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Extract from the Register of European Patents

EP About this file: EP2205993

EP2205993 - CDTD/CDZNTE RADIATION IMAGING DETECTOR AND HIGH/BIASING VOLTAGE MEANS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  25.08.2017
Database last updated on 06.07.2024
Most recent event   Tooltip20.07.2018Lapse of the patent in a contracting state
New state(s): MT		published on 22.08.2018  [2018/34]
Applicant(s)For all designated states
Oy Ajat Ltd.
Tekniikantie 4B
02150 Espoo / FI
[2013/21]
Former [2010/28]For all designated states
Oy Ajat Ltd.
Tietotie 3
02150 Espoo / FI
Inventor(s)01 / SPARTIOTIS, Konstantinos
Ersintie 7A2
FI-02750 Espoo / FI
02 / SHULMAN, Tom
Vanha Kuninkaantie 9 as. 1
FI-06100 Porvoo / FI
03 / PANTSAR, Tuomas
Ruutikellarintie 7A3
FI-02650 Espoo / FI
 [2010/28]
Representative(s)Laine IP Oy
Porkkalankatu 24
00180 Helsinki / FI
[N/P]
Former [2014/22]Seppo Laine Oy
Itämerenkatu 3 B
00180 Helsinki / FI
Former [2012/41]Tiilikainen, Jarkko Tapio, et al
Seppo Laine Oy Itämerenkatu 3 B
00180 Helsinki / FI
Former [2011/12]Arvela, Sakari Mikael, et al
Seppo Laine Oy Itämerenkatu 3 B
00180 Helsinki / FI
Former [2010/28]Westerholm, Carl Christian, et al
BORENIUS & Co Oy AB Tallberginkatu 2 A
00180 Helsinki / FI
Application number, filing date08845378.231.10.2008
[2010/28]
WO2008IB02925
Priority number, dateUS2007093349701.11.2007         Original published format: US 933497
[2010/28]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2009056967
Date:07.05.2009
Language:EN
[2009/19]
Type: A2 Application without search report 
No.:EP2205993
Date:14.07.2010
Language:EN
The application published by WIPO in one of the EPO official languages on 07.05.2009 takes the place of the publication of the European patent application.
[2010/28]
Type: B1 Patent specification 
No.:EP2205993
Date:19.10.2016
Language:EN
[2016/42]
Search report(s)International search report - published on:EP18.03.2010
ClassificationIPC:G01T1/24
[2010/28]
CPC:
H01L31/02005 (EP,US); H01L27/14636 (EP,US); H01L31/022408 (EP,US);
H01L31/0296 (EP,US); H01L2224/45014 (EP,US); H01L2224/45015 (EP,US);
H01L2224/45124 (EP,US); H01L2224/45139 (EP,US); H01L2224/45144 (EP,US);
H01L2224/45147 (EP,US); H01L2224/45169 (EP,US); H01L2224/4519 (EP,US);
H01L2224/4809 (EP,US); H01L2224/48091 (EP,US); H01L2224/85205 (EP,US);
H01L27/14676 (EP,US) (-)
C-Set:
H01L2224/45015, H01L2924/20753 (US,EP);
H01L2224/45015, H01L2924/20754 (US,EP);
H01L2224/45015, H01L2924/20755 (US,EP);
H01L2224/45015, H01L2924/20756 (US,EP);
H01L2224/45015, H01L2924/20757 (US,EP);
H01L2224/45015, H01L2924/20758 (US,EP);
H01L2224/45015, H01L2924/20759 (US,EP);
H01L2224/45015, H01L2924/2076 (EP,US);
H01L2224/45124, H01L2924/00015 (US,EP);
H01L2224/45139, H01L2924/00014 (US,EP);
H01L2224/45144, H01L2924/00014 (EP,US);
H01L2224/45147, H01L2924/00014 (EP,US);
H01L2224/45169, H01L2924/00014 (US,EP);
H01L2224/48091, H01L2924/00014 (US,EP)
(-)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2016/42]
Former [2010/28]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MT,  NL,  NO,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:CDTD/CDZNTE-STRAHLENABBILDUNGSDETEKTOR UND HOCH-/VORSPANNUNGSMITTEL DAFÜR[2010/28]
English:CDTD/CDZNTE RADIATION IMAGING DETECTOR AND HIGH/BIASING VOLTAGE MEANS[2010/28]
French:DÉTECTEUR À BASE DE CDTE/CDZNTE D'IMAGERIE PAR RAYONNEMENT ET MOYENS DE TENSION DE POLARISATION HAUTE TENSION[2010/28]
Entry into regional phase29.03.2010National basic fee paid 
29.03.2010Designation fee(s) paid 
29.03.2010Examination fee paid 
Examination procedure29.03.2010Examination requested  [2010/28]
26.08.2010Despatch of communication that the application is deemed to be withdrawn, reason: reply to the Extended European Search Report/Written Opinion of the International Searching Authority/International Preliminary Examination Report/Supplementary international search report not received in time
11.10.2010Amendment by applicant (claims and/or description)
06.06.2011Despatch of a communication from the examining division (Time limit: M06)
14.12.2011Reply to a communication from the examining division
21.01.2013Despatch of a communication from the examining division (Time limit: M06)
19.07.2013Reply to a communication from the examining division
15.04.2014Despatch of a communication from the examining division (Time limit: M06)
27.10.2014Reply to a communication from the examining division
09.06.2016Cancellation of oral proceeding that was planned for 29.06.2016
20.06.2016Communication of intention to grant the patent
29.06.2016Date of oral proceedings (cancelled)
09.09.2016Fee for grant paid
09.09.2016Fee for publishing/printing paid
09.09.2016Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  06.06.2011
Opposition(s)20.07.2017No opposition filed within time limit [2017/39]
Request for further processing for:11.10.2010Request for further processing filed
11.10.2010Full payment received (date of receipt of payment)
Fees paidRenewal fee
19.10.2010Renewal fee patent year 03
28.10.2011Renewal fee patent year 04
31.10.2012Renewal fee patent year 05
30.10.2013Renewal fee patent year 06
30.10.2014Renewal fee patent year 07
15.10.2015Renewal fee patent year 08
Opt-out from the exclusive  Tooltip
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU31.10.2008
AT19.10.2016
BE19.10.2016
CY19.10.2016
CZ19.10.2016
DK19.10.2016
EE19.10.2016
ES19.10.2016
HR19.10.2016
IT19.10.2016
LT19.10.2016
LV19.10.2016
MC19.10.2016
NL19.10.2016
PL19.10.2016
RO19.10.2016
SE19.10.2016
SI19.10.2016
SK19.10.2016
TR19.10.2016
IE31.10.2016
LU31.10.2016
MT31.10.2016
BG19.01.2017
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
[2018/33]
Former [2018/29]HU31.10.2008
AT19.10.2016
BE19.10.2016
CY19.10.2016
CZ19.10.2016
DK19.10.2016
EE19.10.2016
ES19.10.2016
HR19.10.2016
IT19.10.2016
LT19.10.2016
LV19.10.2016
MC19.10.2016
NL19.10.2016
PL19.10.2016
RO19.10.2016
SE19.10.2016
SI19.10.2016
SK19.10.2016
TR19.10.2016
IE31.10.2016
LU31.10.2016
BG19.01.2017
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
Former [2018/28]HU31.10.2008
AT19.10.2016
BE19.10.2016
CY19.10.2016
CZ19.10.2016
DK19.10.2016
EE19.10.2016
ES19.10.2016
HR19.10.2016
IT19.10.2016
LT19.10.2016
LV19.10.2016
MC19.10.2016
NL19.10.2016
PL19.10.2016
RO19.10.2016
SE19.10.2016
SI19.10.2016
SK19.10.2016
IE31.10.2016
LU31.10.2016
BG19.01.2017
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
Former [2017/51]AT19.10.2016
BE19.10.2016
CZ19.10.2016
DK19.10.2016
EE19.10.2016
ES19.10.2016
HR19.10.2016
IT19.10.2016
LT19.10.2016
LV19.10.2016
MC19.10.2016
NL19.10.2016
PL19.10.2016
RO19.10.2016
SE19.10.2016
SI19.10.2016
SK19.10.2016
IE31.10.2016
LU31.10.2016
BG19.01.2017
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
Former [2017/41]AT19.10.2016
BE19.10.2016
CZ19.10.2016
DK19.10.2016
EE19.10.2016
ES19.10.2016
HR19.10.2016
IT19.10.2016
LT19.10.2016
LV19.10.2016
MC19.10.2016
NL19.10.2016
PL19.10.2016
RO19.10.2016
SE19.10.2016
SK19.10.2016
LU31.10.2016
BG19.01.2017
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
Former [2017/38]AT19.10.2016
BE19.10.2016
CZ19.10.2016
DK19.10.2016
EE19.10.2016
ES19.10.2016
HR19.10.2016
IT19.10.2016
LT19.10.2016
LV19.10.2016
MC19.10.2016
NL19.10.2016
PL19.10.2016
RO19.10.2016
SE19.10.2016
SK19.10.2016
BG19.01.2017
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
Former [2017/37]AT19.10.2016
BE19.10.2016
CZ19.10.2016
DK19.10.2016
EE19.10.2016
ES19.10.2016
HR19.10.2016
IT19.10.2016
LT19.10.2016
LV19.10.2016
MC19.10.2016
NL19.10.2016
PL19.10.2016
RO19.10.2016
SE19.10.2016
SK19.10.2016
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
Former [2017/36]AT19.10.2016
BE19.10.2016
CZ19.10.2016
DK19.10.2016
EE19.10.2016
ES19.10.2016
HR19.10.2016
LT19.10.2016
LV19.10.2016
MC19.10.2016
NL19.10.2016
PL19.10.2016
RO19.10.2016
SE19.10.2016
SK19.10.2016
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
Former [2017/34]AT19.10.2016
BE19.10.2016
CZ19.10.2016
DK19.10.2016
ES19.10.2016
HR19.10.2016
LT19.10.2016
LV19.10.2016
MC19.10.2016
NL19.10.2016
PL19.10.2016
SE19.10.2016
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
Former [2017/33]AT19.10.2016
BE19.10.2016
DK19.10.2016
ES19.10.2016
HR19.10.2016
LT19.10.2016
LV19.10.2016
MC19.10.2016
NL19.10.2016
PL19.10.2016
SE19.10.2016
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
Former [2017/26]AT19.10.2016
BE19.10.2016
ES19.10.2016
HR19.10.2016
LT19.10.2016
LV19.10.2016
NL19.10.2016
PL19.10.2016
SE19.10.2016
NO19.01.2017
GR20.01.2017
IS19.02.2017
PT20.02.2017
Former [2017/23]AT19.10.2016
BE19.10.2016
HR19.10.2016
LT19.10.2016
LV19.10.2016
NL19.10.2016
PL19.10.2016
SE19.10.2016
NO19.01.2017
GR20.01.2017
IS19.02.2017
Former [2017/12]LV19.10.2016
BE31.10.2016
Cited inInternational search[X]JPH0461173  (NIPPON MINING CO) [X] 1,4,6,7,11,13 * abstract *;
 [A]DE4340389  (SIEMENS AG [DE]) [A] 18-20 * column 1, line 46 - line 52 *;
 [X]WO02067014  (REAL TIME RADIOGRAPHY LTD [IL], et al) [X] 1,6-8,11-17,20 * abstract * * page 3, line 17 - line 18 * * page 15, line 15 - line 21 *;
 [A]WO2005103761  (OBSCHESTVO S OGRANICHENNOI OTV [RU], et al) [A] 18-20 * abstract *;
 [X]WO2007096967  (SHIMADZU CORP [JP], et al) [X] 1,6-9,11,13-17,20 * abstract * * page 6, paragraph 24 * * page 9, paragraph 33 - page 10, paragraph 35 *;
 [X]  - GOSTILO V ET AL, "Technological aspects of development of pixel and strip detectors based on CdTe and CdZnTe", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - A:ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, ELSEVIER, AMSTERDAM, NL, (20010311), vol. 460, no. 1, ISSN 0168-9002, pages 27 - 34, XP004230589 [X] 1-3,6-8,10,11,15-19 * abstract * * page 29, column L, paragraph 3 * * page 30, column L, paragraph 4 *

DOI:   http://dx.doi.org/10.1016/S0168-9002(00)01091-3
 [PX]  - MEURIS A ET AL, "CALISTE 64, an innovative CdTe hard X-Ray micro-camera", NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, 2007. NSS '07. IEEE, IEEE, PI, (20080122), ISBN 978-1-4244-0922-8, pages 2551 - 2557, XP031206166 [PX] 1-3 * abstract * * page 2552, column L, paragraph A * * page 2553, column R, paragraph B * * page 2554, column R, paragraph IV *
ExaminationUS2005211879
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