.2009 takes the place of the publication of the European patent application. | [2010/47] | Search report(s) | International search report - published on: | EP | 27.08.2009 | Classification | IPC: | H04B17/00, H04L27/26 | [2010/47] | CPC: |
H04L1/20 (EP,US);
H04L27/26 (KR);
H04L27/261 (EP,US);
H04L27/2647 (EP,US)
| Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR [2010/47] | Title | German: | SIGNALGÜTESCHÄTZUNG FÜR OFDMA-SYSTEME | [2010/47] | English: | SIGNAL QUALITY ESTIMATION FOR OFDMA SYSTEMS | [2010/47] | French: | ESTIMATION DE QUALITÉ DE SIGNAL POUR DES SYSTÈMES OFDMA | [2010/47] | Entry into regional phase | 06.09.2010 | National basic fee paid | 06.09.2010 | Designation fee(s) paid | 06.09.2010 | Examination fee paid | Examination procedure | 06.09.2010 | Examination requested [2010/47] | 29.10.2010 | Amendment by applicant (claims and/or description) | 21.01.2014 | Despatch of a communication from the examining division (Time limit: M04) | 03.06.2014 | Application deemed to be withdrawn, date of legal effect [2014/45] | 27.06.2014 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2014/45] | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 21.01.2014 | Fees paid | Renewal fee | 21.09.2010 | Renewal fee patent year 03 | 07.06.2011 | Renewal fee patent year 04 | 31.03.2012 | Renewal fee patent year 05 | 31.03.2013 | Renewal fee patent year 06 | 31.03.2014 | Renewal fee patent year 07 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [A]EP1207663 (TOSHIBA KK [JP]) [A] 1,8,15,21,26 * abstract * * paragraphs [0014] , [0016] - [0018] - [0020] - [0023]; figures 1,2 *; | [A]WO2007078086 (POSDATA CO LTD [KR], et al) [A] 1,8,15,21,26 * abstract * * paragraphs [0036] - [0057] - [0073] , [0074]; figures 3-5,7 *; | [A]WO2007021159 (SAMSUNG ELECTRONICS CO LTD [KR], et al) [A] 1,3,8,10,15,17,21,23,26,28 * abstract * * page 4, line 3 - line 16 * * page 6, line 3 - line 21 * * page 12, line 11 - page 14, line 13 * * figures 3,5,7,8 * | Examination | EP1555761 |