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Extract from the Register of European Patents

EP About this file: EP2382664

EP2382664 - EMBEDDED MEMORY CELL AND METHOD OF MANUFACTURING SAME [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  01.05.2018
Database last updated on 12.07.2024
FormerExamination is in progress
Status updated on  22.02.2017
Most recent event   Tooltip17.08.2018Refusal of applicationpublished on 19.09.2018  [2018/38]
Applicant(s)For all designated states
Intel Corporation
2200 Mission College Boulevard
Santa Clara, CA 95054 / US
[N/P]
Former [2011/44]For all designated states
Intel Corporation
2200 Mission College Boulevard
Santa Clara, CA 95052 / US
Inventor(s)01 / KAVALIEROS, Jack T.
14260 NW Belle Court
Portland Oregon 97229 / US
02 / MUKHERJEE, Niloy
7732 SW Carrollon Dr.
Beaverton Oregon 97007 / US
03 / DEWEY, Gilbert
920 SE 58th Ave.
Hillsboro Oregon 97123 / US
04 / SOMASEKHAR, Dinesh
621 NW 112th Avenue
Portland Oregon 97229 / US
05 / DOYLE, Brian S.
11156 NW Montreux Lane
Portland Oregon 97229 / US
 [2011/44]
Representative(s)Rummler, Felix, et al
Maucher Jenkins
Seventh Floor Offices
Artillery House
11-19 Artillery Row
London SW1P 1RT / GB
[N/P]
Former [2011/44]Rummler, Felix, et al
R.G.C. Jenkins & Co 26 Caxton Street
London SW1H 0RJ / GB
Application number, filing date09836961.417.12.2009
WO2009US68524
Priority number, dateUS2008031910130.12.2008         Original published format: US 319101
[2011/44]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2010078051
Date:08.07.2010
Language:EN
[2010/27]
Type: A2 Application without search report 
No.:EP2382664
Date:02.11.2011
Language:EN
The application published by WIPO in one of the EPO official languages on 08.07.2010 takes the place of the publication of the European patent application.
[2011/44]
Search report(s)International search report - published on:KR02.09.2010
(Supplementary) European search report - dispatched on:EP27.11.2014
ClassificationIPC:H01L27/108, H01L21/8242, H01L49/02, H01L29/66
[2015/01]
CPC:
H01L29/66181 (EP,US); H10B12/00 (KR); H01L28/90 (EP,US);
H01L29/66666 (EP,US); H01L29/7827 (EP,US); H10B12/038 (EP,US);
H10B12/0385 (EP,US); H10B12/0387 (EP,US); H10B12/053 (EP,US);
H10B12/373 (EP,US); H10B99/00 (KR) (-)
Former IPC [2011/44]H01L27/108, H01L21/8242
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   SM,   TR 
TitleGerman:EINGEBETTETE SPEICHERZELLE UND HERSTELLUNGSVERFAHREN DAFÜR[2011/44]
English:EMBEDDED MEMORY CELL AND METHOD OF MANUFACTURING SAME[2011/44]
French:CELLULE DE MÉMOIRE INTÉGRÉE ET PROCÉDÉ DE FABRICATION DE CELLE-CI[2011/44]
Entry into regional phase29.07.2011National basic fee paid 
29.07.2011Search fee paid 
29.07.2011Designation fee(s) paid 
29.07.2011Examination fee paid 
Examination procedure29.07.2011Examination requested  [2011/44]
30.01.2015Amendment by applicant (claims and/or description)
30.06.2015Despatch of a communication from the examining division (Time limit: M06)
11.01.2016Reply to a communication from the examining division
12.10.2016Despatch of a communication from the examining division (Time limit: M04)
22.02.2017Reply to a communication from the examining division
09.04.2018Cancellation of oral proceeding that was planned for 03.05.2018
02.05.2018Despatch of communication that the application is refused, reason: substantive examination [2018/38]
03.05.2018Date of oral proceedings (cancelled)
12.05.2018Application refused, date of legal effect [2018/38]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  30.06.2015
Fees paidRenewal fee
12.12.2011Renewal fee patent year 03
11.12.2012Renewal fee patent year 04
12.12.2013Renewal fee patent year 05
11.12.2014Renewal fee patent year 06
10.12.2015Renewal fee patent year 07
13.12.2016Renewal fee patent year 08
12.12.2017Renewal fee patent year 09
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Documents cited:Search[XI]EP0236089  (FUJITSU LTD [JP]) [X] 1,2,5,7,10 * page 6, line 36 - page 13, line 18; figures 2-9 * [I] 3,4,8,9,12-15;
 [XI]US2006151822  (GOVINDARAJAN SHRINIVAS [US]) [X] 1,5-7,10,11 * paragraphs [0025] - [0070]; figures 2-8 *[I] 2
International search[A]KR20020009418  (IBM);
 [A]KR20040079523  (SAMSUNG ELECTRONICS CO LTD);
 [A]KR20080048244  (SAMSUNG ELECTRONICS CO LTD [KR]);
 [A]KR100843143B  (SAMSUNG ELECTRONICS CO LTD [KR])
Examination   - Karl W. Böer, Survey of Semiconductor Physics, Volume II: Barriers, Junctions, Surfaces and Devices, New York, Van Nostrand Reinhold, (1992), pages 280 - 289, Chapter 3:Semiconductor Interfaces and Contacts, ISBN 0-442-23793-6
by applicantEP0236089
 US2006151822
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.