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EP2172977
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EP About this file: EP2172977
| EP2172977 - Display device [Right-click to bookmark this link] | Status | The application has been refused Status updated on 05.12.2019 Database last updated on 02.11.2024 | Most recent event Tooltip | 05.12.2019 | Refusal of application | published on 01.01.2020 [2020/01] | Applicant(s) | For all designated states Semiconductor Energy Laboratory Co., Ltd. 398, Hase Atsugi-shi, Kanagawa 243-0036 / JP | [N/P] |
| Former [2010/14] | For all designated states SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 398, Hase Atsugi-shi, Kanagawa 243-0036 / JP | Inventor(s) | 01 /
Yamazaki, Shunpei c/o Semiconductor Energy Laboratory Co., Ltd., 398, Hase Atsugi-shi Kanagawa 243-0036 / JP | 02 /
Akimoto, Kengo c/o Semiconductor Energy Laboratory Co., Ltd., 398, Hase Atsugi-shi Kanagawa 243-0036 / JP | 03 /
Umezaki, Atsushi c/o Semiconductor Energy Laboratory Co., Ltd., 398, Hase Atsugi-shi Kanagawa 243-0036 / JP | [2010/14] | Representative(s) | Grünecker Patent- und Rechtsanwälte PartG mbB Leopoldstraße 4 80802 München / DE | [N/P] |
| Former [2010/14] | Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät Leopoldstrasse 4 80802 München / DE | Application number, filing date | 09170486.6 | 17.09.2009 | [2010/14] | Priority number, date | JP20080259031 | 03.10.2008 Original published format: JP 2008259031 | [2010/14] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP2172977 | Date: | 07.04.2010 | Language: | EN | [2010/14] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 03.03.2010 | Classification | IPC: | H01L29/786, H01L21/77 | [2010/14] | CPC: |
H01L27/1225 (EP,KR,US);
H01L29/7869 (EP,KR,US);
H01L27/1214 (KR);
H01L27/124 (EP,KR,US);
H01L29/24 (US);
H01L29/42356 (US);
H01L29/78606 (US)
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| Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR [2010/14] | Extension states | AL | Not yet paid | BA | Not yet paid | RS | Not yet paid | Title | German: | Anzeigevorrichtung | [2010/14] | English: | Display device | [2010/14] | French: | Dispositif d'affichage | [2010/14] | Examination procedure | 25.09.2010 | Examination requested [2010/45] | 29.09.2010 | Amendment by applicant (claims and/or description) | 29.10.2010 | Despatch of a communication from the examining division (Time limit: M04) | 01.03.2011 | Reply to a communication from the examining division | 11.05.2012 | Despatch of a communication from the examining division (Time limit: M04) | 18.09.2012 | Reply to a communication from the examining division | 20.01.2015 | Date of oral proceedings | 06.03.2015 | Despatch of communication that the application is refused, reason: substantive examination [2020/01] | 06.03.2015 | Minutes of oral proceedings despatched | 20.09.2019 | Application refused, date of legal effect [2020/01] | Appeal following examination | 13.05.2015 | Appeal received No. T1988/15 | 16.07.2015 | Statement of grounds filed | 20.09.2019 | Result of appeal procedure: appeal of the applicant was rejected | 20.09.2019 | Date of oral proceedings | 25.09.2019 | Minutes of oral proceedings despatched | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 29.10.2010 | Fees paid | Renewal fee | 29.09.2011 | Renewal fee patent year 03 | 12.09.2012 | Renewal fee patent year 04 | 12.09.2013 | Renewal fee patent year 05 | 12.09.2014 | Renewal fee patent year 06 | 11.09.2015 | Renewal fee patent year 07 | 13.09.2016 | Renewal fee patent year 08 | 12.09.2017 | Renewal fee patent year 09 | 11.09.2018 | Renewal fee patent year 10 | 13.09.2019 | Renewal fee patent year 11 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]US2002043662 (YAMAZAKI SHUNPEI [JP], et al); | [A]US2004051823 (CHOI WOO HYUK [KR]); | [A]US2005162579 (JEONG YOUNG-SIK [KR], et al); | [Y]US2007152217 (LAI CHIH-MING [TW], et al) | Examination | US2002130363 | by applicant | JP2007096055 | JP2007123861 | JP2008259031 |