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EP2343564
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EP About this file: EP2343564
| EP2343564 - Built-in chip self-test apparatus and method [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 29.06.2012 Database last updated on 10.03.2026 | Most recent event Tooltip | 29.06.2012 | Application deemed to be withdrawn | published on 01.08.2012 [2012/31] | Applicant(s) | For all designated states NXP B.V. High Tech Campus 60 5656 AG Eindhoven / NL | [2011/28] | Inventor(s) | 01 /
Lefevre, François c/o NXP B.V., High Tech Campus 32 5656 AE Eindhoven / NL | [2011/28] | Representative(s) | Krott, Michel NXP B.V. Intellectual Property & Licensing High Tech Campus 60 5656 AG Eindhoven / NL | [N/P] |
| Former [2011/28] | Krott, Michel NXP B.V. IP & Licensing Department High Tech Campus 60 5656 AG Eindhoven / NL | Application number, filing date | 09290989.4 | 23.12.2009 | [2011/28] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP2343564 | Date: | 13.07.2011 | Language: | EN | [2011/28] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 09.06.2010 | Classification | IPC: | G01R31/3187 | [2011/28] | CPC: |
G01R31/2822 (EP);
G01R31/3187 (EP)
| Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR [2011/28] | Extension states | AL | Not yet paid | BA | Not yet paid | RS | Not yet paid | Title | German: | Integierte Chip-Selbttestvorrichtung und -verfahren | [2011/28] | English: | Built-in chip self-test apparatus and method | [2011/28] | French: | Appareil et procédé de test automatique à puce intégrée | [2011/28] | Examination procedure | 14.01.2012 | Application deemed to be withdrawn, date of legal effect [2012/31] | 21.02.2012 | Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time [2012/31] | Fees paid | Penalty fee | Additional fee for renewal fee | 31.12.2011 | 03 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X] US5625288 (SNYDER ERIC S et al.) | [X] US4864639 (DAPORE MARK A et al.) | [X] US5202626 (PHAM PHUC C et al.) [X] 1-17 * abstract * * column 1, line 56 - column 2, line 6 * * column 3, line 3 - column 5, line 18 * * column 6, lines 14-45 * | [X] US5689266 (STELLING DESI D et al.) [X] 1-17 * abstract * * column 1, line 63 - column 3, line 44 * * column 4, line 12 - column 6, line 37 * | by applicant | US2007033474 | WO2006103617 |