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Extract from the Register of European Patents

EP About this file: EP2266310

EP2266310 - CMOS IMAGE SENSOR WITH IMPROVED FILL-FACTOR AND REDUCED DARK CURRENT [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  20.05.2016
Database last updated on 13.07.2024
Most recent event   Tooltip17.08.2018Lapse of the patent in a contracting state
New state(s): BG		published on 19.09.2018  [2018/38]
Applicant(s)For all designated states
BAE Systems Imaging Solutions Inc.
1841 Zanker Road, Suite 50
San Jose, CA 95112 / US
[2015/27]
Former [2010/52]For all designated states
Fairchild Imaging, INC.
1801 McCarthy Blvd.
Milpitas, CA 95035 / US
Inventor(s)01 / LIU, XinQiao
2400 W. El Camino Real, 510
Mountain View, CA 94040Mountain View, CA 91040 / US
 [2010/52]
Representative(s)Dolleymores
9 Rickmansworth Road
Watford, Hertfordshire WD18 0JU / GB
[N/P]
Former [2015/29]Knights, Rupert, et al
Saunders & Dolleymore LLP
9 Rickmansworth Road
Watford, Hertfordshire WD18 0JU / GB
Former [2014/15]Knights, Rupert, et al
Saunders & Dolleymore LLP 9 Rickmansworth Road
Watford WD18 0JU / GB
Former [2010/52]Horton, Andrew Robert Grant, et al
Bowles Horton Felden House Dower Mews High Street
Berkhamsted, Hertfordshire HP4 2BL / GB
Application number, filing date09721232.804.03.2009
[2010/52]
WO2009US35943
Priority number, dateUS2008004990117.03.2008         Original published format: US 49901
[2010/52]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2009117245
Date:24.09.2009
Language:EN
[2009/39]
Type: A2 Application without search report 
No.:EP2266310
Date:29.12.2010
Language:EN
The application published by WIPO in one of the EPO official languages on 24.09.2009 takes the place of the publication of the European patent application.
[2010/52]
Type: B1 Patent specification 
No.:EP2266310
Date:15.07.2015
Language:EN
[2015/29]
Search report(s)International search report - published on:KR17.12.2009
(Supplementary) European search report - dispatched on:EP06.12.2013
ClassificationIPC:H04N5/335, H01L27/146
[2010/52]
CPC:
H01L27/14603 (EP,US); H01L27/1463 (EP,US); H01L27/14641 (EP,US);
H01L27/14643 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2015/29]
Former [2010/52]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:CMOS-BILDSENSOR MIT VERBESSERTEM FÜLLFAKTOR UND REDUZIERTEM DUNKELSTROM[2010/52]
English:CMOS IMAGE SENSOR WITH IMPROVED FILL-FACTOR AND REDUCED DARK CURRENT[2010/52]
French:CAPTEUR D'IMAGE CMOS AVEC FACTEUR DE REMPLISSAGE AMÉLIORÉ ET COURANT D'OBSCURITÉ RÉDUIT[2010/52]
Entry into regional phase18.10.2010National basic fee paid 
18.10.2010Search fee paid 
18.10.2010Designation fee(s) paid 
18.10.2010Examination fee paid 
Examination procedure18.10.2010Examination requested  [2010/52]
03.07.2014Amendment by applicant (claims and/or description)
27.03.2015Communication of intention to grant the patent
04.06.2015Fee for grant paid
04.06.2015Fee for publishing/printing paid
04.06.2015Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  27.03.2015
Opposition(s)18.04.2016No opposition filed within time limit [2016/25]
Fees paidRenewal fee
21.03.2011Renewal fee patent year 03
19.03.2012Renewal fee patent year 04
27.03.2013Renewal fee patent year 05
27.03.2014Renewal fee patent year 06
27.03.2015Renewal fee patent year 07
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU04.03.2009
AT15.07.2015
BG15.07.2015
CY15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
IS15.07.2015
LT15.07.2015
LV15.07.2015
MC15.07.2015
MK15.07.2015
PL15.07.2015
RO15.07.2015
SI15.07.2015
SK15.07.2015
TR15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
IE04.03.2016
LU04.03.2016
CH31.03.2016
LI31.03.2016
MT31.03.2016
[2018/38]
Former [2018/31]HU04.03.2009
AT15.07.2015
CY15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
IS15.07.2015
LT15.07.2015
LV15.07.2015
MC15.07.2015
MK15.07.2015
PL15.07.2015
RO15.07.2015
SI15.07.2015
SK15.07.2015
TR15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
IE04.03.2016
LU04.03.2016
CH31.03.2016
LI31.03.2016
MT31.03.2016
Former [2018/30]HU04.03.2009
AT15.07.2015
CY15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
IS15.07.2015
LT15.07.2015
LV15.07.2015
MC15.07.2015
MK15.07.2015
MT15.07.2015
PL15.07.2015
RO15.07.2015
SI15.07.2015
SK15.07.2015
TR15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
IE04.03.2016
LU04.03.2016
CH31.03.2016
LI31.03.2016
Former [2018/28]HU04.03.2009
AT15.07.2015
CY15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
IS15.07.2015
LT15.07.2015
LV15.07.2015
MC15.07.2015
MK15.07.2015
MT15.07.2015
PL15.07.2015
RO15.07.2015
SI15.07.2015
SK15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
IE04.03.2016
LU04.03.2016
CH31.03.2016
LI31.03.2016
Former [2017/47]AT15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
IS15.07.2015
LT15.07.2015
LV15.07.2015
MC15.07.2015
MT15.07.2015
PL15.07.2015
RO15.07.2015
SI15.07.2015
SK15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
IE04.03.2016
LU04.03.2016
CH31.03.2016
LI31.03.2016
Former [2017/07]AT15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
IS15.07.2015
LT15.07.2015
LV15.07.2015
MC15.07.2015
PL15.07.2015
RO15.07.2015
SI15.07.2015
SK15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
IE04.03.2016
LU04.03.2016
CH31.03.2016
LI31.03.2016
Former [2016/49]AT15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
IS15.07.2015
LT15.07.2015
LV15.07.2015
MC15.07.2015
PL15.07.2015
RO15.07.2015
SI15.07.2015
SK15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
LU04.03.2016
Former [2016/47]AT15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
IS15.07.2015
LT15.07.2015
LV15.07.2015
PL15.07.2015
RO15.07.2015
SI15.07.2015
SK15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
LU04.03.2016
Former [2016/36]AT15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
IS15.07.2015
LT15.07.2015
LV15.07.2015
PL15.07.2015
RO15.07.2015
SI15.07.2015
SK15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
Former [2016/31]AT15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
IS15.07.2015
LT15.07.2015
LV15.07.2015
PL15.07.2015
RO15.07.2015
SK15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
Former [2016/23]AT15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
LT15.07.2015
LV15.07.2015
PL15.07.2015
RO15.07.2015
SK15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
Former [2016/22]AT15.07.2015
CZ15.07.2015
DK15.07.2015
EE15.07.2015
HR15.07.2015
LT15.07.2015
LV15.07.2015
PL15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
Former [2016/20]AT15.07.2015
DK15.07.2015
HR15.07.2015
LT15.07.2015
LV15.07.2015
PL15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
Former [2016/11]AT15.07.2015
HR15.07.2015
LT15.07.2015
LV15.07.2015
PL15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
Former [2016/10]HR15.07.2015
LT15.07.2015
LV15.07.2015
PL15.07.2015
NO15.10.2015
GR16.10.2015
PT16.11.2015
Former [2016/09]LT15.07.2015
LV15.07.2015
NO15.10.2015
GR16.10.2015
Former [2016/08]LT15.07.2015
NO15.10.2015
Former [2016/07]LT15.07.2015
Documents cited:Search[XI]US2007210239  (LEE SEOK-HA [KR], et al) [X] 1-4,8,9 * paragraph [0088] - paragraph [0096]; figures 2,3,5,6,8 * [I] 6,10,11;
 [X]US2005269604  (KOIZUMI TORU [JP], et al) [X] 1 * paragraphs [0047] - [0059]; figures 1-3,11,12 *;
 [A]US2006044439  (HIYAMA HIROKI [JP], et al) [A] 1-11 * paragraph [0034] - paragraph [0039]; figures 2-4,7,8 *
International search[X]US2007210239  (LEE SEOK-HA [KR], et al);
 [A]US2006208163  (MANABE SOHEI [US], et al);
 [A]US2007045679  (MCKEE JEFFREY A [US], et al);
 [A]KR20040080337  (MATSUSHITA ELECTRIC IND CO LTD)
by applicantUS2007210239
 US2005269604
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.