EP2321795 - IMAGE ANALYSIS METHOD AND SYSTEM [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 14.09.2018 Database last updated on 24.08.2024 | |
Former | Request for examination was made Status updated on 28.05.2018 | Most recent event Tooltip | 14.09.2018 | Application deemed to be withdrawn | published on 17.10.2018 [2018/42] | Applicant(s) | For all designated states Hewlett-Packard Development Company, L.P. 11445 Compaq Center Drive West Houston, TX 77070 / US | [2011/20] | Inventor(s) | 01 /
TANG, Feng 1501 Page Mill Rd. Palo Alto California 94304 / US | 02 /
LIM, Suk Hwan 1501 Page Mill Rd. Palo Alto California 94304 / US | [2011/20] | Representative(s) | Stöckeler, Ferdinand, et al Schoppe, Zimmermann, Stöckeler Zinkler, Schenk & Partner mbB Patentanwälte Radlkoferstrasse 2 81373 München / DE | [N/P] |
Former [2011/20] | Exell, Jonathan Mark Williams Powell Staple Court 11 Staple Inn Buildings London WC1V 7QH / GB | Application number, filing date | 08821176.8 | 03.09.2008 | [2011/20] | WO2008US75128 | Priority number, date | US20080091085P | 22.08.2008 Original published format: US 91085 P | [2011/20] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2010021633 | Date: | 25.02.2010 | Language: | EN | [2010/08] | Type: | A1 Application with search report | No.: | EP2321795 | Date: | 18.05.2011 | Language: | EN | The application published by WIPO in one of the EPO official languages on 25.02.2010 takes the place of the publication of the European patent application. | [2011/20] | Search report(s) | International search report - published on: | KR | 25.02.2010 | (Supplementary) European search report - dispatched on: | EP | 22.09.2017 | Classification | IPC: | G06T7/33, G06K9/46 | [2017/43] | CPC: |
G06T7/337 (EP,US);
G06V10/507 (EP,US);
G06T2207/10016 (EP,US)
|
Former IPC [2011/20] | G06T7/00 | Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR [2011/20] | Title | German: | BILDANALYSEVERFAHREN UND -SYSTEM | [2011/20] | English: | IMAGE ANALYSIS METHOD AND SYSTEM | [2011/20] | French: | PROCÉDÉ ET SYSTÈME D'ANALYSE D'IMAGE | [2011/20] | Entry into regional phase | 18.02.2011 | National basic fee paid | 18.02.2011 | Search fee paid | 18.02.2011 | Designation fee(s) paid | 18.02.2011 | Examination fee paid | Examination procedure | 18.02.2011 | Amendment by applicant (claims and/or description) | 18.02.2011 | Examination requested [2011/20] | 21.04.2018 | Application deemed to be withdrawn, date of legal effect [2018/42] | 29.05.2018 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2018/42] | Fees paid | Renewal fee | 18.02.2011 | Renewal fee patent year 03 | 26.09.2011 | Renewal fee patent year 04 | 25.09.2012 | Renewal fee patent year 05 | 23.09.2013 | Renewal fee patent year 06 | 24.09.2014 | Renewal fee patent year 07 | 28.09.2015 | Renewal fee patent year 08 | 23.09.2016 | Renewal fee patent year 09 | 22.09.2017 | Renewal fee patent year 10 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US6711293 (LOWE DAVID G [CA]) [A] 1-12 * column 1, line 42 - column 2, line 3 * * column 4, line 55 - column 5, line 4; figure 3 * * column 6, line 12 - line 16; figures 6,7 ** column 7, line 41 - line 56; figure 8 *; | [XYI] - LEI QIN ET AL, "Image Matching Based on A Local Invariant Descriptor", IMAGE PROCESSING, 2005. ICIP 2005. IEEE INTERNATIONAL CONFERENCE ON, IEEE, PISCATAWAY, NJ, USA,IEEE, (20050911), vol. 3, ISBN 978-0-7803-9134-5, pages 377 - 380, XP010852668 [X] 1-5,9-11,13-15 * sections I and II * [Y] 12 [I] 6-8 | [XYI] - DAVID G LOWE, "Distinctive Image Features from Scale-Invariant Keypoints", INTERNATIONAL JOURNAL OF COMPUTER VISION, KLUWER ACADEMIC PUBLISHERS, BO, (20041101), vol. 60, no. 2, doi:10.1023/B:VISI.0000029664.99615.94, ISSN 1573-1405, pages 91 - 110, XP019216426 [X] 1-5,13-15 * sections 4, 5 and 6 * [Y] 12 [I] 6-8 DOI: http://dx.doi.org/10.1023/B:VISI.0000029664.99615.94 | [A] - MIKOLAJCZYK K ET AL, "Indexing based on scale invariant interest points", PROCEEDINGS OF THE EIGHT IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION. (ICCV). VANCOUVER, BRITISH COLUMBIA, CANADA, JULY 7 - 14, 2001; [INTERNATIONAL CONFERENCE ON COMPUTER VISION], LOS ALAMITOS, CA : IEEE COMP. SOC, US, (20010707), vol. 1, doi:10.1109/ICCV.2001.937561, ISBN 978-0-7695-1143-6, pages 525 - 531, XP010554025 [A] 1-15 * section 3 * DOI: http://dx.doi.org/10.1109/ICCV.2001.937561 | [Y] - RAJ GUPTA ET AL, "Illumination and AffineInvariant Point Matching using an Ordinal Approach", ICCV 2007. IEEE 11TH INTERNATIONAL CONFERENCE ON COMPUTER VISION, 2007, IEEE, (20071001), ISBN 978-1-4244-1630-1, pages 1 - 8, XP031194577 [Y] 12 * section 1 * * abstract * | [Y] - K Mikolajczyk ET AL, "A performance evaluation of local descriptors", IEEE Transactions on Pattern Analysis and Machine Intelligence, New York, doi:10.1109/TPAMI.2005.188, (20050101), pages 1615 - 1630, URL: http://www.robots.ox.ac.uk/~vgg/research/affine/det_eval_files/mikolajczyk_pami2004.pdf, XP055325306 [Y] 12 * sections 2.1 and 3.1 * DOI: http://dx.doi.org/10.1109/TPAMI.2005.188 | [Y] - MIKOLAJCZYK K ET AL, "A performance evaluation of local descriptors", PROCEEDINGS / 2003 IEEE COMPUTER SOCIETY CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, 18 - 20 JUNE 2003, MADISON, WISCONSIN; [PROCEEDINGS OF THE IEEE COMPUTER CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION], LOS ALAMITOS, CALIF. [U.A, (20030618), vol. 2, doi:10.1109/CVPR.2003.1211478, ISBN 978-0-7695-1900-5, pages 257 - 263, XP010644681 [Y] 12 * section 2 * DOI: http://dx.doi.org/10.1109/CVPR.2003.1211478 | [XPI] - FENG TANG ET AL, "A novel feature descriptor invariant to complex brightness changes", 2009 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION : CVPR 2009 ; MIAMI [BEACH], FLORIDA, USA, 20 - 25 JUNE 2009, IEEE, PISCATAWAY, NJ, (20090620), ISBN 978-1-4244-3992-8, pages 2631 - 2638, XP031607077 [XP] 1-5,9-15 * section 3 * [I] 6-8 | [A] - KRYSTIAN MIKOLAJCZYK ET AL, "Scale & Affine Invariant Interest Point Detectors", INTERNATIONAL JOURNAL OF COMPUTER VISION, KLUWER ACADEMIC PUBLISHERS, BO, (20041001), vol. 60, no. 1, doi:10.1023/B:VISI.0000027790.02288.F2, ISSN 1573-1405, pages 63 - 86, XP019216425 [A] 1-15 * sections 2 and 3 * DOI: http://dx.doi.org/10.1023/B:VISI.0000027790.02288.f2 | [A] - SCHERER S ET AL, "The discriminatory power of ordinal measures towards a new coefficient", PROCEEDINGS OF THE 1999 IEEE COMPUTER SOCIETY CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, JUNE 23-25, 1999; FORT COLLINS, COLORADO, IEEE, THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC, US, (19990623), vol. 1, ISBN 978-0-7695-0149-9, pages 76 - 81, XP010347667 [A] 1-15 * sections 1 and 2 * * abstract * | International search | [A]US5510838 (YOMDIN YOSEF [IL], et al); | [A]US6408028 (MANJUNATH BANGALORE S [US], et al); | [A]US2005238198 (BROWN MATTHEW [CA], et al); | [A]US6975755 (BAUMBERG ADAM MICHAEL [GB]) |