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Extract from the Register of European Patents

EP About this file: EP2395124

EP2395124 - THIN FILM COMPRISING TITANIUM OXIDE AS MAJOR COMPONENT AND SINTERED SPUTTERING TARGET COMPRISING TITANIUM OXIDE AS MAJOR COMPONENT [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  04.11.2015
Database last updated on 11.09.2024
Most recent event   Tooltip04.11.2015Application deemed to be withdrawnpublished on 02.12.2015  [2015/49]
Applicant(s)For all designated states
JX Nippon Mining & Metals Corporation
6-3, Otemachi 2-chome Chiyoda-ku
Tokyo 100-8164 / JP
[2011/50]
Inventor(s)01 / TAKAMI, Hideo
c/o JX Nippon Mining & Metals Corporation
187-4, Usuba
Hanakawa-cho
Kitaibaraki-shi Ibaraki 319-1535 / JP
02 / YAHAGI, Masataka
c/o JX Nippon Mining & Metals Corporation
187-4, Usuba
Hanakawa-cho
Kitaibaraki-shi Ibaraki 319-1535 / JP
 [2011/50]
Representative(s)Hoarton, Lloyd Douglas Charles, et al
Forresters IP LLP
Skygarden
Erika-Mann-Strasse 11
80636 München / DE
[N/P]
Former [2012/13]Hoarton, Lloyd Douglas Charles, et al
Forrester & Boehmert
SkyGarden
Erika-Mann-Strasse 11
80636 München / DE
Former [2011/50]Hoarton, Lloyd Douglas Charles
Forrester & Boehmert Pettenkoferstrasse 20-22
80336 Munich / DE
Application number, filing date10738471.129.01.2010
WO2010JP51232
Priority number, dateJP2009002506405.02.2009         Original published format: JP 2009025064
JP2009008965302.04.2009         Original published format: JP 2009089653
[2011/50]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2010090137
Date:12.08.2010
Language:JA
[2010/32]
Type: A1 Application with search report 
No.:EP2395124
Date:14.12.2011
Language:EN
[2011/50]
Search report(s)International search report - published on:JP12.08.2010
(Supplementary) European search report - dispatched on:EP09.09.2014
ClassificationIPC:C23C14/08, C04B35/46, C23C14/34, G11B7/24, G11B7/254, G11B7/257
[2011/50]
CPC:
G11B7/2545 (EP,US); C04B35/46 (EP,US); C23C14/083 (EP,US);
C23C14/3414 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   SM,   TR [2011/50]
TitleGerman:DÜNNFILM MIT TITANIUMOXID ALS HAUPTKOMPONENTE UND GESINTERTES SPUTTERTARGET UMFASSEND TITANIUMOXID ALS HAUPTKOMPONENTE[2011/50]
English:THIN FILM COMPRISING TITANIUM OXIDE AS MAJOR COMPONENT AND SINTERED SPUTTERING TARGET COMPRISING TITANIUM OXIDE AS MAJOR COMPONENT[2011/50]
French:COUCHE MINCE COMPRENANT DE L'OXYDE DE TITANE EN TANT QUE COMPOSANT PRINCIPAL ET CIBLE FRITTÉE DE PULVÉRISATION COMPRENANT DE L'OXYDE DE TITANE EN TANT QUE COMPOSANT PRINCIPAL[2011/50]
Entry into regional phase18.07.2011Translation filed 
18.07.2011National basic fee paid 
18.07.2011Search fee paid 
18.07.2011Designation fee(s) paid 
18.07.2011Examination fee paid 
Examination procedure12.10.2010Request for preliminary examination filed
International Preliminary Examining Authority: JP
18.07.2011Amendment by applicant (claims and/or description)
18.07.2011Examination requested  [2011/50]
30.01.2015Communication of intention to grant the patent
10.06.2015Application deemed to be withdrawn, date of legal effect  [2015/49]
16.07.2015Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time  [2015/49]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  30.01.2015
Fees paidRenewal fee
11.01.2012Renewal fee patent year 03
10.01.2013Renewal fee patent year 04
21.01.2014Renewal fee patent year 05
13.01.2015Renewal fee patent year 06
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Documents cited:Search[A]EP1029832  (NIPPON SHEET GLASS CO LTD [JP]) [A] 3,11 * example -; claim - ** sputtering as an alternative method for forming the film; paragraph [0034] *;
 [A]JP2000335940  (NIPPON SHEET GLASS CO LTD) [A] 1,4,9 * paragraph [0049]; example -; table 6 * * abstract *;
 [A]JP2001355065  (MITSUBISHI MATERIALS CORP) [A] 1,4,9 * abstract * * paragraph [0018]; example 6; table 3 *
International search[Y]JPH08287515  (MATSUSHITA ELECTRIC IND CO LTD);
 [X]JP2001240960  (NIPPON SHEET GLASS CO LTD);
 [X]JP2002145622  (JAPAN SCIENCE & TECH CORP);
 [X]JP2002206164  (NAT INST OF ADV IND & TECHNOL);
 [X]JP2006144052  (BRIDGESTONE CORP);
 [X]  - D. L. HOU ET AL., "Room-temperature ferromagnetism in Cu-doped Ti02 thin films", THIN SOLID FILMS, (2008), vol. 516, pages 3223 - 3226, XP022500331

DOI:   http://dx.doi.org/10.1016/0049-3848(80)90037-7
 [X]  - A. K. PRADHAN ET AL., "Ferromagnetism in nanocrystalline epitaxial Co:Ti02 thin films", APPLIED PHYSICS LETTERS, (2005), vol. 86, pages 222503-1 - 222503-3, XP012065740

DOI:   http://dx.doi.org/10.1063/1.1944209
 [X]  - N. H. HONG ET AL., "Distribution of dopant in Fe:Ti02 and Ni:Ti02 thin films", JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, (2004), vol. 281, pages 347 - 352, XP004568442

DOI:   http://dx.doi.org/10.1016/j.jmmm.2004.04.125
 [Y]  - D. MARDARE ET AL., "Optical dispersion analysis of Ti02 thin films based on variable-angle spectroscopic ellipsometry measurements", MATERIALS SCIENCE AND ENGINEERING B, (1999), vol. 68, pages 42 - 47, XP004363462

DOI:   http://dx.doi.org/10.1016/S0921-5107(99)00335-9
by applicantJP2006079710
 JP3836163B
    - "Kogaku", TECHNICAL JOURNAL, vol. 26, no. 1, pages 9 - 15
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.