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Extract from the Register of European Patents

EP About this file: EP2278752

EP2278752 - Device and method for testing a chip on which a cryptographic procedure is implemented [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  06.01.2012
Database last updated on 16.11.2024
Most recent event   Tooltip06.01.2012Application deemed to be withdrawnpublished on 08.02.2012  [2012/06]
Applicant(s)For all designated states
SIEMENS AKTIENGESELLSCHAFT
Werner-von-Siemens-Str. 1
DE-80333 München / DE
[N/P]
Former [2011/04]For all designated states
SIEMENS AKTIENGESELLSCHAFT
Wittelsbacherplatz 2
80333 München / DE
Inventor(s)01 / Dr. Braun, Michael
Kreuzerweg 23
81825, München / DE
02 / Kargl, Anton
Simrockstr. 40 A
80997, München / DE
 [2011/04]
Application number, filing date10160598.821.04.2010
[2011/04]
Priority number, dateDE2009103114530.06.2009         Original published format: DE102009031145
[2011/04]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP2278752
Date:26.01.2011
Language:DE
[2011/04]
Search report(s)(Supplementary) European search report - dispatched on:EP04.10.2010
ClassificationIPC:H04L9/30, G01R31/3193
[2011/04]
CPC:
H04L9/3066 (EP); H04L2209/08 (EP); H04L2209/125 (EP);
H04L2209/26 (EP)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   SM,   TR [2011/04]
Extension statesALNot yet paid
BANot yet paid
MENot yet paid
RSNot yet paid
TitleGerman:Vorrichtung und Verfahren zum Prüfen eines Chips, auf dem ein kryptographisches Verfahren implementiert ist[2011/04]
English:Device and method for testing a chip on which a cryptographic procedure is implemented[2011/04]
French:Dispositif et procédé de contrôle d'une puce sur laquelle un procédé cryptographique est implanté[2011/04]
Examination procedure27.07.2011Application deemed to be withdrawn, date of legal effect  [2012/06]
05.09.2011Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2012/06]
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Documents cited:Search[A]US2005066168  (WALMSLEY SIMON ROBERT [AU]) [A] 1-21 * abstract * * paragraphs [0336] - [0367] *;
 [A]US5991898  (RAJSKI JANUSZ [US], et al) [A] 1-21 * abstract * * column 3, line 65 - column 4, line 41 *;
 [A]  - HAFNER K ET AL, "DESIGN AND TEST OF AN INTEGRATED CRYPTOCHIP", IEEE DESIGN & TEST OF COMPUTERS, IEEE SERVICE CENTER, NEW YORK, NY, US LNKD- DOI:10.1109/54.107201, (19911201), vol. 8, no. 4, ISSN 0740-7475, pages 6 - 17, XP000263447 [A] 1-21 * the whole document *

DOI:   http://dx.doi.org/10.1109/54.107201
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.