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Extract from the Register of European Patents

EP About this file: EP2276089

EP2276089 - Method for reducing moisture contamination in a top-emitting oled using a dessicant [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  25.08.2017
Database last updated on 02.09.2024
Most recent event   Tooltip25.08.2017No opposition filed within time limitpublished on 27.09.2017  [2017/39]
Applicant(s)For all designated states
Global OLED Technology LLC
1209 Orange Street
Wilmington, Delaware 19801 / US
[2011/03]
Inventor(s)01 / Boroson, Michael Louis
281 Grosvenor Road
Rochester, New York 14610 / US
 [2011/03]
Representative(s)Ter Meer Steinmeister & Partner
Patentanwälte mbB
Nymphenburger Straße 4
80335 München / DE
[2016/42]
Former [2013/20]Ter Meer Steinmeister & Partner
Patentanwälte
Mauerkircherstrasse 45
81679 München / DE
Former [2011/03]TER MEER - STEINMEISTER & PARTNER GbR
Patentanwälte Mauerkircherstrasse 45
81679 München / DE
Application number, filing date10012476.713.07.2005
[2011/03]
Priority number, dateUS2004089990227.07.2004         Original published format: US 899902
[2011/03]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP2276089
Date:19.01.2011
Language:EN
[2011/03]
Type: A3 Search report 
No.:EP2276089
Date:25.04.2012
Language:EN
[2012/17]
Type: B1 Patent specification 
No.:EP2276089
Date:19.10.2016
Language:EN
[2016/42]
Search report(s)(Supplementary) European search report - dispatched on:EP23.03.2012
ClassificationIPC:H01L51/52
[2011/03]
CPC:
H10K59/871 (EP,KR); H05B33/04 (KR); H10K50/841 (US);
H10K50/846 (US); H10K59/874 (EP,KR); H10K2102/3026 (EP,US);
H10K71/851 (EP,US); H10K85/324 (EP,US); H10K85/341 (EP,US);
H10K85/342 (EP,US); H10K85/351 (EP,US); H10K85/615 (EP,US);
H10K85/631 (EP,US); H10K85/649 (EP,US); Y10T156/1052 (EP,US) (-)
Designated contracting statesDE,   GB,   NL [2016/42]
Former [2011/03]DE,  GB,  NL 
TitleGerman:Verfahren zur Reduzierung der Feuchtigkeitskontamination in einer top-emittierenden OLED mit einem Trockenmittel[2016/26]
English:Method for reducing moisture contamination in a top-emitting oled using a dessicant[2011/03]
French:Méthode afin de reduire la contamination par l'humidité d'un dispositif OLED à émission par le haut en utilisant un dessiccateur[2016/26]
Former [2011/03]Desikkationsmittel für oben emittierende OLED
Former [2011/03]Absorbeur d'humidité pour un dispositif OLED à émission par le haut
Examination procedure04.10.2010Examination requested  [2011/03]
20.06.2012Amendment by applicant (claims and/or description)
06.09.2012Despatch of a communication from the examining division (Time limit: M04)
04.01.2013Reply to a communication from the examining division
03.07.2015Despatch of a communication from the examining division (Time limit: M04)
03.11.2015Reply to a communication from the examining division
08.06.2016Communication of intention to grant the patent
09.09.2016Fee for grant paid
09.09.2016Fee for publishing/printing paid
09.09.2016Receipt of the translation of the claim(s)
Parent application(s)   TooltipEP05775481.4  / EP1779446
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued (EP20050775481) is  22.01.2008
Opposition(s)20.07.2017No opposition filed within time limit [2017/39]
Fees paidRenewal fee
04.10.2010Renewal fee patent year 03
04.10.2010Renewal fee patent year 04
04.10.2010Renewal fee patent year 05
04.10.2010Renewal fee patent year 06
25.07.2011Renewal fee patent year 07
13.07.2012Renewal fee patent year 08
10.07.2013Renewal fee patent year 09
14.07.2014Renewal fee patent year 10
10.07.2015Renewal fee patent year 11
11.07.2016Renewal fee patent year 12
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]JPS6025192  (ISE ELECTRONICS CORP);
 [YD]US6470594  (BOROSON MICHAEL L [US], et al);
 [X]US2003127974  (MIYAZAWA TAKASHI [JP]);
 [A]EP1437777  (SEMICONDUCTOR ENERGY LAB [JP]);
 [AP]JP2004303643  (SEIKO EPSON CORP)
by applicantUS3180730
 US3567450
 US3658520
 US4356429
 US4539507
 US4720432
 US4769292
 US4768292
 US4885211
 US5061569
 US5141671
 US5150006
 US5151629
 US5276380
 US5294870
 US5405709
 US5484922
 US5552678
 EP0732868
 US5593788
 US5645948
 US5683823
 US5755999
 US5776623
 WO9855561
 EP0891121
 US5882761
 US5928802
 US5935721
 US5935720
 US6020078
 WO0018851
 EP1009041
 US6097147
 EP1029909
 WO0057676
 WO0070655
 US6194119
 US6208075
 US6226890
 US6237529
 WO0139234
 WO0141512
 WO0193642
 WO0215645
 US6413656
 US2002100906
 US2002117662
 US2002121638
 EP1239526
 EP1238981
 WO02071813
 US6451455
 US6451415
 WO02074015
 EP1244155
 US6458475
 US6470594
 US2002197511
 US2003017361
 US6515298
 US2003040627
 JP2003059667
 JP2003073387
 JP2003073388
 JP2003073665
 US2003054198
 US2003059646
 US6544916
 US2003068528
 US2003068526
 US2003068535
 US2003072964
 US6573651
 US2003110981
 US2003124381
 US6590157
 US6594916
 US2003141809
 US2003175553
 US6656609
 US19970957851
 US20030693121
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.