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EP2321795

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EP About this file: EP2321795

EP2321795 - IMAGE ANALYSIS METHOD AND SYSTEM [Right-click to bookmark this link]
Status	The application is deemed to be withdrawn Status updated on 14.09.2018 Database last updated on 24.08.2024
Former	Request for examination was made Status updated on 28.05.2018
Most recent event Tooltip	14.09.2018	Application deemed to be withdrawn	published on 17.10.2018 [2018/42]
Applicant(s)	For all designated states Hewlett-Packard Development Company, L.P. 11445 Compaq Center Drive West Houston, TX 77070 / US
	[2011/20]
Inventor(s)	01 / TANG, Feng 1501 Page Mill Rd. Palo Alto California 94304 / US
	02 / LIM, Suk Hwan 1501 Page Mill Rd. Palo Alto California 94304 / US
	[2011/20]
Representative(s)	Stöckeler, Ferdinand, et al Schoppe, Zimmermann, Stöckeler Zinkler, Schenk & Partner mbB Patentanwälte Radlkoferstrasse 2 81373 München / DE
	[N/P]
Former [2011/20]	Exell, Jonathan Mark Williams Powell Staple Court 11 Staple Inn Buildings London WC1V 7QH / GB
Application number, filing date	08821176.8	03.09.2008
	[2011/20]
	WO2008US75128
Priority number, date	US20080091085P	22.08.2008 Original published format: US 91085 P
	[2011/20]
Filing language	EN
Procedural language	EN
Publication	Type:	A1 Application with search report
	No.:	WO2010021633
	Date:	25.02.2010
	Language:	EN
	[2010/08]
	Type:	A1 Application with search report
	No.:	EP2321795
	Date:	18.05.2011
	Language:	EN
	The application published by WIPO in one of the EPO official languages on 25.02.2010 takes the place of the publication of the European patent application.
	[2011/20]
Search report(s)	International search report - published on:	KR	25.02.2010
	(Supplementary) European search report - dispatched on:	EP	22.09.2017
Classification	IPC:	G06T7/33, G06K9/46	[2017/43]
	CPC:	G06T7/337 (EP,US); G06V10/507 (EP,US); G06T2207/10016 (EP,US)
	Former IPC [2011/20]	G06T7/00
Designated contracting states	AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR [2011/20]
Title	German:	BILDANALYSEVERFAHREN UND -SYSTEM	[2011/20]
	English:	IMAGE ANALYSIS METHOD AND SYSTEM	[2011/20]
	French:	PROCÉDÉ ET SYSTÈME D'ANALYSE D'IMAGE	[2011/20]
Entry into regional phase	18.02.2011	National basic fee paid
	18.02.2011	Search fee paid
	18.02.2011	Designation fee(s) paid
	18.02.2011	Examination fee paid
Examination procedure	18.02.2011	Amendment by applicant (claims and/or description)
	18.02.2011	Examination requested [2011/20]
	21.04.2018	Application deemed to be withdrawn, date of legal effect [2018/42]
	29.05.2018	Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2018/42]
Fees paid	Renewal fee
	18.02.2011	Renewal fee patent year 03
	26.09.2011	Renewal fee patent year 04
	25.09.2012	Renewal fee patent year 05
	23.09.2013	Renewal fee patent year 06
	24.09.2014	Renewal fee patent year 07
	28.09.2015	Renewal fee patent year 08
	23.09.2016	Renewal fee patent year 09
	22.09.2017	Renewal fee patent year 10
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[A]US6711293 (LOWE DAVID G [CA]) [A] 1-12 * column 1, line 42 - column 2, line 3 * * column 4, line 55 - column 5, line 4; figure 3 * * column 6, line 12 - line 16; figures 6,7 ** column 7, line 41 - line 56; figure 8 *;
		[XYI] - LEI QIN ET AL, "Image Matching Based on A Local Invariant Descriptor", IMAGE PROCESSING, 2005. ICIP 2005. IEEE INTERNATIONAL CONFERENCE ON, IEEE, PISCATAWAY, NJ, USA,IEEE, (20050911), vol. 3, ISBN 978-0-7803-9134-5, pages 377 - 380, XP010852668 [X] 1-5,9-11,13-15 * sections I and II * [Y] 12 [I] 6-8
		[XYI] - DAVID G LOWE, "Distinctive Image Features from Scale-Invariant Keypoints", INTERNATIONAL JOURNAL OF COMPUTER VISION, KLUWER ACADEMIC PUBLISHERS, BO, (20041101), vol. 60, no. 2, doi:10.1023/B:VISI.0000029664.99615.94, ISSN 1573-1405, pages 91 - 110, XP019216426 [X] 1-5,13-15 * sections 4, 5 and 6 * [Y] 12 [I] 6-8 DOI: http://dx.doi.org/10.1023/B:VISI.0000029664.99615.94
		[A] - MIKOLAJCZYK K ET AL, "Indexing based on scale invariant interest points", PROCEEDINGS OF THE EIGHT IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION. (ICCV). VANCOUVER, BRITISH COLUMBIA, CANADA, JULY 7 - 14, 2001; [INTERNATIONAL CONFERENCE ON COMPUTER VISION], LOS ALAMITOS, CA : IEEE COMP. SOC, US, (20010707), vol. 1, doi:10.1109/ICCV.2001.937561, ISBN 978-0-7695-1143-6, pages 525 - 531, XP010554025 [A] 1-15 * section 3 * DOI: http://dx.doi.org/10.1109/ICCV.2001.937561
		[Y] - RAJ GUPTA ET AL, "Illumination and AffineInvariant Point Matching using an Ordinal Approach", ICCV 2007. IEEE 11TH INTERNATIONAL CONFERENCE ON COMPUTER VISION, 2007, IEEE, (20071001), ISBN 978-1-4244-1630-1, pages 1 - 8, XP031194577 [Y] 12 * section 1 * * abstract *
		[Y] - K Mikolajczyk ET AL, "A performance evaluation of local descriptors", IEEE Transactions on Pattern Analysis and Machine Intelligence, New York, doi:10.1109/TPAMI.2005.188, (20050101), pages 1615 - 1630, URL: http://www.robots.ox.ac.uk/~vgg/research/affine/det_eval_files/mikolajczyk_pami2004.pdf, XP055325306 [Y] 12 * sections 2.1 and 3.1 * DOI: http://dx.doi.org/10.1109/TPAMI.2005.188
		[Y] - MIKOLAJCZYK K ET AL, "A performance evaluation of local descriptors", PROCEEDINGS / 2003 IEEE COMPUTER SOCIETY CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, 18 - 20 JUNE 2003, MADISON, WISCONSIN; [PROCEEDINGS OF THE IEEE COMPUTER CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION], LOS ALAMITOS, CALIF. [U.A, (20030618), vol. 2, doi:10.1109/CVPR.2003.1211478, ISBN 978-0-7695-1900-5, pages 257 - 263, XP010644681 [Y] 12 * section 2 * DOI: http://dx.doi.org/10.1109/CVPR.2003.1211478
		[XPI] - FENG TANG ET AL, "A novel feature descriptor invariant to complex brightness changes", 2009 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION : CVPR 2009 ; MIAMI [BEACH], FLORIDA, USA, 20 - 25 JUNE 2009, IEEE, PISCATAWAY, NJ, (20090620), ISBN 978-1-4244-3992-8, pages 2631 - 2638, XP031607077 [XP] 1-5,9-15 * section 3 * [I] 6-8
		[A] - KRYSTIAN MIKOLAJCZYK ET AL, "Scale & Affine Invariant Interest Point Detectors", INTERNATIONAL JOURNAL OF COMPUTER VISION, KLUWER ACADEMIC PUBLISHERS, BO, (20041001), vol. 60, no. 1, doi:10.1023/B:VISI.0000027790.02288.F2, ISSN 1573-1405, pages 63 - 86, XP019216425 [A] 1-15 * sections 2 and 3 * DOI: http://dx.doi.org/10.1023/B:VISI.0000027790.02288.f2
		[A] - SCHERER S ET AL, "The discriminatory power of ordinal measures towards a new coefficient", PROCEEDINGS OF THE 1999 IEEE COMPUTER SOCIETY CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, JUNE 23-25, 1999; FORT COLLINS, COLORADO, IEEE, THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC, US, (19990623), vol. 1, ISBN 978-0-7695-0149-9, pages 76 - 81, XP010347667 [A] 1-15 * sections 1 and 2 * * abstract *
	International search	[A]US5510838 (YOMDIN YOSEF [IL], et al);
		[A]US6408028 (MANJUNATH BANGALORE S [US], et al);
		[A]US2005238198 (BROWN MATTHEW [CA], et al);
		[A]US6975755 (BAUMBERG ADAM MICHAEL [GB])

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