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Extract from the Register of European Patents

EP About this file: EP2175487

EP2175487 - Semiconductor device [Right-click to bookmark this link]
Former [2010/15]Semiconductor device and method for fabricating the same
[2014/47]
StatusNo opposition filed within time limit
Status updated on  15.01.2016
Database last updated on 21.09.2024
Most recent event   Tooltip15.01.2016No opposition filed within time limitpublished on 17.02.2016  [2016/07]
Applicant(s)For all designated states
Socionext Inc.
2-10-23 Shin-Yokohama, Kohoku-ku
Yokohama-shi, Kanagawa 222-0033 / JP
[2015/24]
Former [2015/14]For all designated states
Fujitsu Semiconductor Limited
2-10-23 Shin-yokohama
Kohoku-ku, Yokohama-shi
Kanagawa 222-0033 / JP
Former [2010/15]For all designated states
Fujitsu Microelectronics Limited
7-1, Nishi-Shinjuku 2-chome Shinjuku-ku
Tokyo 163-0722 / JP
Inventor(s)01 / Watanabe, Kenichi
c/o Fujitsu Limited
1-1, Kamikodanaka 4-chome
Nakahara-ku, Kawasaki-shi
Kanagawa 211-8588 / JP
 [2015/11]
Former [2010/15]01 / Watanabe, Kenichi
c/o Fujitsu Limited 1-1, Kamikodanaka 4-chome Nakahara-ku, Kawasaki-shi
Kanagawa 211-8588 / JP
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastraße 30
81925 München / DE
[2015/11]
Former [2010/15]HOFFMANN EITLE
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München / DE
Application number, filing date10000804.424.07.2003
[2010/15]
Priority number, dateJP2002022334331.07.2002         Original published format: JP 2002223343
[2010/15]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP2175487
Date:14.04.2010
Language:EN
[2010/15]
Type: A3 Search report 
No.:EP2175487
Date:18.04.2012
Language:EN
[2012/16]
Type: B1 Patent specification 
No.:EP2175487
Date:11.03.2015
Language:EN
[2015/11]
Type: B8 Corrected title page of specification 
No.:EP2175487
Date:06.05.2015
[2015/19]
Search report(s)(Supplementary) European search report - dispatched on:EP15.03.2012
ClassificationIPC:H01L23/522, H01L23/532, H01L23/528
[2014/47]
CPC:
H01L23/522 (EP,US); H01L27/04 (KR); H01L21/76877 (US);
H01L21/76804 (US); H01L21/76843 (US); H01L23/481 (US);
H01L23/485 (US); H01L23/5226 (EP,US); H01L23/528 (US);
H01L23/5283 (US); H01L23/53204 (US); H01L23/53223 (US);
H01L23/53228 (US); H01L23/53266 (US); H01L23/5329 (EP,US);
H01L23/562 (US); H01L23/58 (US); H01L23/585 (EP,US);
H01L29/0607 (US); H01L29/0611 (US); H01L29/0619 (US);
H01L23/5227 (EP,US); H01L23/53295 (EP,US); H01L2924/0002 (EP,US) (-)
C-Set:
H01L2924/0002, H01L2924/00 (EP,US)
Former IPC [2010/15]H01L23/522, H01L23/532
Designated contracting statesDE,   FR,   IT [2010/15]
TitleGerman:Halbleitervorrichtung[2014/47]
English:Semiconductor device[2014/47]
French:Dispositif à semi-conducteur[2014/47]
Former [2010/15]Halbleitervorrichtung und Herstellungsverfahren
Former [2010/15]Semiconductor device and method for fabricating the same
Former [2010/15]Dispositif à semi-conducteur et son procédé de fabrication
Examination procedure26.09.2012Amendment by applicant (claims and/or description)
27.09.2012Examination requested  [2012/46]
23.10.2014Communication of intention to grant the patent
27.01.2015Fee for grant paid
27.01.2015Fee for publishing/printing paid
27.01.2015Receipt of the translation of the claim(s)
Parent application(s)   TooltipEP03016553.4  / EP1387404
Divisional application(s)EP15150440.4  / EP2863430
EP15150443.8  / EP2863431
EP17156454.5  / EP3208846
The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued (EP20030016553) is  22.02.2008
Opposition(s)14.12.2015No opposition filed within time limit [2016/07]
Fees paidRenewal fee
27.01.2010Renewal fee patent year 03
27.01.2010Renewal fee patent year 04
27.01.2010Renewal fee patent year 05
27.01.2010Renewal fee patent year 06
27.01.2010Renewal fee patent year 07
29.07.2010Renewal fee patent year 08
28.07.2011Renewal fee patent year 09
14.05.2012Renewal fee patent year 10
02.05.2013Renewal fee patent year 11
06.05.2014Renewal fee patent year 12
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Documents cited:Search[A]JPH0389548  (FUJITSU LTD, et al);
 [A]JPH05175198  (KAWASAKI STEEL CO);
 [A]JPH1154705  (NEC CORP);
 [A]JP2000124403  (NEC CORP);
by applicantJP2000124403
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.